US 7,567,883 B2
Method and apparatus for synchronizing signals in a testing system
Dale A Heaton, Lucas, Tex. (US); Craig J Lambert, Plano, Tex. (US); Vanessa M Bodrero, Saint-Laurent-du-Var (France); and Alain C Chiari, Vence (France)
Assigned to Texas Instruments Incorporated, Dallas, Tex. (US)
Filed on Jun. 13, 2007, as Appl. No. 11/762,208.
Application 11/762208 is a division of application No. 10/766073, filed on Jan. 28, 2004, granted, now 7,246,025.
Prior Publication US 2007/0239389 A1, Oct. 11, 2007
Int. Cl. G01R 31/00 (2006.01)
U.S. Cl. 702—118  [331/1 R; 324/76.23; 365/201; 702/117; 702/121; 714/724] 14 Claims
OG exemplary drawing
 
1. A testing system, comprising:
a tester including an oscillator with a first frequency;
a load board including an oscillator with a second frequency;
an error detector coupled to the tester and the load board, wherein the error detector generates an error signal proportional to the difference between the first and second frequencies and the error signal is used to vary the second frequency.