US 11,703,677 B2
Aperture structure for optical windows and devices
Xu Ouyang, Painted Post, NY (US)
Assigned to Corning Incorporated, Corning, NY (US)
Filed by CORNING INCORPORATED, Corning, NY (US)
Filed on Jul. 29, 2020, as Appl. No. 16/941,808.
Claims priority of provisional application 62/882,101, filed on Aug. 2, 2019.
Prior Publication US 2021/0033846 A1, Feb. 4, 2021
Int. Cl. G02B 26/00 (2006.01); G02F 1/1335 (2006.01); G02F 1/00 (2006.01); G02B 26/08 (2006.01); B82Y 20/00 (2011.01); G02B 5/00 (2006.01); B60J 3/06 (2006.01)
CPC G02B 26/0833 (2013.01) [B82Y 20/00 (2013.01); G02B 5/003 (2013.01); G02B 26/001 (2013.01); G02F 1/133502 (2013.01); B60J 3/06 (2013.01); G02F 1/0063 (2013.01); G02F 2201/38 (2013.01); G02F 2201/40 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An aperture structure for a substrate of an optical device, comprising:
an optical cavity layer that comprises a dielectric material comprising at least one of a metal oxide, a metal nitride, and a metal oxynitride, the optical cavity layer further comprising a refractive index of about 1.4 or greater, as measured at a wavelength of 550 nm; a transmittance of at least about 50% for each wavelength of light in the range from 400 nm to 700 nm at each angle of incidence from 0 degrees to 30 degrees; and a thickness of about 10 nm to about 200 nm;
a light absorbing layer disposed over the optical cavity layer, the light absorbing layer comprising a metal or a metal alloy; an extinction coefficient k of at least 1, as measured at a wavelength of 550 nm; and a thickness of about 3 nm to about 60 nm; and
a blocking layer disposed over the light absorbing layer, the blocking layer comprising a metal or a metal alloy; an optical density of at least 3 at each wavelength of light in the range from 400 nm to 700 nm; and a thickness of about 30 nm to about 300 nm;
wherein the aperture structure comprises a reflectance of less than 5% for each wavelength of light in the range from 400 nm to 700 nm at each angle of incidence from 0 degrees to 30 degrees, as measured through the substrate.