LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 2nd DAY OF June, 2009
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).
E-Lead Electronics Co., Ltd.: See--
E-Pin Optical Industry Co., Ltd.: See--
Shyu, San-Woei; Wang, Chi-Hsiung; and Huang, Chih-Hsiung
07540982 Cl. 264-1.32.
E. I. du Pont de Nemours and Company: See--
Bartelt, Joan Ellen
07540973 Cl. 252-67.
DiCosimo, Robert; Jackson, Scott Christopher; and Panova, Anna
07541422 Cl. 528-272.
E.I. Du Pont de Nemours & Company: See--
Anderson, Albert Gordon; Feaster, John; Patel, Damini; and Scialdone, Mark
07540906 Cl. 106-18.32.
Bramucci, Michael G.; Nagarajan, Vasantha; Sedkova, Natalia; and Singh, Manjari
07541173 Cl. 435-252.3.
Finkelstein, Bruce Lawrence; Lahm, George Philip; McCann, Stephen Frederick; Selby, Thomas Paul; Song, Ying; and Stevenson, Thomas Martin
07541377 Cl. 514-406.
Huang, Donald Da-Jen; Jaycox, Gary Delmar; Douglas, Carl Brent; Wilczek, Lech; Cohen, Gordon Mark; and Brandenburg, Charles J.
07541392 Cl. 523-116.
Simpson, III, Thomas W.; Martino, Anthony Joseph; Schermacher, Ken Stephen; Reinhardt, Matthew Paul; and Alspach, Jeff B.
07542143 Cl. 356-436.
E.V.R. Endovascular Researches S.A.: See--
Loaldi, Alessandro
07540879 Cl. 623-1.11.
Eagle Industry Co., Ltd.: See--
Fujiwara, Yasushi; and Matsuki, Takuji
07540539 Cl. 285-205.
Earthlink: See--
East China University of Science and Technology: See--
Qian, Xuhong; Li, Yonggang; Xu, Yufang; Ding, Jian; Lin, Liping; Miao, Zehong; Zhu, Hong; and Qu, Baoyuan
07541463 Cl. 546-58.
Eastman Chemical Company: See--
Carvagno, Lawrence; Cook, William L.; Dailey, Ronald Keith; and Southerland, Jacob Anthony
07540386 Cl. 209-638.
DeBruin, Bruce Roger
07541423 Cl. 528-308.8.
Kanel, Jeffrey Scott; and Okrasinski, Stanley John
07541499 Cl. 568-9.
Murdaugh, Sr., Perry Michael; Howell, Jr., Earl Edmondson; Wells, Cory Lee; Weaver, Max Allen; and Pearson, Jason Clay
07541407 Cl. 524-755.
Eastman Kodak Company: See--
Dejesus, M. Cristina B.; Wilson, John C.; and Hewitt, Charles E.
07540981 Cl. 252-519.1.
Fredlund, John Randall; Patton, David Lynn; Morton, Roger R. A.; and Paciocco, Steven Bruce
07542184 Cl. 358-487.
Guan, Shan; Baumer, Michael F.; Sexton, Richard W.; and Harrison, Jr., James E.
07540589 Cl. 347-47.
Guistina, Robert A.; Tyagi, Dinesh; and Morgan, Jason
07541130 Cl. 430-108.5.
Molaire, Michel F.; Ferrar, Wayne T.; Weiss, David S.; and Wilson, John C.
07541124 Cl. 430-64.
Easton, Janet R.: See--
Belmar, Brenton F.; Easton, Janet R.; Lu, Tan; Osisek, Damian L.; Tarcza, Richard P.; and Wyman, Leslie W.
07543095 Cl. 710-260.
Easton, Jr., Robert E.; Keller, Neal M.; Lee, Juhnyoung; and Ungar, Lisa M., to International Business Machines Corporation Intelligent web based help system
07543232 Cl. 715-708.
Eastway Fair Company Limited: See--
Harrison, Ryan; and Ohi, Taku
D0593488 Cl. D13-103.
