LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 16th DAY OF June, 2009
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

Nabi Biopharmaceuticals: See--
Ennifar, Sofiane; Winston, Scott; Terrill, James; and Fuller, Steve 07547712 Cl. 514-343.
Nada, Toru; to DENSO CORPORATION Speech recognition system 07548861 Cl. 704-270.
Nadala, Elipidio Cesar Braga: See--
Lee, Helen Hwai-an; Smetham, Grant Timothy Lewis; Stankus, Phillip John; Hazlewood, Shaun Christopher; Nadala, Elipidio Cesar Braga; and Wisniewski, Craig Alan 07547298 Cl. 604-319.
Nadkarni, Sadashiv: See--
Davisson, Thomas L.; and Nadkarni, Sadashiv 07547463 Cl. 427-209.
Nadonley, Leonard W. Reflector system 07547104 Cl. 359-515.
Nagahama, Hitoshi; Deguchi, Masanobu; Koyama, Kazuya; and Hayashi, Shigeki, to Sharp Kabushiki Kaisha Developer container and image forming apparatus 07548714 Cl. 399-262.
Nagai, Kazunobu: See--
Oomura, Naoki; Nagai, Kazunobu; Kominato, Shinichi; Hasegawa, Yukihisa; and Awazu, Minoru 07548039 Cl. 318-788.
Nagai, Kazutoshi: See--
Miyazaki, Jinsei; Iwano, Kenji; Nagai, Kazutoshi; and Tanaka, Toshiyuki 07547278 Cl. 600-300.
Nagai, Yoshiyuki: See--
Tateishi, Yoshinobu; Hori, Hiroaki; Nagai, Yoshiyuki; and Mikita, Toshiya 07548717 Cl. 399-326.
Nagano, Masatoshi; to Canon Kabushiki Kaisha Image scanning apparatus and method, and storage medium 07548355 Cl. 358-487.
Nagao, Kenichi: See--
Shimaya, Kazuhiko; Nagao, Kenichi; and Ogo, Toshitaka 07546725 Cl. 59-35.1.
Nagao, Shinichi; Inari, Masato; Oishi, Jitsuo; Nakaya, Kenji; and Machida, Hiroshi, to Mitsubishi Gas Chemical Company, Inc. Process for producing a high purity aromatic polycarboxylic acid 07547803 Cl. 562-485.
Nagaoka, Teruyoshi: See--
Tokutani, Takashi; Hatakeyama, Takahisa; Tanaka, Keishiro; Yura, Masakazu; and Nagaoka, Teruyoshi 07549172 Cl. 726-27.
Nagaraj, Bangalore Aswatha: See--
Spitsberg, Irene; Boutwell, Brett Allen Rohrer; Bruce, Robert William; Johnson, Curtis Alan; Nagaraj, Bangalore Aswatha; and Walston, William Scott 07547475 Cl. 428-469.
Nagarajan, Balan: See--
Amond, III, Thomas Charles; Crawley, Bradley Donald; Chandrashekar, Natesh; Nagarajan, Balan; and Feigl-Varela, Rebecca Arlene 07546736 Cl. 60-747.
Nagarkar, Kuldeep Sureshrao: See--
Kale, Sanjay Ramchandra; Nagarkar, Kuldeep Sureshrao; Deshmukh, Dulipsinh H.; Asgaonkar, Shishir S.; and Chaudhari, Shailesh Waman 07549037 Cl. 711-218.
Nagasaka, Kimio; to Seiko Epson Corporation Optical module package and optical module 07547151 Cl. 385-93.
Nagasaki, Osamu; Yamaguchi, Atsuhiko; Nakamori, Tomohiro; Uchiyama, Takehiro; Yasukawa, Kouji; Namiki, Teruhiko; and Murata, Hiroki, to Canon Kabushiki Kaisha Power supply unit in image forming apparatus 07548708 Cl. 399-88.
Nagasawa, Hideyuki: See--
Fujisaki, Kozo; Nagasawa, Hideyuki; Igarashi, Ikuo; Suzuki, Hiroshi; Sugimoto, Chihiro; Gen, Gakunan; Kadota, Kimie; Inoue, Noboru; Yokoyama, Naoaki; and Tsuji, Naotoshi 07547682 Cl. 514-44.
Nagasawa, Hiroshi; Sato, Koji; Yagi, Tsutomu; and Kitani, Yasuo, to Daiichi Sankyo Company, Limited Process for producing thiazole derivative 07547786 Cl. 546-114.
Nagase, Noboru; and Kikutani, Takashi, to DENSO CORPORATION Injector drive device and injector drive system 07546830 Cl. 123-490.
Nagata, Junichi; and Kominami, Masayuki, to DENSO CORPORATION Overcurrent detection circuit 07548403 Cl. 361-93.1.
Nagata, Kenshi; to OMRON Corporation Push button switch 07547858 Cl. 200-520.
Nagata, Tomonori: See--
Kitazawa, Yasuho; Takamatsu, Hitoshi; Yasuda, Masaki; Aihara, Kazuhiko; Nakashima, Toshio; and Nagata, Tomonori 07546968 Cl. 242-374.
Nagayama, Hironori; Amano, Mitsuyoshi; and Suginohara, Keiji, to Pioneer Corporation Minute file creation method, minute file management method, conference server, and network conference system 07548951 Cl. 709-204.
Nagino, Goshu: See--
Shozakai, Makoto; and Nagino, Goshu 07548651 Cl. 382-224.
Nagura, Satoshi: See--
Kojima, Kenji; Nagura, Satoshi; Ando, Nobuo; Hato, Yukinori; and Marumo, Chisato 07548409 Cl. 361-503.
Naidu, Vishnu R.; and Russo, Jr., Joseph R., to Chep Technology Pty Limited Wringing device 07546798 Cl. 100-37.
Naij, Stefan: See--
Mellegard, Per; and Naij, Stefan 07547389 Cl. 210-155.
Nair, Giri: See--
Ashwin, Shrinivas; Kleinerman, Christian; Zabokritski, Eugene; Krishnamoorthy, Ganapathy; and Nair, Giri 07548901 Cl. 707-2.
Nakada, Hirofumi: See--
Chida, Ryuji; Matsuo, Kenji; Nakada, Hirofumi; Inagawa, Tomokazu; and Nakamura, Kazuaki 07548811 Cl. 701-51.
Nakada, Michiatsu: See--
Kinoshita, Haruhisa; Kinpara, Masanori; Nakada, Michiatsu; Kurebayashi, Syouji; Suzuki, Hideyuki; and Kawai, Toshiaki 07547885 Cl. 250-336.1.
Nakada, Takeshi; Tanaka, Kazuhiro; Sakurai, Yasuo; Kajikawa, Hiromichi; and Seo, Takeshi, to SMC Kabushiki Kaisha Method for controlling operation of cylinder apparatus 07546733 Cl. 60-711.
Nakagawa, Goji; to Fujitsu Limited Optical gate array device 07548669 Cl. 385-33.
Nakagawa, Katsuyuki: See--
Tokita, Masao; Suzuki, Shinichi; and Nakagawa, Katsuyuki 07547204 Cl. 425-78.
Nakagawa, Tohru; to NTN Corporation Drive shaft for ATVs 07547254 Cl. 464-145.
Nakahata, Hiroshi; to Canon Kabushiki Kaisha Image forming apparatus 07548361 Cl. 359-204.1.
Nakai, Shunsuke: See--
Hirokawa, Kazuto; Kobayashi, Yoichi; Nakai, Shunsuke; Ohta, Shinrou; and Tsukuda, Yasuo 07547242 Cl. 451-6.
