| US 7,403,128 B2 | ||
| Adverse condition detector with diagnostics | ||
| Rodney W. Scuka, Dublin, Ohio (US); Timothy D. Kaiser, Plain City, Ohio (US); and Paul J. Baker, Dublin, Ohio (US) | ||
| Assigned to Maple Chase Company, Farmington, Conn. (US) | ||
| Filed on Feb. 13, 2006, as Appl. No. 11/352,780. | ||
| Claims priority of provisional application 60/653808, filed on Feb. 17, 2005. | ||
| Prior Publication US 2006/0192680 A1, Aug. 31, 2006 | ||
| Int. Cl. G08B 17/10 (2006.01) | ||
| U.S. Cl. 340—632 [340/506; 340/628; 340/517] | 19 Claims |
| 1. A method of operating an adverse condition detector including at least an adverse condition detection circuit and a microprocessor
contained within a housing, the method comprising the steps of:
activating an internal clock within the microprocessor upon the initial activation of the adverse condition detector;
operating the microprocessor within the adverse condition detector to monitor for the occurrence of one of a series of monitored
events related to the operation of the adverse condition detector;
recording the occurrence of the monitored event and a time stamp within the microprocessor of the adverse condition detector,
the time stamp being the value of the internal clock upon the occurrence of the monitored event; and
interrogating the microprocessor to extract the recorded occurrences of the monitored events and the associated time stamps.
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