Eaton Corporation: See--
Johnson, Jr., Robert W.
07542268 Cl. 361-622.
Eaton, Jennifer: See--
Barret, D. Neale; Eaton, Jennifer; Nakamura, Joy; and Shaw, Deanna M.
07542911 Cl. 705-2.
Ebara Corporation: See--
Ito, Shoji; and Kawabata, Junya
07540725 Cl. 417-423.1.
Ebel, Harald: See--
Goetze, Sven; Ebel, Harald; Kleinschmidt, Juergen; and Ahmad, Imtiaz
07541604 Cl. 250-504R.
Eberhardy, Peter: See--
Sun, Ray; Eberhardy, Peter; and Wieland, Peter William
07542557 Cl. 379-142.06.
Ebert, Gregory L.; to Intel Corporation Method and an apparatus to reduce electromagnetic interference
07542534 Cl. 375-354.
Ebert, Todd A.; to Florida Turbine Technologies, Inc. Box rim cavity for a gas turbine engine
07540709 Cl. 415-173.7.
Ebihara, Hiromitsu: See--
Shiraishi, Yoshihide; and Ebihara, Hiromitsu
07540447 Cl. 242-421.
Ebner, Fritz F.; Curry, Donald J.; Tse, Francis K.; Crean, Peter A.; Birnbaum, David; Kletter, Doron; and Buckley, Robert R., to Xerox Corporation Common exchange format architecture for color printing in a multi-function system
07542164 Cl. 358-1.2.
Echevarria, Louis Daniel: See--
Compton, Matthew Charles; Echevarria, Louis Daniel; Maletich, Michael R.; and Welp, Richard Albert
07542985 Cl. 707-101.
Echizenya, Akira: See--
Matsuo, Ryuji; Echizenya, Akira; and Fujinawa, Go
07542548 Cl. 378-84.
Eck, Alexander: See--
Hoffman, Werner; and Eck, Alexander
07540207 Cl. 74-25.
Eck, Bernd: See--
Hammon, Ulrich; Baumann, Dieter; Heilek, Joerg; Mueller-Engel, Klaus Joachim; and Eck, Bernd
07540884 Cl. 23-295R.
Eckel, Markus: See--
Sardi, Marco; Plazio, Adriano; Amerio, Fulvio; Eckel, Markus; Bahr, Markus; Woller, Josef; and Maier, Wolfgang
07540772 Cl. 439-581.
Eckel, Markus; Hruby, Rolf; Neumeuer, Horst; and Woller, Josef, to Tyco Electronics AMP GmbH Electrical plug and method of fitting the plug
07540775 Cl. 439-587.
ECRM, Inc.: See--
Edelberg, Erik: See--
Owczarz, Aleksander; Winniczek, Jaroslaw W.; Nasser, Luai; Schoepp, Alan; Redeker, Fred C.; and Edelberg, Erik
07542134 Cl. 356-237.3.
Edelman, Alan: See--
Choy, Long Yin; Edelman, Alan; and Husbands, Parry Jones Reginald
07542981 Cl. 707-101.
Edelman, Alexandre: See--
Ortega, Ruben E.; and Edelman, Alexandre
07542978 Cl. 707-101.
Edelman, Alexandre; Lopez, Gus; and Treder, Douglas, to Amazon Technologies, Inc. Web site content change management
07543005 Cl. 707-203.
Eder, Max: See--
Baintner, Alfons; Bienert, Karl-Heinz; Dylla, Norbert; and Eder, Max
07540239 Cl. 101-174.
Edison Nation, LLC: See--
Bizzell, Daniel Lee
D0593411 Cl. D9-434.