Nakai, Yuuta: See--
Kataoka, Saori; Nakai, Yuuta; Ueda, Takuji; Joe, Yuji; and Ito, Hisao 07547531 Cl. 435-106.
Nakajima, Hisashi: See--
Uchinokura, Osamu; Tomita, Masami; Nakajima, Hisashi; Nakayama, Shinya; Sakata, Koichi; Kotsugai, Akihiro; Ichikawa, Tomoyuki; Asahina, Yasuo; Sugiura, Hideki; Iwamoto, Yasuaki; and Mochizuki, Satoshi 07547497 Cl. 430-108.2.
Nakajima, Kazunori: See--
Yamamura, Hideho; Maru, Naoki; Nakajima, Kazunori; Nisisu, Koji; and Oomae, Shigeo 07548411 Cl. 361-611.
Nakajima, Koichi: See--
Sako, Yoichiro; Shibasaki, Etsuo; Kanada, Yoriaki; Saito, Akiya; Nakajima, Koichi; Furukawa, Shunsuke; Kijima, Kaoru; and Inoue, Akiko 07549175 Cl. 726-30.
Nakajima, Mitsuo: See--
Mizuhashi, Yoshiaki; and Nakajima, Mitsuo 07548276 Cl. 348-459.
Nakajima, Takao: See--
Hatasaki, Keisuke; and Nakajima, Takao 07549076 Cl. 714-3.
Nakajima, Takeshi; Ito, Tsukasa; Hattori, Tsuyoshi; Nomura, Shoichi; and Ikeda, Chizuko, to Konica Minolta Holdings, Inc. Method and apparatus for processing image signals by applying a multi-resolution conversion processing for reducing the image size and applying a dyadic wavelet transform 07548656 Cl. 382-240.
Nakajo, Naoki: See--
Kawamura, Shogo; Mori, Toshihiro; Fukai, Hisashi; and Nakajo, Naoki 07547094 Cl. 347-50.
Nakamori, Tomohiro: See--
Nagasaki, Osamu; Yamaguchi, Atsuhiko; Nakamori, Tomohiro; Uchiyama, Takehiro; Yasukawa, Kouji; Namiki, Teruhiko; and Murata, Hiroki 07548708 Cl. 399-88.
Nakamura, Eiichi: See--
Nakamura, Eiichi; and Matsuo, Yutaka 07547429 Cl. 423-445B.
Nakamura, Eiichi; and Matsuo, Yutaka, to Nakamura, Eiichi Fullerene derivatives and processes for producing the same 07547429 Cl. 423-445B.
Nakamura, Hiroaki: See--
Iida, Takayuki; and Nakamura, Hiroaki 07548645 Cl. 382-167.
Nakamura, Hitoshi; Abe, Hajime; and Ishio, Noriaki, to Mitsubishi Electric Corporation Method for manufacturing semiconductor light emitting device 07547587 Cl. 438-141.
Nakamura, Kazuaki: See--
Chida, Ryuji; Matsuo, Kenji; Nakada, Hirofumi; Inagawa, Tomokazu; and Nakamura, Kazuaki 07548811 Cl. 701-51.
Nakamura, Kenji: See--
Azumada, Kyoko; Nakamura, Kenji; Ban, Atsushi; and Fujita, Tatsuya 07547918 Cl. 257-72.
Nakamura, Ko: See--
Takamatsu, Tomohiro; Watanabe, Junichi; Nakamura, Ko; Wang, Wensheng; Sato, Naoyuki; Dote, Aki; Nomura, Kenji; Horii, Yoshimasa; Kurasawa, Masaki; and Takai, Kazuaki 07547933 Cl. 257-295.
Nakamura, Shoichi: See--
Yokobori, Jun; Kurohata, Takao; and Nakamura, Shoichi 07547010 Cl. 271-9.01.
Nakamura, Shuji: See--
Fujibayashi, Akira; Fujimoto, Kazuhisa; and Nakamura, Shuji 07549016 Cl. 711-112.
Nakamura, Takamitsu: See--
Kimura, Koichi; and Nakamura, Takamitsu 07547734 Cl. 521-40.
Nakamura, Takayoshi: See--
Torigoe, Makato; Shao, Liang; Saikalis, George; Funato, Hiroki; and Nakamura, Takayoshi 07547987 Cl. 307-10.1.
Nakamura, Toshihiko; to SII Nano Technology Inc. Freezing point temperature measuring method and temperature calibrating method in differential scanning calorimetry 07547137 Cl. 374-27.
Nakamura, Yoshitaka: See--
Onoda, Toshihiko; Nakamura, Yoshitaka; Yamaoka, Makoto; Takeda, Tadahiro; Sato, Noritada; and Jin, Masayoshi 07547790 Cl. 548-215.
Nakane, Kazuhiko: See--
Yoshimoto, Kyosuke; Rao, Mahesh C.; Ohata, Hiroyuki; Nakane, Kazuhiko; Furukawa, Teruo; Kondo, Junichi; and Ototake, Masafumi 07548497 Cl. 369-47.53.
Nakanishi, Yutaka: See--
Toyoda, Hidetoshi; and Nakanishi, Yutaka 07547030 Cl. 280-286.
Nakano, Jun: See--
Endoh, Sohmei; Suzuki, Tadao; Shimizu, Jun; and Nakano, Jun 07548505 Cl. 369-275.4.
Nakano, Kuniaki: See--
Hirai, Masashi; Nakano, Kuniaki; Yamada, Masanori; Yoshida, Takahiko; Ishikawa, Kazuaki; Tachiki, Hiroshi; and Yamanaka, Toshio 07548709 Cl. 399-101.
Nakano, Masaji; to NEC Electronics Corporation MOS semiconductor device with low ON resistance 07547946 Cl. 257-341.
Nakano, Masami: See--
Muto, Hiroyuki; and Nakano, Masami 07546673 Cl. 29-596.
Nakano, Masanori: See--
Fukuyama, Takanori; Takase, Tomoyasu; Sano, Koji; Yano, Hiroshi; Nakano, Masanori; Tomoeda, Shigeru; Honda, Kazuki; Yamasaki, Kazuya; Kubo, Kazutaka; Shimokawatoko, Takeshi; Enomoto, Mitsutaka; and Sumiyama, Masahide 07548632 Cl. 381-429.
Takase, Tomoyasu; Nakano, Masanori; Sumiyama, Masahide; Yano, Hiroshi; Kubo, Kazutaka; Sano, Koji; Fukuyama, Takanori; Tomoeda, Shigeru; Honda, Kazuki; Koike, Toshiyuki; Kawabe, Masashi; and Shimokawatoko, Takeshi 07548627 Cl. 381-189.
Nakano, Toshihisa: See--
Nonaka, Masao; Futa, Yuichi; Nakano, Toshihisa; Yokota, Kaoru; Ohmori, Motoji; Miyazaki, Masaya; Yamamoto, Masaya; Murase, Kaoru; and Onoda, Senichi 07549061 Cl. 713-193.
Nakao, Kenji; Mamiya, Noboru; and Hirose, Ken, to Sanyo Electric Co., Ltd. Optical recording and reproducing apparatus 07548496 Cl. 369-47.53.
Nakashiba, Yasutaka: See--
Moriya, Taro; Nakashiba, Yasutaka; Uchiya, Satoshi; and Furumiya, Masayuki 07547976 Cl. 257-781.
Muramatsu, Yoshinori; and Nakashiba, Yasutaka 07547970 Cl. 257-758.
Nakashima, Atsuhisa; to Brother Kogyo Kabushiki Kaisha Image forming apparatus and transfer belt used therein 07547100 Cl. 347-104.
