| US 7,569,814 B2 | ||
| Mass spectrometer | ||
| Yuichiro Hashimoto, Tachikawa (Japan); Hideki Hasegawa, Tachikawa (Japan); Takashi Baba, Kawagoe (Japan); Hiroyuki Satake, Kokubunji (Japan); and Izumi Waki, Tokyo (Japan) | ||
| Assigned to Hitachi High-Technologies Corporation, Tokyo (Japan) | ||
| Filed on Jan. 31, 2008, as Appl. No. 12/10,977. | ||
| Application 12/010977 is a continuation of application No. 11/146157, filed on Jun. 07, 2005, granted, now 7,348,554. | ||
| Claims priority of application No. 2004-169749 (JP), filed on Jun. 08, 2004. | ||
| Prior Publication US 2008/0156979 A1, Jul. 03, 2008 | ||
| This patent is subject to a terminal disclaimer. | ||
| Int. Cl. H01J 49/00 (2006.01) | ||
| U.S. Cl. 250—282 [250/281; 250/283; 250/288; 250/290; 250/291; 250/292; 250/299] | 8 Claims |
| 1. A mass spectrometer comprising:
an ion source for ionizing a specimen to generate ions;
an ion transport portion, positioned on the latter part of the ion source and provided with mass selection means for selecting
the ions of a first m/z range, for transporting the ions;
a linear trap portion for accumulating the transported ions by a potential formed axially; and
a control portion for controlling the linear trap portion to eject the ions within a second m/z range different from a first
m/z range from the linear trap portion substantially at the same timing as the timing of accumulating the ions within the
first m/z range to the linear trap portion,
wherein the transmission m/z window within the first m/z range transmitting the ion transport portion by the mass selection
means is set by the previously measured mass spectrum of the ions introduced to the linear trap portion.
|