| US 7,554,574 B2 | ||
| Abnormal state occurrence predicting method, state deciding apparatus, and image forming system | ||
| Hisashi Shoji, Tokyo (Japan); Katsuaki Miyawaki, Tokyo (Japan); Osamu Satoh, Tokyo (Japan); Masaaki Yamada, Tokyo (Japan); Shuji Hirai, Tokyo (Japan); Yoshinori Nakagawa, Tokyo (Japan); Eiichi Ohta, Tokyo (Japan); Takashi Seto, Tokyo (Japan); Satoshi Ouchi, Tokyo (Japan); and Nekka Matsuura, Tokyo (Japan) | ||
| Assigned to Ricoh Company, Ltd., Tokyo (Japan) | ||
| Filed on Jun. 25, 2004, as Appl. No. 10/875,277. | ||
| Claims priority of application No. 2003-184929 (JP), filed on Jun. 27, 2003. | ||
| Prior Publication US 2005/0002054 A1, Jan. 06, 2005 | ||
| Int. Cl. H04N 5/232 (2006.01) | ||
| U.S. Cl. 348—207.99 [399/9] | 25 Claims |
| 1. An abnormal state occurrence predicting method that predicts an occurrence of an abnormal state of an image forming apparatus,
comprising:
acquiring pieces of information of parameters of the image forming apparatus related to a state of the image forming apparatus;
storing an original correlation value of the parameters in a stable state;
calculating an index value by standardizing the pieces of information acquired based on an average and a standard deviation,
the index value being an amount of change from the original correlation value; and
deciding a change to the abnormal state of the image forming apparatus when the index value calculated exceeds a predetermined
amount.
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