Nakashima, Toshio: See--
Kitazawa, Yasuho; Takamatsu, Hitoshi; Yasuda, Masaki; Aihara, Kazuhiko; Nakashima, Toshio; and Nagata, Tomonori 07546968 Cl. 242-374.
Nakashima, Tsunenaga: See--
Matsuoka, Nobuaki; Nakashima, Tsunenaga; Hayashi, Shinichi; and Oozono, Akira 07547614 Cl. 438-478.
Nakata Coating Co., Ltd.: See--
Matsuno, Takemi 07547477 Cl. 428-626.
Nakatani, Yoji; Iwasaki, Masaaki; and Enko, Yutaka, to Hitachi, Ltd. Method for accessing distributed file system 07548959 Cl. 709-217.
Nakaya, Kenji: See--
Nagao, Shinichi; Inari, Masato; Oishi, Jitsuo; Nakaya, Kenji; and Machida, Hiroshi 07547803 Cl. 562-485.
Nakayama, Ichiro: See--
Sasaki, Yuichiro; Mizuno, Bunji; and Nakayama, Ichiro 07547619 Cl. 438-535.
Nakayama, Masao; to Seiko Epson Corporation Capacitor and its manufacturing method 07548408 Cl. 361-311.
Nakayama, Shinya: See--
Uchinokura, Osamu; Tomita, Masami; Nakajima, Hisashi; Nakayama, Shinya; Sakata, Koichi; Kotsugai, Akihiro; Ichikawa, Tomoyuki; Asahina, Yasuo; Sugiura, Hideki; Iwamoto, Yasuaki; and Mochizuki, Satoshi 07547497 Cl. 430-108.2.
Nakazato, Shinji: See--
Shinozaki, Masao; Nishimoto, Kenji; Akioka, Takashi; Kohara, Yutaka; Asari, Sanae; Miyata, Shusaku; and Nakazato, Shinji 07547971 Cl. 257-759.
Nakazawa, Akira: See--
Silverbrook, Kia; Nakazawa, Akira; Hibbard, Christopher; Mackey, Paul Ian; Berry, Norman Micheal; and Jackson, Garry Raymond 07547098 Cl. 347-86.
Nakazono, Hiroki; and Mizuno, Shigehiko, to Yamaha Corporation Performance data processing apparatus, performance data processing method, and computer readable medium containing program for implementing the method 07547839 Cl. 84-601.
Nam, Byun Sung: See--
Chung, Han Rok; and Nam, Byun Sung 07548083 Cl. 324-770.
Nam, Seung Hee: See--
Yoo, Soon Sung; Cho, Heung Lyul; and Nam, Seung Hee 07548286 Cl. 349-54.
Nam, Young Sik: See--
Ro, Gwan Ho; and Nam, Young Sik 07546999 Cl. 251-120.
Nambirajan, Seshadri Multiple-access scheme for packet voice that uses voice activity detection 07548529 Cl. 370-337.
Namiki, Shu: See--
Akasaka, Youichi; Emori, Yoshihiro; and Namiki, Shu 07548368 Cl. 359-337.4.
Namiki, Teruhiko: See--
Nagasaki, Osamu; Yamaguchi, Atsuhiko; Nakamori, Tomohiro; Uchiyama, Takehiro; Yasukawa, Kouji; Namiki, Teruhiko; and Murata, Hiroki 07548708 Cl. 399-88.
Nandapurkar, Pramod Jayant: See--
Kramer, Anatoly Ilich; Surana, Phil; Nandapurkar, Pramod Jayant; and Yang, Norman 07547811 Cl. 585-532.
Nannie, Rondal L. Magnetic balancer apparatus and method 07546767 Cl. 73-480.
Nanno, Ikuo: See--
Tanaka, Masahito; Nanno, Ikuo; and Takaishi, Akira 07548796 Cl. 700-210.
Nanomix, Inc.: See--
Star, Alexander; Wyatt, Jeffrey; Joshi, Vikram; Stetter, Joseph R.; and Grüner, George 07547931 Cl. 257-253.
Nanya Technology Corp.: See--
Cheng, Wen-Chang 07548470 Cl. 365-193.
Naoe, Hitoshi: See--
Sakai, Koji; Naoe, Hitoshi; Fukae, Fumihiro; and Osawa, Shohei 07548736 Cl. 455-151.2.
Nappi, Daniel: See--
White, III, Verdi R.; Nelson, Shawn D.; Nappi, Daniel; Underwood, David; and Rich, Matt 07547073 Cl. 297-440.1.
Napra Co., Ltd: See--
Sekine, Shigenobu 07547346 Cl. 75-332.
Narayan, Manoj; Viarengo, Steve M.; and Bornscheuer, Allen R., to Tradebeam, Inc. Systems and methods for producing documentary credit and conforming shipping documents 07548881 Cl. 705-36.
Narayanaswamy, Ramesh: See--
Ganesan, Subbu; Broukhis, Leonid Alexander; Narayanaswamy, Ramesh; Nixon, Ian Michael; and Spencer, Thomas Hanni 07548842 Cl. 703-14.
Nardi, Antonio: See--
Salvi, Annibale; Nardi, Antonio; and Bruno, Giacomo 07547792 Cl. 549-39.
Nariyam, Sekhar Munaswamy: See--
Palle, Venkata Raghavendra Acharyulu; Nariyam, Sekhar Munaswamy; and Matti, Lankeshwara Rao 07547785 Cl. 546-48.
Narney, II, John K.: See--
Amante, Philip A.; and Narney, II, John K. 07546778 Cl. 73-861.75.
Nartron Corporation: See--
Boisvert, Mario; Perrin, Randall; and Washeleski, John 07548037 Cl. 318-466.
Nasir, Mohammad Sarwar: See--
Surujballi, Om P.; Romanowska, Anna; Jolley, Michael E.; and Nasir, Mohammad Sarwar 07547506 Cl. 435-4.
Natarajan, Swaminathan R.: See--
Doherty, James B.; Chen, Meng-Hsin; Liu, Luping; Natarajan, Swaminathan R.; and Tynebor, Robert M. 07547720 Cl. 514-406.
Nathan, John F.; and Maue, H. Winston, to Lear Corporation Seat fold actuator 07547070 Cl. 297-378.12.
National Cheng Kung University: See--
Chen, Dong-Hwang; and Chang, Yang-Chuang 07547473 Cl. 428-403.
National Chung Hsing University: See--
Chen, Jiann-Hwa; Lee, Pei-Tseng; and Liu, Yin 07547764 Cl. 530-350.
National Institute of Advanced Industrial Science and Technology: See--
Iwata, Atsushi; and Akedo, Jun 07547359 Cl. 117-89.
National Institute of Information and Communications Technology, Incorporated Administrative Agency: See--
Higashiwaki, Masataka 07547911 Cl. 257-20.
Umeno, Ken 07548618 Cl. 380-44.
National-Oilwell, L.P.: See--
Lambert, Jeff A.; Garrett, James C.; Cambern, Kenneth L.; Ferland, Joel M.; Furnish, Jay D.; Johnson, Donald W.; Zemanek, Michael R.; Cirone, James R.; and Blankenship, Calvin 07546869 Cl. 166-75.11.
National Oilwell Varco, L.P.: See--
Staggs, Mark A. 07546849 Cl. 137-540.
National Semiconductor Corporation: See--
Foote, Richard W. 07547618 Cl. 438-514.
National University Corporation Shizuoka University: See--
Kinoshita, Haruhisa; Kinpara, Masanori; Nakada, Michiatsu; Kurebayashi, Syouji; Suzuki, Hideyuki; and Kawai, Toshiaki 07547885 Cl. 250-336.1.