Edmoundson, Greg: See--
Male, Leo; Scheer, Jim; Geldbach, Erik; Younger, Keith E.; and Edmoundson, Greg
07540765 Cl. 439-498.
Edscha AG: See--
Edwards, Bryan T.; Colvin, Gerald R.; and Durand, Christophe Method and apparatus for broadcasting software update information to mobile phones over a wireless communications network
07542759 Cl. 455-419.
Edwards Vacuum, Inc.: See--
Ramsay, Bruce Gordon
07541061 Cl. 427-248.1.
Efrati, Yair: See--
Mass, Nissim; Lior, Tsafrir; Efrati, Yair; Asis, Ilan; and Paz, Hagai
07541080 Cl. 428-40.1.
Egawa, Hiroshi; Hori, Michihiro; Kado, Hidemi; Morita, Yoshiyuki; Osawa, Mitsuru; and Omori, Ayako, to Honda R&D Co, Ltd. Antifreeze/coolant composition
07540974 Cl. 252-71.
Egawa, Yasuhisa; Yasuhara, Shigeto; and Matsuura, Yuji, to Honda Motor Co., Ltd. Rear structure of vehicle body
07540559 Cl. 296-203.04.
Egger, Janet N.; to Terra Nova Nurseries, Inc. Pulmonaria plant named ‘Silver Bouquet’
PP020059 Cl. PLT-473.
Egger, Rafael: See--
Singer, Wolfgang; Deguenther, Markus; Kuerz, Birgit; Egger, Rafael; Wangler, Johannes; and Maul, Manfred
07542217 Cl. 359-709.
EGLO Leuchten GmbH: See--
Eguchi, Takahiro: See--
Kasai, Takahide; and Eguchi, Takahiro
07541037 Cl. 424-195.16.
Ehman, Mike; Mainil, Dennis; and Mainil, Colby Step climbing wheelchair
07540504 Cl. 280-5.2.
Eichelberger, Kevin D.; to Monsanto Technology LLC Plants and seeds of corn variety I029427
07541523 Cl. 800-320.1.
Eichner, Wolfram: See--
Hemberger, Jurgen; Orlando, Michele; Sommermeyer, Klaus; Eichner, Wolfram; Frie, Sven; Lutterbeck, Katharina; Jungheinrich, Cornelius; and Scharpf, Roland
07541328 Cl. 514-2.
Eijkhoudt, Roger: See--
Dakka, Jihad Mohammed; Goris, Hans K. T.; Mathys, Georges M. K.; Eijkhoudt, Roger; Puttemans, Marc P. H.; and Brown, Stephen Harold
07541507 Cl. 585-533.
Ein, Robert John Virtual walker apparatus
07540342 Cl. 180-19.1.
Eipper, Konrad: See--
Benz, Eberhard; Eipper, Konrad; and Goettker, Stephan
07540558 Cl. 296-193.06.
Eirich, Thomas: See--
Baentsch, Michael; Buhler, Peter; Eirich, Thomas; Hoering, Frank; Oestreicher, Marcus; and Weigold, Thomas D.
07543159 Cl. 713-193.
EIS Electronic Integrated Systems Inc.: See--
Eisai R&D Management Co., Ltd.: See--
Arakawa, Yoshihiro; and Miyazaki, Makoto
07541371 Cl. 514-323.
Oinuma, Hitoshi; Ohi, Norihito; Sato, Nobuaki; Soejima, Motohiro; Seshimo, Hidenori; Terauchi, Taro; Doko, Takashi; and Kohmura, Naohiro
07541376 Cl. 514-405.
Tsukahara, Kappei; Hata, Katsura; Sagane, Koji; Nakamoto, Kazutaka; Tsuchiya, Mamiko; Watanabe, Naoaki; Ohba, Fuminori; Tsukada, Itaru; Ueda, Norihiro; Tanaka, Keigo; and Kai, Junko
07541332 Cl. 514-2.
Eisenmann Anlagenbau GmbH & Co. KG: See--
Heim, Juergen; and Heizmann, Christoph
07540373 Cl. 198-801.
Eisenwiener, Klaus-Peter: See--
Maecke, Helmut Robert; Reubi, Jean Claude; Rink, Hans; and Eisenwiener, Klaus-Peter
