| US 7,564,062 B2 | ||
| Electrode for p-type SiC | ||
| Tomohiro Sakai, Kyoto (Japan); Miki Moriyama, Kyoto (Japan); Masanori Murakami, Kyotanabe (Japan); and Naoki Shibata, Aichi (Japan) | ||
| Assigned to Toyoda Gosei, Co., Ltd., Nishikasugai-gun, Aichi (Japan) | ||
| Filed on Oct. 29, 2003, as Appl. No. 10/695,439. | ||
| Claims priority of application No. P2002-314301 (JP), filed on Oct. 29, 2002. | ||
| Prior Publication US 2006/0169985 A1, Aug. 03, 2006 | ||
| Int. Cl. H01L 31/0312 (2006.01) | ||
| U.S. Cl. 257—77 [257/781] | 17 Claims |

| 1. An electrode for a p-type SiC, comprising a first electrode material, and a second electrode material of aluminum (Al), said first and second electrode materials exhibiting an eutectic reaction at a temperature of 600° C. or lower, wherein a layer made of said first electrode material is in contact with a surface of the p-type SiC, said first electrode material comprising germanium (Ge). |