| US 7,554,346 B2 | ||
| Test equipment for automated quality control of thin film solar modules | ||
| Oliver Kluth, Walenstadt (Switzerland); Jiri Springer, Sevelen (Switzerland); Michael Mohr, Salez (Switzerland); and Andreas Hugli, Seewis (Switzerland) | ||
| Assigned to Oerlikon Trading AG, Trubbach, Trubbach (Switzerland) | ||
| Filed on Apr. 18, 2008, as Appl. No. 12/105,331. | ||
| Claims priority of provisional application 60/943694, filed on Jun. 13, 2007. | ||
| Claims priority of provisional application 60/912799, filed on Apr. 19, 2007. | ||
| Prior Publication US 2008/0258747 A1, Oct. 23, 2008 | ||
| Int. Cl. G01R 31/302 (2006.01) | ||
| U.S. Cl. 324—750 [324/752; 250/200] | 22 Claims |
| 1. A test system for identifying a defective region of a photovoltaic cell from among a plurality of photovoltaic cells collectively
forming a thin film solar module, the test system comprising:
a probe comprising a plurality of test fingers that are arranged to each be substantially simultaneously placed adjacent to
an electric contact provided to different regions of one or more of the plurality of photovoltaic cells, wherein
each of the test fingers is to receive an electrical output from the different regions of the one or more photovoltaic cells;
a light source that emits light to be converted by the photovoltaic cells into the electrical output during testing;
a measurement circuit that measures a property of the electrical output received from the different regions of the photovoltaic
cells and transmits a measured value signal indicative of the property measured by the measurement circuit; and
a control unit operatively coupled to the measurement circuit for receiving the measured value signal and generating a visible
display indicating that at least one of the different regions of the solar module is a defective region based at least in
part on the measured value signal and indicating a location of the defective region on the solar module.
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