US 7,557,603 B2
Method and apparatus for output driver calibration, and memory devices and system embodying same
Dong Pan, Boise, Id. (US)
Assigned to Micron Technology, Inc., Boise, Id. (US)
Filed on Aug. 29, 2006, as Appl. No. 11/511,543.
Prior Publication US 2008/0054935 A1, Mar. 06, 2008
Int. Cl. H03K 17/16 (2006.01); H03K 19/003 (2006.01); G11C 11/00 (2006.01)
U.S. Cl. 326—30  [326/83; 365/189.11; 327/170] 17 Claims
OG exemplary drawing
 
17. A calibration circuit for a variable impedance output driver, comprising:
a pull-up calibration circuit configured to generate a p-channel count signal for calibrating p-channel devices in the variable impedance output driver, the p-channel count signal being an average of a plurality of count signals in response to a respective plurality of input and output configurations on a first comparator; and
a pull-down calibration circuit configured to generate an n-channel count signal for calibrating n-channel devices in the variable impedance output driver, the n-channel count signal being an average of a plurality of count signals in response to a respective plurality of input and output configurations on a second comparator.