Naukkarinen, Olli Pekka; and Wu, Hailing, to Luvata Grenada LLC Spirally wound, layered tube heat exchanger 07546867 Cl. 165-145.
Nawai, Shinichiro: See--
Miura, Tadamasa; and Nawai, Shinichiro 07548149 Cl. 338-22R.
Nawano, Masaaki: See--
Furusho, Hiroyuki; and Nawano, Masaaki 07546896 Cl. 180-446.
Nazzaro, David R.: See--
Pietrantoni, Renato L.; Slack, Wayne W.; and Nazzaro, David R. 07547007 Cl. 269-8.
NCI Group, Inc.: See--
Masterson, Eric; and George, Leonard 07546714 Cl. 52-289.
NCR Corporation: See--
Blanford, Denis Michael 07546949 Cl. 235-462.07.
Cash, Charles Robert; Poynter, William Douglas; and Tarmy, Phinsuda 07548879 Cl. 705-35.
Collins, Jr., Donald A. 07546953 Cl. 235-462.43.
Melnik, Daniel; Yepez, Rafael; and Mastry, Jason 07546957 Cl. 235-485.
Smith, Walt E.; Fisher, Jr., Larry F.; and Vargese, Bavan 07548621 Cl. 380-277.
Nebeling, Paul Helmut: See--
Háckh, Heinz; and Nebeling, Paul Helmut 07546787 Cl. 82-1.11.
NEC Corporation: See--
Hayashi, Tomohiro 07548126 Cl. 331-57.
Lin, Hua 07549113 Cl. 714-794.
Shigemura, Koji; and Hiroya, Tsutomu 07548297 Cl. 349-153.
Tanioka, Michinobu; and Hattori, Atsuo 07548082 Cl. 324-762.
Uehara, Shinichi; Imai, Masao; and Yagi, Yoshi 07547129 Cl. 362-607.
NEC Electronics Corporation: See--
Fujita, Yuji 07548096 Cl. 327-103.
Kuroki, Kouichi 07548087 Cl. 326-30.
Manabe, Masao 07548623 Cl. 380-283.
Moriya, Taro; Nakashiba, Yasutaka; Uchiya, Satoshi; and Furumiya, Masayuki 07547976 Cl. 257-781.
Muramatsu, Yoshinori; and Nakashiba, Yasutaka 07547970 Cl. 257-758.
Nakano, Masaji 07547946 Cl. 257-341.
Sugawara, Hiroshi 07548479 Cl. 365-225.7.
Watanabe, Kazuo; and Sugawara, Hiroshi 07548463 Cl. 365-185.23.
NEC Infrontia Corporation: See--
Yoshioka, Yukio 07547153 Cl. 400-621.
NEC LCD Technologies, Ltd.: See--
Kawasaki, Taku; Nishida, Shinichi; and Konno, Takayuki 07548295 Cl. 349-141.
Necaise, Ronald; to Prestige Autotech Corporation Wheel covering system 07547076 Cl. 301-37.371.
Nederiof, Leo: See--
Downie, John D.; Whiting, Matthew S.; Sutherland, James S.; Wagner, Richard E.; and Nederiof, Leo 07547150 Cl. 385-92.
Neelamani, Ramesh: See--
Berkner, Kathrin; Neelamani, Ramesh; Schwartz, Edward L.; and Boliek, Martin 07548654 Cl. 382-235.
Neidhart, Werner: See--
Amrein, Kurt; Hunziker, Daniel; Kuhn, Bernd; Neidhart, Werner; and Mayweg, Alexander V. 07547697 Cl. 514-247.
Neighborhood America: See--
Kobza, Kim Patrick; and Bankston, David A. 07548930 Cl. 707-102.
Neiss, Jason H.: See--
Gardner, Jr., Charles W.; Maier, John S.; Nelson, Matthew P.; Schweitzer, Robert C.; Treado, Patrick J.; Vanni, G. Steven; Wolfe, Julianne; Demuth, Joseph E.; Neiss, Jason H.; and Wang, Chenhui 07548310 Cl. 356-301.
Nejad, Hasan; and Deak, James G., to Micron Technology, Inc. Method for forming MRAM bit having a bottom sense layer utilizing electroless plating 07547559 Cl. 438-3.
Nekoogar, Franak: See--
Dowla, Farid U.; Nekoogar, Franak; and Spiridon, Alex 07548576 Cl. 375-130.
Nektar Therapeutics AL, Corporation: See--
Snell, M. Elizabeth; Roberts, Michael J.; Mori, Toshiyuki; O'Keefe, Barry R.; and Boyd, Michael R. 07547509 Cl. 435-5.
Nellcor Puritan Bennett LLC: See--
Mannheimer, Paul D. 07548771 Cl. 600-323.
Nelson, Arlin Dale: See--
Lampropoulos, Fred P.; Nelson, Arlin Dale; Stevens, Brian; McArthur, Greg; and Padilla, William 07547296 Cl. 604-180.
Nelson Information Systems, Inc.: See--
Nelson, John Marshall 07548917 Cl. 707-7.
Nelson, John Marshall; to Nelson Information Systems, Inc. Database and index organization for enhanced document retrieval 07548917 Cl. 707-7.
Nelson, Matthew P.: See--
Gardner, Jr., Charles W.; Maier, John S.; Nelson, Matthew P.; Schweitzer, Robert C.; Treado, Patrick J.; Vanni, G. Steven; Wolfe, Julianne; Demuth, Joseph E.; Neiss, Jason H.; and Wang, Chenhui 07548310 Cl. 356-301.
Nelson, Shawn D.: See--
White, III, Verdi R.; Nelson, Shawn D.; Nappi, Daniel; Underwood, David; and Rich, Matt 07547073 Cl. 297-440.1.
Nemerix SA: See--
Garin, Lionel 07548200 Cl. 342-358.
Nemeth, Belinda: See--
Stolle, Janet; Nemeth, Belinda; and Kopsak, Dan 07546926 Cl. 211-10.
Nemoto Kyorindo Co., Ltd.: See--
Ono, Seiichi 07546776 Cl. 73-861.25.
Neopets, Inc.: See--
McCaffrey, William Joseph; and Dohring, Doug Carl 07549119 Cl. 715-234.
Nestec Ltd.: See--
Laflamme, Dorothy P; and McCracken, Barbara 07547450 Cl. 424-442.
Nestec S.A.: See--
Ozanne, Matthieu; Kollep, Alexandre; Piguet, Ralph; Terrien, Grégoire; and Greppin, Xavier 07546854 Cl. 141-198.
Nestler, Eric; to Contour Semiconductor, Inc. Memory array with readout isolation 07548453 Cl. 365-175.
Nestler, Eric; to Contour Semiconductor, Inc. Memory array with readout isolation 07548454 Cl. 365-175.
Network Appliance, Inc.: See--
Fair, Robert L. 07549014 Cl. 711-112.
Kimmel, Jeffrey S.; Sankar, Sunitha S.; and Grcanac, Tomislav 07549089 Cl. 714-42.
Neuro Probe Incorporated: See--
Goodwin, Jr., Richard H. 07547525 Cl. 435-29.
NeuroSearch A/S: See--
Peters, Dan; Olsen, Gunnar M.; Nielsen, Elsebet Østergaard; Scheel-Krüger, Jørgen; and Eriksen, Birgitte L. 07547788 Cl. 546-206.
Neville, Daniel E.: See--
Sierra, Juan F.; and Neville, Daniel E. 07548610 Cl. 379-88.01.
