| US 7,557,564 B2 | ||
| Test handler comprising at least one opening unit opening one part of the plurality of inserts | ||
| Jae-Gyun Shim, Suwon (Korea, Republic of); Yun-Sung Na, Cheunan (Korea, Republic of); In-Gu Jeon, Suwon (Korea, Republic of); Tae-Hung Ku, Suwon (Korea, Republic of); Jae-Sung Park, Yonin (Korea, Republic of); and Su-Myung Lee, Yongin (Korea, Republic of) | ||
| Assigned to TechWing Co., Ltd., Hwaseung, Gyeonggi-do (Korea, Republic of) | ||
| Filed on Mar. 28, 2007, as Appl. No. 11/727,851. | ||
| Claims priority of application No. 10-2006-0068167 (KR), filed on Jul. 20, 2006. | ||
| Prior Publication US 2008/0018354 A1, Jan. 24, 2008 | ||
| Int. Cl. G01R 31/26 (2006.01); G01R 31/28 (2006.01) | ||
| U.S. Cl. 324—158.1 | 10 Claims |
| 1. A test handler comprising:
a test tray on which a plurality of inserts for loading at least one semiconductor device are arrayed;
at least one opening unit for simultaneously opening one part of the plurality of inserts, which are arrayed on one part of
the test tray; and
a test tray transfer apparatus for transferring the test tray;
wherein the opening unit simultaneously opens a plurality of inserts in one part of the test tray, and the test tray transfer
apparatus transfers the test tray to cause the opening unit to simultaneously open a plurality of inserts in another part
of the test tray.
|