| US 7,567,092 B2 | ||
| Liquid crystal display driver including test pattern generating circuit | ||
| Jee-woo Park, Seoul (Korea, Republic of); Won-sik Kang, Seoul (Korea, Republic of); and Jong-kon Bae, Seoul (Korea, Republic of) | ||
| Assigned to Samsung Electronics Co., Ltd., Suwon-Si (Korea, Republic of) | ||
| Filed on Mar. 28, 2007, as Appl. No. 11/692,562. | ||
| Claims priority of application No. 10-2006-0032744 (KR), filed on Apr. 11, 2006. | ||
| Prior Publication US 2007/0236243 A1, Oct. 11, 2007 | ||
| Int. Cl. G01R 31/00 (2006.01) | ||
| U.S. Cl. 324—770 | 10 Claims |
| 1. An LCD (liquid crystal display) driver comprising:
a normal mode circuit for generating a normal mode signal related to a normal image data writing operation of an LCD;
a test pattern generating circuit for generating a test mode signal related to a test image data writing operation of the
LCD;
a selection circuit for selecting one of the normal mode signal and the test mode signal; and
a timing controller including a memory storing image data that constructs a normal image pattern or a test image pattern for
display on an LCD panel of the LCD in response to an output signal of the selection circuit, wherein the displayed test image
pattern is used for a visual quality test, and
wherein the test mode signal includes test image data constructing the test image pattern, a test memory selection signal
for activating or deactivating the memory a test row address signal and a test column address signal designating a position
of the test image data stored in the memory, a delayed test enable signal obtained by delaying a test enable signal for enabling
the test pattern generating circuit, and a test write clock signal synchronized with the test memory selection signal, the
test row address signal and the test column address signal, wherein the selection circuit is operated in response to the delayed
test enable signal.
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