New Tech Tire LLC: See--
Moon, Michael; and Corn, Morris 07546862 Cl. 152-276.
New Tianjin T. & D. Co., Ltd.: See--
Lan, Renshui 07547655 Cl. 502-209.
New York Medical College: See--
Anversa, Piero; and Orlic, Donald 07547674 Cl. 514-2.
Newman, John M.: See--
Lin, Jen C.; Newman, John M.; Magnusen, Paul E.; and Bray, Gary H. 07547366 Cl. 148-417.
Nexans: See--
Lallouet, Nicolas; and Delplace, Sébastien 07547846 Cl. 174-84R.
NEXTG Networks, Inc.: See--
Wake, David 07548695 Cl. 398-71.
Ng, Keat Chuan: See--
Ng, Kee Yean; Koay, Hui Peng; Lee, Chiau Jin; Tan, Kheng Leng; Loo, Wei Liam; Ng, Keat Chuan; and Norfidathul, Aizar Abdul Karim 07547583 Cl. 438-123.
Ng, Kee Yean; Koay, Hui Peng; Lee, Chiau Jin; Tan, Kheng Leng; Loo, Wei Liam; Ng, Keat Chuan; and Norfidathul, Aizar Abdul Karim, to Avago Technologies General IP (Singapore) Pte. Ltd. Light emitting diode package with direct leadframe heat dissipation 07547583 Cl. 438-123.
Ng, Kin Ping: See--
Lau, Jack; Tsui, Chi Ying; Cheng, Roger Shu Kwan; Yung, Chi Wai; Tang, Jimmy Tai Kwan; Ng, Kin Ping; Lai, Sai Kit; Chan, Kai Kin; and Chan, Wing Chau 07548851 Cl. 704-201.
Ng, Yee Seung; Tai, Hwai-Tzuu; Kuo, Chung-Hui; and Gusev, Dmitri Anatolyevich, to Eastman Kodak Company Color enhancement method and system 07548343 Cl. 358-1.9.
Ngai, Jeffrey: See--
Berceanu, Mihai; Ngai, Jeffrey; Martino, Filippo; Travaglini, Vincent; Lee, Kyung-Tae; and Fong, Gary 07547207 Cl. 425-547.
NGK Insulators, Ltd.: See--
Hatano, Tatsuhiko; and Sakuma, Takeshi 07548402 Cl. 361-86.
Matsuda, Hiroto; Nobori, Kazuhiro; and Mori, Yutaka 07547407 Cl. 264-619.
Mizutani, Takashi 07547342 Cl. 55-523.
Nguyen, David: See--
Hiew, Siew Sin; Ni, Jim; Ma, Abraham C.; and Nguyen, David 07547218 Cl. 439-135.
Nguyen, Gia Van; Cambron, Anne-France Gabrielle Jeanne-Marie; and Severens, Frank Pierre, to Goodyear Tire & Rubber Company, The Tire with tread having crossed configuration sipe 07546861 Cl. 152-209.18.
Nguyen, Jeremiah H.: See--
Donde, Yariv; and Nguyen, Jeremiah H. 07547727 Cl. 514-521.
Nguyen, John: See--
Gardiner, Barry; Schaller, Laurent; Gandionco, Isidro Matias; and Nguyen, John 07547313 Cl. 606-153.
Nguyen, Phu Qui: See--
Frese, Peter; Nguyen, Phu Qui; Flosbach, Carmen; Isele, Franziska; Schneider, Mike; and Fuhrmann, Karina 07547739 Cl. 524-487.
Nguyen, Quang-Viet Compact and rugged imaging Raman spectrograph 07548313 Cl. 356-328.
Nguyen, Thanh N.: See--
Pandhare, Shashank J.; Nguyen, Thanh N.; Mercer, Ronald M.; and Lok, Ying P. 07549005 Cl. 710-262.
Nguyen, Truc: See--
Quach, Tony T.; Wu, Vincent; and Nguyen, Truc 07548325 Cl. 358-1.11.
Nguyen, Trung Ngoc: See--
Bailey, David Alan; Nguyen, Trung Ngoc; Nordstrom, Gregory Michael; Patel, Kanisha; and Thurber, Steven Mark 07549090 Cl. 714-43.
Ni, Jim: See--
Hiew, Siew Sin; Ni, Jim; Ma, Abraham C.; and Nguyen, David 07547218 Cl. 439-135.
Nichicon Corporation: See--
Ueda, Akira; Yamaji, Ichirou; Yamada, Katsuharu; Funahashi, Minoru; Mabe, Junkichi; and Kozaki, Ryoichi 07548410 Cl. 361-540.
Nicholas, III, James J.; to Transparence, Inc. Non-intrusive interactive notification system and method 07548955 Cl. 709-206.
Nicholls, John M.: See--
Peiris, Joseph S. M.; Yuen, Kwok Yung; Poon, Lit Man; Guan, Yi; Chan, Kwok Hung; Nicholls, John M.; and Leung, Frederick C. 07547512 Cl. 435-6.
Nichols, Mark Allen: See--
Parks, James; Gehret, Robert S.; Livingston, Scott; O'Banion, Michael L.; Welsh, Robert P; Taylor, William Scott; Huston, Todd L.; Zehr, Edwin G.; Stropkay, Scott; Weissburg, David Louis; Nichols, Mark Allen; Stumpf, William R.; Rohr, Lewis Hampton; Tew, Henry Louis; Paladino, Thomas S.; Eichelberger, Paul; Duncanson, David Edmund; Holleman, Jerry Wayne; and Ayala, Adan 07546790 Cl. 83-468.3.
Nichols, Sr., Dale Hunt; to Smartguard, LLC Intermediate cover board with concealed security device for hard cover product 07548163 Cl. 340-572.1.
Nickel, Charles: See--
Stratakos, Anthony; Li, Jieli; Beronja, Biljana; Lidsky, David; McJimsey, Michael; Schultz, Aaron; Sullivan, Charles R.; and Nickel, Charles 07548046 Cl. 323-282.
Nickel-Jetter, Matthis; Rappenecker, Hermann; and Schreiner, Siegfried, to EMB-PAPST St.Georgen GmbH & Co. KG External-rotor motor having a stationary bearing shaft 07548003 Cl. 310-90.
Nickisch, Klaus: See--
Tilstam, Ulf; Schmitz, Thomas; and Nickisch, Klaus 07547776 Cl. 536-26.7.
Niclass, Cristiano; and Charbon, Edoardo, to Ecole Polytechnique Federale De Lausanne Integrated circuit comprising an array of single photon avalanche diodes 07547872 Cl. 250-214R.
Nicoletti, Michael P.: See--
Van Egmond, Cor F.; Veraa, Michael J.; Silverberg, Steven E.; Nicoletti, Michael P.; and Shutt, John Richard 07547814 Cl. 585-809.
Niddam-Hildesheim, Valerie: See--
Shapiro, Evgeny; Yahalomi, Ronit; Niddam-Hildesheim, Valerie; Sterimbaum, Greta; and Chen, Kobi 07547787 Cl. 546-157.
Nidec Corporation: See--
Misu, Isao; and Tamura, Yuya 07547466 Cl. 427-350.
Niebling, Peter; Hofmann, Heinrich; Dlugai, Darius; Heim, Jens; and Ilgert, David, to Fag Kugelfischer AG Wheel bearing unit embodied as an angular contact ball bearing 07547147 Cl. 384-544.
Nielsen, Elsebet Østergaard: See--
Peters, Dan; Olsen, Gunnar M.; Nielsen, Elsebet Østergaard; Scheel-Krüger, Jørgen; and Eriksen, Birgitte L. 07547788 Cl. 546-206.
