US 7,548,825 B2
Method and apparatus for current and temperature measurement in an electronic power circuit
Reinhold Bayerer, Warstein (Germany); and Markus Thoben, Soest (Germany)
Assigned to Infineon Technologies AG, Munich (Germany)
Filed on Jan. 12, 2007, as Appl. No. 11/622,727.
Claims priority of application No. 10 2006 001 874 (DE), filed on Jan. 13, 2006.
Prior Publication US 2007/0176626 A1, Aug. 02, 2007
Int. Cl. G01K 15/00 (2006.01); G01R 31/14 (2006.01)
U.S. Cl. 702—99  [702/104; 702/105; 702/117; 324/765] 9 Claims
OG exemplary drawing
 
1. A method for current/temperature measurement in an electronic power circuit, comprising:
using a first sensor component and at least one second sensor component in the electronic power circuit to respectively measure a first current/temperature value or a first variable value which is distinctly dependent on the first current/temperature value and at least one second current/temperature value or a second variable value which is distinctly dependent on the second current/temperature value, wherein the first and the at least one second sensor component respectively have voltage/current temperature characteristics which are linearly independent from one another and wherein at least one of the sensor components is a parasitic component of the electronic power circuit; and
during operation of the electronic power device, calibrating a first current/temperature value or first variable value measured by the first sensor component on the basis of current/temperature measurements by the at least one second sensor component at least two different temperatures and different current values using a calibration process which takes place during a production process of the electronic power circuit, wherein the first current/temperature value or first variable value measured by the first sensor component is adjusted using parameters ascertained during the calibration process to compensate for the temperature and/or current dependence of the measured first variable value.