07541018 Cl. 424-1.41.
Ekin, Ahmet; Hampapur, Arun; and Pankanti, Sharathchandra U., to International Business Machines Corporation System and method for assuring high resolution imaging of distinctive characteristics of a moving object
07542588 Cl. 382-103.
Eklow, William: See--
Jun, Hongshin; Saharia, Gyaneshwar S.; and Eklow, William
07543208 Cl. 714-727.
Eklund, Neil Holger White: See--
Chalermkraivuth, Kete Charles; Bollapragada, Srinivas; Bonissone, Piero Patrone; Clark, Michael Craig; Eklund, Neil Holger White; Iyer, Naresh Sundaram; and Subbu, Rajesh Venkat
07542932 Cl. 705-35.
El-Damhougy, Hesham; to Boeing Company, The Tactical cognitive-based simulation methods and systems for communication failure management in ad-hoc wireless networks
07542436 Cl. 370-310.
El-Khashab, Ayman Moustafa: See--
Swartzlander, Jr., Earl E.; and El-Khashab, Ayman Moustafa
07543010 Cl. 708-404.
El Kholy, Ismail: See--
Pessin, Jean-Louis; El Kholy, Ismail; and Jacob, Gregoire
07540308 Cl. 141-11.
El Wardani, Ladd: See--
Gurantz, Itzhak; El Wardani, Ladd; and Landry, Michael
07542715 Cl. 455-3.01.
Elbaz, Moshe: See--
Eshkoli, Noam; and Elbaz, Moshe
07542068 Cl. 348-14.08.
Elbit Systems Ltd.: See--
Gandelsman, Mark; and Kornblau, Giora
07542869 Cl. 702-152.
Elder, Amy M.: See--
Luly, Jay R.; Nakasato, Yoshisuke; Ohshima, Etsuo; Harriman, Geraldine C. B.; Carson, Kenneth G.; Ghosh, Shomir; Elder, Amy M.; and Mattia, Karen M.
07541365 Cl. 514-290.
Eldridge, David: See--
Lancaster, III, Patrick R.; Johnson, Richard L.; Hall, Willie Martin; Anderson, Jeremy D.; and Eldridge, David
07540128 Cl. 53-556.
Electric Power Research Institute, Inc.: See--
Frattini, Paul L.; Varrin, Robert Douglas; and Hunt, Edwin Stephen
07542539 Cl. 376-308.
Electronics and Telecommunications Research Institute: See--
Chang, Kyung-Hi; Kim, Kwang-Soon; Cho, Yong-Soo; and Ha, Suk-Won
07542504 Cl. 375-132.
Choi, Byoung Gun; Hyun, Seok Bong; Tak, Geum Young; Lee, Hee Tae; Park, Seong-Su; and Park, Chul Soon
07542521 Cl. 375-316.
Lee, Byoung-Sun; Lee, Jeong-Sook; Mo, Hee-Sook; Kim, Jae-Hoon; and Lee, Seong-Pal
07542829 Cl. 701-13.
Nam, Eun Soo; Hong, Seon Eui; Oh, Myoung Sook; Kim, Yong Won; Kim, Ho Young; and Kim, Bo Woo
07541659 Cl. 257-461.
Park, Bong-Hyuk; Kim, Jong-Won; Jun, Yong-Il; and Lee, Hyeong-Ho
07542731 Cl. 455-84.
Park, Joong-Ki; Kim, Joong Bae; and Son, Duk Joo
07543047 Cl. 709-221.
Electronics Systems Protection, Inc.: See--
Dawley, Robert Albert
07541696 Cl. 307-103.
Eli Lilly and Company: See--
Bhat, Balkrishen; Patel, Bharvin Kumar; and Swayze, Eric
07541344 Cl. 514-44.
Eliazer, Susan: See--
D'Amour, Kevin Allen; Agulnick, Alan D.; Eliazer, Susan; and Baetge, Emmanuel E.