Nielsen, Thomas Rostrup: See--
Christensen, Peter Scier; Nielsen, Thomas Rostrup; Erikstrup, Niels; Assberg-Petersen, Kim; Hansen, Jens-Henrik Bak; and Dybkjer, Ib 07547332 Cl. 48-61.
Nieters, Edward James: See--
Ramaswamy, Sivaramanivas; Gigliotti, Michael Francis Xavier; Kommareddy, Vamshi Krishna Reddy; Klaassen, Richard Eugene; Nieters, Edward James; Shyamsunder, Mandayam Tondanur; Keller, Michael Everett; and Kurkcu, Nihat 07546769 Cl. 73-579.
Nieto, John Wesley; to Harris Corporation Method and apparatus for iteratively improving the performance of coded and interleaved communication systems 07548598 Cl. 375-350.
Nihon Kohden Corporation: See--
Yanagihara, Kazuteru; Ishikawa, Takahisa; and Sudo, Kenta 07547280 Cl. 600-300.
Niibori, Kenji: See--
Shioya, Yasushi; Niibori, Kenji; and Takahashi, Nobuyuki 07547240 Cl. 445-25.
Niida, Mitsuo: See--
Hatae, Shinichi; Kobayashi, Takashi; Niida, Mitsuo; and Ohnishi, Shinji 07548546 Cl. 370-412.
Niimi, Junichi: See--
Murata, Syuuichi; Tanaka, Atsushi; Niimi, Junichi; Matusaki, Takahiro; Otonari, Akihide; Araikawa, Yuka; and Obuchi, Kazuhisa 07549102 Cl. 714-748.
Niiyama, Shigeto; Tomioka, Masaki; Miki, Akitoshi; and Terada, Takao, to OMRON Healthcare Co., Ltd. Electronic thermometer 07547140 Cl. 374-208.
Nijhuis, Antony: See--
Busse, Ralf-Dieter; Nijhuis, Antony; Klein, Harald; Stark, Joachim; and Storbeck, Carsten 07548434 Cl. 361-827.
Nijkamp, Aart: See--
Van Acquoij, Catharinus; Van Der Meer, Rene J.; Nijkamp, Aart; Lenczowski, Stanislaw K. J.; Wijngaards, David D. L.; Van Welie, Albert G. M.; and Van Stiphout, Johannes G. V. 07548250 Cl. 347-148.
NIKE, Inc.: See--
Aveni, Michael; Cass, William J.; Dean, Anthony C.; Fagergren, Fred G.; Stockbridge, Kurt Joseph; and Wyszynski, Randall 07546695 Cl. 36-28.
Meschter, James 07546698 Cl. 36-45.
Nikkanen, Jarno; and Kalevo, Ossi, to Nokia Corporation Method, apparatus, imaging module and program for improving image quality in a digital imaging device 07548262 Cl. 348-241.
Nikon Corporation: See--
Sogard, Michael 07548303 Cl. 355-72.
Nikonov, Dmitri E.; to Intel Corporation Non-blocking switch having carbon nanostructures and Mach-Zehnder interferometer 07547907 Cl. 257-9.
Nikovski, Daniel N.; Brand, Matthew E.; and Ebner, Dietmar, to Mitsubishi Electric Research Laboratories, Inc. System and method for scheduling elevator cars using pairwise delay minimization 07546905 Cl. 187-380.
Niles Co., Ltd.: See--
Katoh, Toshi 07548058 Cl. 324-207.21.
Nilson, Thord Agne Gustaf; and Karlsson, Ulf Bengt Ingemar, to Danaher Motion Stockholm AB Electrical drive unit 07548420 Cl. 361-679.54.
Ning, Xian J.; to Semiconductor Manufacturing International (Shanghai) Corporation Integration scheme method and structure for transistors using strained silicon 07547595 Cl. 438-199.
Nippon Chemical Industrial Co., Ltd: See--
Awano, Hidekazu; Ooishi, Yoshihide; and Yamazaki, Nobuyuki 07547492 Cl. 429-231.3.
Awano, Hidekazu; Ooishi, Yoshihide; and Yamazaki, Nobuyuki 07547493 Cl. 429-231.3.
Nippon Steel Corporation: See--
Kaneko, Michio; Tokuno, Kiyonori; Shimizu, Hiroshi; and Dekura, Takateru 07547671 Cl. 510-245.
Nippon Telegraph and Telephone Corporation: See--
Shimamura, Toshishige; Morimura, Hiroki; Shigematsu, Satoshi; Sato, Norio; Urano, Masami; and Machida, Katsuyuki 07548636 Cl. 382-115.
Nippon Thompson Co., Ltd.: See--
Kunimoto, Kazumasa; and Koshino, Naoki 07547144 Cl. 384-447.
Nirgude, Girish: See--
Bhattacharya, Sutirtha; Buttrick, Brenda; Eggleston, David; Fayed, Ayman; Mohan, Raj; Nirgude, Girish; Patel, Sanjay; Sawhney, Ashit; and Yeluri, Raghu 07548824 Cl. 702-81.
Nirve Sports, Ltd.: See--
Bon, Dan 07547021 Cl. 280-11.115.
Nishi, Nobuyuki: See--
Miyake, Toshio; Yanagishita, Kenji; and Nishi, Nobuyuki 07547099 Cl. 347-104.
Nishida, Katsutoshi: See--
Ohbayashi, Takayuki; Okagawa, Takatoshi; and Nishida, Katsutoshi 07548524 Cl. 370-331.
Nishida, Masaharu; and Ohga, Hiroshi, to Hitachi High-Technologies Corporation Automatic analyzer 07547414 Cl. 422-67.
Nishida, Shinichi: See--
Kawasaki, Taku; Nishida, Shinichi; and Konno, Takayuki 07548295 Cl. 349-141.
Nishikawa, Ryuji: See--
Omura, Tetsuji; and Nishikawa, Ryuji 07548019 Cl. 313-506.
Nishimachi, Ryuzo: See--
Kondo, Tsuneo; Nishimachi, Ryuzo; Yotabun, Tomohiro; and Inubushi, Hisao 07546937 Cl. 222-600.
Nishimoto, Kenji: See--
Shinozaki, Masao; Nishimoto, Kenji; Akioka, Takashi; Kohara, Yutaka; Asari, Sanae; Miyata, Shusaku; and Nakazato, Shinji 07547971 Cl. 257-759.
Nishimura, Ken; Arai, Naoto; Oshima, Toru; Daio, Fumio; Ikoma, Munehisa; and Kaiya, Hideo, to Panasonic Corporation Electrochemical device 07547489 Cl. 429-122.
Nishio, Yuji; Iwamoto, Yasukazu; and Hashimoto, Tadanori, to Horiba, Ltd. Responsive glass membrane for ion selective electrode and ion selective electrode 07547379 Cl. 204-420.
Nishiura, Akio: See--
Sakai, Yoshiki; Nishiura, Akio; and Ogata, Teppei 07547715 Cl. 514-353.
Nishizawa, Hirotaka; Yukawa, Yosuke; and Totsuka, Takashi, to Renesas Technology Corp. IC card with bonding wire connections of different lengths 07547961 Cl. 257-679.
Nisisu, Koji: See--
Yamamura, Hideho; Maru, Naoki; Nakajima, Kazunori; Nisisu, Koji; and Oomae, Shigeo 07548411 Cl. 361-611.
Nissan Motor Co., Ltd.: See--
Furusho, Hiroyuki; and Nawano, Masaaki 07546896 Cl. 180-446.
Yamaguchi, Koichi; Aoyama, Takashi; and Shoji, Tadashi 07547333 Cl. 48-127.9.
