| US 7,554,332 B2 | ||
| Calibration apparatus, calibration method, testing apparatus, and testing method | ||
| Kiyotaka Ichiyama, Tokyo (Japan); Masahiro Ishida, Tokyo (Japan); and Takahiro Yamaguchi, Tokyo (Japan) | ||
| Assigned to Advantest Corporation, Tokyo (Japan) | ||
| Filed on Mar. 10, 2006, as Appl. No. 11/371,849. | ||
| Prior Publication US 2007/0236284 A1, Oct. 11, 2007 | ||
| Int. Cl. G01R 31/00 (2006.01) | ||
| U.S. Cl. 324—500 [329/311; 375/226] | 34 Claims |
| 1. A calibration apparatus for calibrating an electronic device that outputs a demodulation signal including a jitter component
which corresponds to a phase-modulated component of a signal of the device, comprising:
a DC component detecting section configured to detect a DC component of said demodulation signal;
a gain calculating section configured to calculate a gain of said electronic device based on said DC component of said demodulation
signal; and
a calibrating section configured to calibrate said electronic device based on the gain of said electronic device so as to
adjust said jitter component.
|