07541185 Cl. 435-377.
Elisha Holding LLC: See--
Wu, Wan-Chu; Yang, Wei-Liang; and Chang, Wen-Chi
07541095 Cl. 428-446.
Elite Semiconductor Memory Technology Inc.: See--
Kuo, Chung-Shan
07542352 Cl. 365-185.25.
Elkington, Susan: See--
Lubbers, Clark; Elkington, Susan; Hess, Randy; Sicola, Stephen J.; McCarty, James; Korgaonkar, Anuja; and Leveille, Jason
07542986 Cl. 707-102.
Lubbers, Clark; Elkington, Susan; Hess, Randy; Sicola, Stephen J.; McCarty, James; Korgaonkar, Anuja; and Leveille, Jason
07542987 Cl. 707-102.
Elkins, II, Robert B.: See--
Lewallen, Christopher Paul; Luther, James P.; Elkins, II, Robert B.; Nielsen, Lars K.; and Cody, Joseph
07542651 Cl. 385-136.
Ellenbogen, Michael: See--
Krug, Kristoph D.; Ellenbogen, Michael; Hurd, Paul J.; and Tortora, John O.
05642393 Cl. 378-57.
Ellersick, Steven D.: See--
Flickinger, Steven D.; Larsen, Ty A.; and Ellersick, Steven D.
07541697 Cl. 307-117.
Ellgen, David Leslie; Bond, Harlan Keith; and Miller, Steven, to Pesa Switching Systems, Inc. Apparatus and method for performing internal routing and signal processing
07542099 Cl. 348-706.
Elliot, Douglas G.: See--
Chouanard, Harvey J.; Elliot, Douglas G.; Vongseng, Soutsada; Wendland, Randall; and Dewey, James D.
07540787 Cl. 439-668.
Elliott, Bradley D.; Liu, Clifford M.; Smith, Jeffrey C.; Curtis, Juli L.; and Remm, Thomas B., to Boston Scientific Scimed, Inc. Medical suction device
07540868 Cl. 606-2.5.
Elliott, John Charles; Lucas, Gregg Steven; and Seidel, Andrew Ellis, to International Business Machines Corporation Apparatus and method to store, retrieve, and search both analog and digital data
07542974 Cl. 707-6.
Elliott, Martin R.: See--
Rice, Michael R.; Englhardt, Eric A.; Lowrance, Robert B.; Elliott, Martin R.; and Hudgens, Jeffrey C.
07540371 Cl. 198-465.4.
Elliott-Sinnock, Jan Eileen: See--
Satterfield, Markus Ray; Elliott-Sinnock, Jan Eileen; Lester, IV, James David; Atwood, Christopher Colin Puckett; and Killebrew, Stephen Ray
07542993 Cl. 707-104.1.
Ellis, Nigel R.: See--
Shukla, Amit; Luo, Chang; Yuan, Hua; Ryseff, James D.; Klein, Johannes; Fang, Lijiang; Ellis, Nigel R.; Singh, Siddhartha; and Acharya, Srinivasmurthy P.
07543003 Cl. 707-203.
Ellison, Steven W.; and Jenkins, James Patrick, to Telect Inc. Latching trough-coupling system
07542650 Cl. 385-136.
Elpida Memory, Inc.: See--
Asano, Isamu; and Lowrey, Tyler A.
07541607 Cl. 257-2.
Fujisawa, Hiroki; Nakamura, Masayuki; and Tanaka, Hitoshi
07541862 Cl. 327-539.
Hayashi, Junichi; and Noda, Hiromasa
07541839 Cl. 326-83.
Shibata, Tomoyuki; and Oishi, Kanji
07542359 Cl. 365-200.
Elston, Mark: See--
Pramanick, Ankan; Adachi, Toshiaki; and Elston, Mark
07543200 Cl. 714-724.
Elthom Enterprises Limited: See--
Gorban, Alexander
07540728 Cl. 418-61.2.
Elwell, Brian; to Cooper Technologies Company Infrared occupancy sensor
07541924 Cl. 340-565.
EMAK S.p.A.: See--
Cobb, Jr., William T
07541700 Cl. 310-50.
Emanuel, Stuart: See--
Chiu, George; Connolly, Peter J.; Emanuel, Stuart; Huang, Shenlin; Li, Shengjian; Lin, Ronghui; Lu, Yanhua; and Middleton, Steven A.
