| 1. A test module for testing PCI Express device logic, wherein the test module is placed between a PCI Express Port Logic
and PCI Express Transaction Handler (“PTH”) comprising:
a packet counter that counts test packets that are received from a buffer in the PCI Express port logic and written in a memory
of the test module; and an idle timer that counts time that has expired after a last test packet has been received by the
memory module of the test module; wherein if the packet counter value exceeds a threshold value then all test packets residing
in the memory of the test module are sent to the PTH for testing and if the idle timer expires at any given instance, then
all the test packets in the memory of the test module are sent to the PTH.
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