US 7,545,561 B2
Image display and method for evaluating glass substrate to be used in same
Daisuke Adachi, Kameoka (Japan); Hiroyasu Tsuji, Sennan-gun (Japan); and Keisuke Sumida, Hirakata (Japan)
Assigned to Panasonic Corporation, Osaka (Japan)
Appl. No. 10/499,339
PCT Filed Nov. 27, 2003, PCT No. PCT/JP03/15123
§ 371(c)(1), (2), (4) Date Jun. 17, 2004,
PCT Pub. No. WO2004/051606, PCT Pub. Date Jun. 17, 2004.
Claims priority of application No. 2002-347188 (JP), filed on Nov. 29, 2002.
Prior Publication US 2005/0062416 A1, Mar. 24, 2005
Int. Cl. G06K 7/10 (2006.01)
U.S. Cl. 359—350  [359/900; 359/896; 356/51; 356/445; 65/29.18] 1 Claim
OG exemplary drawing
 
1. An evaluating method of a front-side glass substrate manufactured by a float method for an image display device, the evaluating method comprising:
measuring reflection spectrum at a wavelength of 180 to 280 nm;
dividing the measured reflection spectrum into two components by a curve fitting method using a following equation (2)

OG Complex Work Unit Drawing
one of the components being a component with Gaussian peak at a wavelength of 220 nm and a correlation to Sn++, and the other of the components being a component with no correlation to Sn++;
comparing areas of the components with Gaussian peak at a wavelength of 220 nm having a correlation to Sn++; and
analyzing Sn++ content in the front-side glass substrate,
wherein λ is a wavelength (nm), and M1 to M6 are fitting parameters.