07541367 Cl. 514-303.
Embarq Holdings Company, LLC: See--
Male, Leo; Scheer, Jim; Geldbach, Erik; Younger, Keith E.; and Edmoundson, Greg
07540765 Cl. 439-498.
EMC Corporation: See--
Cormier, Richard Francis
07543019 Cl. 709-203.
Emer, Joel S.: See--
Mukherjee, Shubhendu S.; Emer, Joel S.; Reinhardt, Steven K.; Weaver, Christopher T.; and Smith, Michael J.
07543221 Cl. 714-800.
Emerson Network Power - Embedded Computing, Inc.: See--
Emhart Glass S.A.: See--
Novini, Amir R.; Diehr, Richard D.; and Sones, Richard A.
07541572 Cl. 250-223B.
Emmerson, Gregory Daniel; Gawith, Corin Barry Edmund; and Smith, Peter George Robin, to University of Southampton Optical sensors for sensing the refractive index of fluid samples
07541573 Cl. 250-227.18.
Emoto, Shigeru: See--
Watanabe, Yohichiroh; Suzuki, Masanori; Sugiyama, Tsunemi; Yamashita, Hiroshi; Saito, Takuya; Watanabe, Naohiro; Tomita, Masami; Emoto, Shigeru; Yagi, Shinichiro; Yamada, Hiroshi; Nanya, Toshiki; and Takigawa, Tadao
07541128 Cl. 430-108.4.
Empower Technologies, Inc.: See--
Leung, Paul C. P.; Ho, Kenneth Kee; and Chan, Ying-Chiu
D0593560 Cl. D14-434.
Emshey, Garry Horizontal multi-blade wind turbine
07540705 Cl. 415-4.1.
Emsky, Timothy R. Method and apparatus for therapeutic treatment of back pain
07540877 Cl. 606-242.
Enan, Essam; to Tyratech, Inc. Methods of screening compositions for potential insect control activity
07541155 Cl. 435-7.2.
Enatsu, Tomoko: See--
Yabe, Toshiyasu; Soga, Makoto; and Enatsu, Tomoko
07543028 Cl. 709-206.
Endicott Interconnect Technologies, Inc.: See--
Chan, Benson; Lin, How T.; Magnuson, Roy H.; Markovich, Voya R.; and Poliks, Mark D.
07541058 Cl. 427-163.2.
Das, Rabindra N.; Lauffer, John M.; Papathomas, Kostas I.; and Poliks, Mark D.
07541265 Cl. 438-528.
Endo, Masayuki; and Sasago, Masaru, to Panasonic Corporation Chemically amplified resist material, topcoat film material and pattern formation method using the same
07541132 Cl. 430-270.1.
Endo, Tadao: See--
Yagi, Tomoyuki; Endo, Tadao; Kameshima, Toshio; Takenaka, Katsuro; and Yokoyama, Keigo
07541595 Cl. 250-370.11.
Endo, Tadao; Kameshima, Toshio; Yagi, Tomoyuki; Takenaka, Katsuro; and Yokoyama, Keigo, to Canon Kabushiki Kaisha Radiation imaging apparatus, system and method as well as program