Nissan Technical Center North America, Inc.: See--
Tengler, Steve; and Auflick, Jack 07548173 Cl. 340-903.
Womack, Darren; and Bowes, William G. 07547170 Cl. 410-105.
Nitsche, Thomas: See--
Pullmann, Juergen; Zinser, Christoph; and Nitsche, Thomas 07548159 Cl. 340-545.1.
Nitto Boseki Co., Ltd.: See--
Hashimoto, Mitsumasa; Takeuchi, Minoru; Kataoka, Shuichi; and Takemoto, Kiyohiko 07547747 Cl. 525-328.2.
Nitto Denko Corporation: See--
Kitamura, Yoshitsugu; and Takada, Katsunori 07548290 Cl. 349-96.
Niu, Feng: See--
Kyperountas, Spyros; Correal, Neiyer S.; Niu, Feng; and Shi, Qicai 07548517 Cl. 370-252.
Nivarti, Sreedhar: See--
Shivaram, Asha Attur; Nivarti, Sreedhar; Venkataraman, Narendra; and Balakrishnan, Palpandian 07548754 Cl. 455-466.
Nivis GmbH-SRL: See--
Stofner, Wilhelm 07546960 Cl. 239-419.5.
Niwa, Kenichi: See--
Sakai, Shuji; Sugiyama, Naoki; and Niwa, Kenichi 07548639 Cl. 382-128.
Nixon, Ian Michael: See--
Ganesan, Subbu; Broukhis, Leonid Alexander; Narayanaswamy, Ramesh; Nixon, Ian Michael; and Spencer, Thomas Hanni 07548842 Cl. 703-14.
No, Hai Ju; Kim, Hee Sung; Woo, Jung Bum; Go, Sang Nam; and Kim, Tae Hyung, to Hynix Semiconductor Inc. Ball attaching apparatus for correcting warpage of substrate and method of attaching solder balls using the same 07546941 Cl. 228-41.
Noble, Michael; to PA Consulting Services Ltd. Devices and methods for measuring clinically relevant analytes in fluids 07548773 Cl. 600-347.
Nobori, Kazuhiro: See--
Matsuda, Hiroto; Nobori, Kazuhiro; and Mori, Yutaka 07547407 Cl. 264-619.
Nogaj, Bozena: See--
Krzysik, Duane G.; Baldwin, Stephen; and Nogaj, Bozena 07547443 Cl. 424-401.
Noguchi, Mineo; to Oki Semiconductor Co., Ltd. Oscillation circuit with temperature-dependent current source 07548131 Cl. 331-176.
Noh, Dong-Hoon; and Kim, Joo-Sub, to Samsung Electronics Co., Ltd Method and apparatus for outputting audio data and musical score image 07547840 Cl. 84-601.
Noh, Jeoung Kwen: See--
Lee, Young Chul; Lee, Jae Seung; and Noh, Jeoung Kwen 07547564 Cl. 438-26.
Nojiri, Isao; and Makabe, Ryu, to Renesas Technology Corp. Semiconductor device and its wiring method 07547963 Cl. 257-686.
Nojiri, Toru: See--
Baker, David; Basoglu, Christopher; Cutler, Benjamin; Gervasio, Gregorio; Lee, Woobin; Mundkur, Yatin; Nojiri, Toru; O'Donnell, John; Poole, deceased, David; Raman, Ashok; Rehm, Eric; and Thekkath, Radhika 07548996 Cl. 710-22.
Nokia Corporation: See--
Asnis, Jim 07548945 Cl. 709-201.
Hämäläinen, Jyri; and Tiirola, Esa 07548527 Cl. 370-335.
Kalliola, Kimmo; Kauppinen, Hannu; Jantunen, Joni; Kainulainen, Antti; and Nurmela, Vuokko 07548203 Cl. 342-418.
Nikkanen, Jarno; and Kalevo, Ossi 07548262 Cl. 348-241.
Salo, Juha H.; and Aaltonen, Janne 07548518 Cl. 370-259.
Nokia Mobile Phones Limited: See--
Strawn, Andrew; Bateman, Phil; and Strafford, Robert 07548761 Cl. 455-550.1.
Nokia Siemens Networks GmbH & Co. KG: See--
Breuer, Volker; Junghanns, Steffen; Lamprecht, Frank; Splett, Armin; Ulrich, Thomas; and Wolff, Gunter 07548528 Cl. 370-335.
Kozek, Wemer; and Schüszler, Bert 07548516 Cl. 370-249.
Nolan, Sean: See--
Bhambri, Vikram; Walsh, Deirdre L.; Sausville, Paul C.; Biyani, Raj; Button, Thomas L.; Nolan, Sean; Warren, Susan; and Hempey, Matthew D. 07548889 Cl. 705-64.
Nolcheff, Nick A.: See--
Schuster, William B.; Kontos, Karen B.; Weir, Donald S.; Nolcheff, Nick A.; and Gunaraj, John A. 07547186 Cl. 415-119.
Nomi, Margaret L.: See--
Avery, Robert L.; Cronie, Wendy; Fromm, Erik; Nomi, Margaret L.; Rhodes, Patricia; Khera, Cheryl; Kirkish, Paula M.; Leonhardi, David R.; Moloney, Jay P.; Bueser, Matthew C.; and Thacker, Grant H. 07548802 Cl. 701-35.
Nomura, Keiichi: See--
Watanabe, Minoru; Morishita, Masakazu; Mochizuki, Chiori; Nomura, Keiichi; and Ishii, Takamasa 07547890 Cl. 250-370.08.
Nomura, Kenji: See--
Takamatsu, Tomohiro; Watanabe, Junichi; Nakamura, Ko; Wang, Wensheng; Sato, Naoyuki; Dote, Aki; Nomura, Kenji; Horii, Yoshimasa; Kurasawa, Masaki; and Takai, Kazuaki 07547933 Cl. 257-295.
Nomura, Shoichi: See--
Nakajima, Takeshi; Ito, Tsukasa; Hattori, Tsuyoshi; Nomura, Shoichi; and Ikeda, Chizuko 07548656 Cl. 382-240.
Nomura, Yoshikuni: See--
Mitsunaga, Tomoo; and Nomura, Yoshikuni 07548264 Cl. 348-272.
Nonaka, Masao; Futa, Yuichi; Nakano, Toshihisa; Yokota, Kaoru; Ohmori, Motoji; Miyazaki, Masaya; Yamamoto, Masaya; Murase, Kaoru; and Onoda, Senichi, to Panasonic Corporation Unauthorized contents detection system 07549061 Cl. 713-193.
Nonaka, Nobuyuki: See--
Koyama, Toshimi; Nonaka, Nobuyuki; and Migita, Jituo 07548213 Cl. 343-788.
Nonaka, Yoshinori: See--
Kikuchi, Norihiko; Nonaka, Yoshinori; Tatani, Kazuya; Hiratochi, Masahiro; Kuramochi, Yu; Isaji, Masayuki; Shimizu, Kazuo; and Miyagi, Takashi 07547680 Cl. 514-43.
Nonoshita, Hiroshi: See--
Terashima, Yoshihiro; Nonoshita, Hiroshi; and Yuasa, Nobuyuki 07548841 Cl. 703-13.
Nordstrom, Gregory Michael: See--
Bailey, David Alan; Nguyen, Trung Ngoc; Nordstrom, Gregory Michael; Patel, Kanisha; and Thurber, Steven Mark 07549090 Cl. 714-43.
