| US 7,551,765 B2 | ||
| Electronic component detection system | ||
| Steven P. Thomas, Westfield, Ind. (US); and Timothy D. Garner, Kokomo, Ind. (US) | ||
| Assigned to Delphi Technologies, Inc., Troy, Mich. (US) | ||
| Filed on Jun. 14, 2004, as Appl. No. 10/867,298. | ||
| Prior Publication US 2005/0286754 A1, Dec. 29, 2005 | ||
| Int. Cl. G06K 9/00 (2006.01) | ||
| U.S. Cl. 382—141 [382/149] | 24 Claims |
| 1. A method for screening electronic assemblies, comprising a processor performing the steps comprising:
(a) capturing a test image of an electronic assembly;
(b) determining a positive likeness value (PLV) based on a first degree of likeness between the test image and an image of
a positive control, wherein the PLV is based upon a model of a correctly assembled electronic assembly;
(c) determining a negative likeness value (NLV) based on a second degree of likeness between the test image and an image of
a negative control, wherein the NLV is based upon a model of an incorrectly assembled electronic assembly; and
(d) comparing the PLV with the NLV to determine if the imaged portion of the electronic assembly is assembled properly.
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