US 7,548,309 B2
Inspection apparatus, inspection method, and manufacturing method of pattern substrate
Haruhiko Kusunose, Kanagawa (Japan); and Tomoya Tamura, Kanagawa (Japan)
Assigned to Lasertec Corporation, Kanagawa (Japan)
Filed on Feb. 04, 2008, as Appl. No. 12/25,521.
Claims priority of application No. 2007-029958 (JP), filed on Feb. 09, 2007.
Prior Publication US 2008/0192238 A1, Aug. 14, 2008
Int. Cl. G01N 21/88 (2006.01)
U.S. Cl. 356—237.2  [356/237.1; 356/237.5; 356/394] 16 Claims
OG exemplary drawing
 
1. An inspection apparatus comprising:
a light source generating light beam;
a lens focusing the light beam emitted from the light source to form a light spot on a sample surface;
an optical dividing element dividing the light beam reflected from the sample surface or transmitted through the sample into a plurality of different light beams;
a first photodetector receiving a first light beam divided by the optical dividing element to output a first output signal based on a beam amount of the received beam;
a second photodetector receiving a second light beam divided by the optical dividing element to output a second output signal based on a beam amount of the received beam;
a defect candidate detection part detecting a defect candidate based on the first output signal and the second output signal to output a first defect candidate signal and a second defect candidate signal; and
a real defect determination part determining the defect candidate as a real defect upon detecting the first defect candidate signal and the second defect candidate signal within a certain period of time;
wherein the optical dividing element is disposed at a position to divide the light beam substantially in half in a direction orthogonal to an optical axis of the light beam when the light beam is reflected from a region having no defects on the sample, and
wherein the optical dividing element divides the light beam by changing a propagation direction of the light beam which is made incident on the optical dividing element into different propagation directions.