Nordstrom, Steven: See--
Lennox, Charles D.; Lamport, Ronald B.; Levine, Andrew H.; Godshall, Douglas E.; Perlmutter, Aaron; and Nordstrom, Steven 07547291 Cl. 604-8.
Norfidathul, Aizar Abdul Karim: See--
Ng, Kee Yean; Koay, Hui Peng; Lee, Chiau Jin; Tan, Kheng Leng; Loo, Wei Liam; Ng, Keat Chuan; and Norfidathul, Aizar Abdul Karim 07547583 Cl. 438-123.
Norman, Casey William; to Genie Toys PLC Drawing apparatus 07546686 Cl. 33-27.01.
Norman, Robert D.: See--
Auclair, Daniel L.; Craig, Jeffrey; Mangan, John S.; Norman, Robert D.; Guterman, Daniel C.; and Mehrotra, Sanjay 07548461 Cl. 365-185.22.
Norrie, Ross: See--
O'Halloran, Steve; and Norrie, Ross 07548878 Cl. 705-28.
Nortel Networks Limited: See--
Ma, Jianglei; Jia, Ming; Zhu, Peiying; and Tong, Wen 07548506 Cl. 370-208.
Periyalwar, Shalini; Zhang, Hang; Senarath, Nimal; Yu, Derek; Au, Kelvin Kar-Kin; and Mann, Karl 07548758 Cl. 455-517.
North Carolina State University: See--
Velev, Orlin 07547380 Cl. 204-547.
Northrop Grumman Corp: See--
Chen, Li-Shu 07547586 Cl. 438-140.
Northrop Grumman Corporation: See--
Alon, Yair; and Jacobs, Mark 07548189 Cl. 342-174.
Norum, James P.: See--
Cheng, Kangguo; Faltermeier, Johnathan E.; and Norum, James P. 07547608 Cl. 438-401.
Notarfrancesco, Luciano: See--
Futoransky, Ariel; Yamada, Carlos Emilio Sarraute; Bendersky, Diego Ariel; Notarfrancesco, Luciano; and Waissbein, Ariel 07549147 Cl. 717-155.
Nova Biomedical Corporation: See--
Cai, Xiaohua; Winarta, Handani; and Young, Chung Chang 07547383 Cl. 205-777.5.
Novariant, Inc.: See--
Rossow, Matthew J.; O'Connor, Michael L.; and Lawrence, David G. 07548804 Cl. 701-36.
Novelis Inc.: See--
Davisson, Thomas L.; and Nadkarni, Sadashiv 07547463 Cl. 427-209.
Novoplanski, Avishay: See--
Spector, Yuval; Raz, Dan; Novoplanski, Avishay; and Rinberg, Gregory 07547078 Cl. 305-60.
Nowak, Edward J.: See--
Anderson, Brent A.; and Nowak, Edward J. 07547947 Cl. 257-369.
Nowicki, Paul D.: See--
Humphries, Eric C.; Barratt, Stephen D.; Stauffer, Ray; Nowicki, Paul D.; and Miller, John H. 07546900 Cl. 181-286.
Nowotnik, David P.: See--
Jacob, Jeremy E.; Nowotnik, David P.; and Baud, Christiane M. 07547433 Cl. 424-49.
Nozu, Daisuke: See--
Hasebe, Kazuhide; Nozu, Daisuke; and Choi, Dong-Kyun 07546840 Cl. 134-22.1.
NSK Ltd.: See--
Endo, Shuji; Aoki, Yuho; Kobayashi, Hideyuki; and Ta, CaoMinh 07548035 Cl. 318-432.
Kinno, Dai; Ito, Hiroyuki; Yabe, Toshikazu; and Higashi, Shingo 07547146 Cl. 384-477.
NSK-Warner K.K.: See--
Fujii, Tamotsu; Maruo, Kenji; and Takabayashi, Hideaki 07546913 Cl. 192-3.28.
NTN Corporation: See--
Nakagawa, Tohru 07547254 Cl. 464-145.
Yamamoto, Ken 07547145 Cl. 384-448.
NTT DoCoMo, Inc.: See--
Motegi, Masayuki; Kayama, Hidetoshi; and Umeda, Narumi 07548519 Cl. 370-318.
Ohbayashi, Takayuki; Okagawa, Takatoshi; and Nishida, Katsutoshi 07548524 Cl. 370-331.
Nugent, Dillon: See--
Bradlee, David G.; Nugent, Dillon; and Morein, William 07548925 Cl. 707-100.
Null, Michael E.: See--
Altman, David H.; Ellsworth, Joseph R.; and Null, Michael E. 07548424 Cl. 361-699.
Numakami, Yukio; and Tada, Kenichiro, to Pioneer Corporation Data-processing device, system thereof, method thereof, program thereof, and recording medium storing the program 07548950 Cl. 709-204.
Numata, Hiroyuki: See--
Ichiyanagi, Hoshibumi; Takenouchi, Shinya; Satoh, Yasuhiro; and Numata, Hiroyuki 07548182 Cl. 342-27.
Nunez, George A.: See--
Adams, Ronald D.; Sullivan, III, Roy H.; Nunez, George A.; Main, Lauren O.; Kratsch, Peter K.; Kortenbach, Jurgen A.; Solar, Matt; Buess, Gerhard F.; and Schurr, Marc O. 07546939 Cl. 227-180.1.
Nurmela, Vuokko: See--
Kalliola, Kimmo; Kauppinen, Hannu; Jantunen, Joni; Kainulainen, Antti; and Nurmela, Vuokko 07548203 Cl. 342-418.
Nusser, Hans-Martin: See--
Westmont, Scott A.; Beer, Franz; Friedmann, Gerd; and Nusser, Hans-Martin 07546700 Cl. 37-223.
Nutter, Mark Richard: See--
Aguilar, Jr., Maximino; Nutter, Mark Richard; and Stafford, James Michael 07549145 Cl. 717-149.
Nuzzi, Joseph P.; and Mast, Wendell E., to Allied Machine & Engineering Corp. Spade drill insert having helical margins 07547166 Cl. 408-233.
NVIDIA Corp.: See--
Dewey, Thomas E.; Wagner, Barry A.; Chao, Weijen; Bell, Andrew R.; and Bachman, David A. 07548481 Cl. 365-227.
NVIDIA Corporation: See--
Berteig, Rolf; Driemeyer, Thomas; LeFrancois, Martin-Karl; and Herken, Rolf 07548238 Cl. 345-426.
Delano, Cary L. 07548178 Cl. 341-143.
Liu, Tao; Keramat, Mansour; Liu, Edward Wai Yeung; Heshami, Mehrdad; and Kuo, Timothy C. 07548740 Cl. 455-260.
NXP B.V.: See--
Li, Gordon Y.; Hebron, Yoav; Grove, Bruce A.; and Kwong, Adrian 07549156 Cl. 725-111.
Parsa, Ali; Fotowat-Ahmady, Ali; Faghfuri, Ali; Jenabi, Mahta; Riou, Emmanuel; and Hahn, Wilhelm Steffen 07548591 Cl. 375-298.
Rosik, Ray; Gao, Weinan; and Lindstrom, Mats 07548128 Cl. 331-116R.
Nye, Gary R. Log skidding implement for a three-point tractor hitch 07547180 Cl. 414-703.
Nykiforuk, Cory: See--
Moloney, Maurice M.; Boothe, Joseph; Keon, Richard; Nykiforuk, Cory; and Van Rooijen, Gijs 07547821 Cl. 800-288.
Nzelibe, Chika N.: See--
Gruenfelder, Nicole L.; Nzelibe, Chika N.; Israel, Joshua D.; and Brooks, Jr., Lowry J. 07546759 Cl. 73-40.