07541591 Cl. 250-369.
Endoscopic Technologies, Inc.: See--
Bertolero, Arthur A.; Ibrahim, Tamer; Geyster, Steve; and Williams, Mathew
07542807 Cl. 607-119.
Endou, Shuusuke: See--
Morishita, Shunsuke; and Endou, Shuusuke
07542106 Cl. 349-58.
Endress + Hauser Flowtec AG: See--
Endurance Wind Power: See--
Enefco International, Inc.: See--
Bailey, Glen Alan
07540055 Cl. 15-210.1.
Enenkel, Peter; and Zimmermann, Armin, to Siemens Aktiengesellschaft Device for filling and removing containers for sorted mail
07540385 Cl. 209-630.
EnerDel, Inc.: See--
Gorshkov, Vadim; and Volkov, Oleg
07541016 Cl. 423-598.
Energy Conservation Technologies, Inc.: See--
Eng, Betty: See--
Kimel, Janna C.; Cobbinah, Kofi; and Eng, Betty
07542379 Cl. 368-10.
Engel, Bradley N.: See--
Chung, Young Sir; Baird, Robert W.; and Engel, Bradley N.
07541804 Cl. 324-244.
Engel, Christof: See--
Rosenthal, Arndt; Berthelot, Gilles; Engel, Christof; Otto, Joachim; and Helbig, Ingo
07543280 Cl. 717-137.
Engelhaupt, Darell Eugene Optical flame detection system and method
07541938 Cl. 340-578.
Engineered Drilling Solutions Inc.: See--
Pomerleau, Daniel Guy
07541317 Cl. 507-204.
England, Paul: See--
Lampson, Butler W.; DeTreville, John D.; and England, Paul
07543336 Cl. 726-30.
England, Paul; and Willman, Bryan, to Microsoft Corporation Method and system for allowing code to be securely initialized in a computer
07543335 Cl. 726-27.
Englhardt, Eric A.: See--
Rice, Michael R.; Englhardt, Eric A.; Lowrance, Robert B.; Elliott, Martin R.; and Hudgens, Jeffrey C.
07540371 Cl. 198-465.4.
Enicks, Darwin G.; Friedrichs, Carl E.; and Brucher, Richard A., to Atmel Corporation System, apparatus and method for contaminant reduction in semiconductor device fabrication equipment components
07540298 Cl. 137-1.
Enlow, Brian Alan: See--
Thomas, Kurt Judson; Hughett, Michael Shane; Enlow, Brian Alan; and Brown, Derek Allen
D0593652 Cl. D23-303.
Enokijima, Fuminobu; Ota, Masaki; Fukanuma, Tetsuhiko; Murase, Masakazu; Koide, Tatsuya; and Kawaguchi, Masahiro, to Kabushiki Kaisha Toyota Jidoshokki Heat-insulating mechanism for compressor
07540720 Cl. 417-269.
Enright, Thomas Edward: See--
Yang, San-Ming; Enright, Thomas Edward; Magdalinis, Aurelian Valeriu; Alzamly, Ahmed Abd; Tam, Man-Chung; Jennings, Carol Ann; Kazmaier, Peter M.; Saban, Marko D.; and Hawkins, Michael Steven
07541060 Cl. 427-212.
Enschede/SDJ B.V.: See--
D'Agnolo, Carlo Antonio Giovanni
07543337 Cl. 726-30.
Entegris, Inc.: See--
Kishkovich, Oleg P.; Kinkead, Devon; Grayfer, Anatoly; Goodwin, William M.; and Ruede, David
07540901 Cl. 95-141.
Entire Technology Co., Ltd.: See--
Cheng, Wen-Feng; Lee, Chen-Sheng; and Lin, Chao-Ying
07540648 Cl. 362-607.
Entorian Technologies, LP: See--
Rapport, Russell; Cady, James W.; Wilder, James; Roper, David L.; Wehrly, Jr., James Douglas; and Buchle, Jeff
07542304 Cl. 361-776.
Wehrly, Jr., James Douglas; Wolfe, Mark; and Goodwin, Paul
07542297 Cl. 361-749.
Entropic Communications Inc.: See--
Goh, Wee Peng; Monk, Anton; and Porat, Ron
07542411 Cl. 370-208.
Gurantz, Itzhak; El Wardani, Ladd; and Landry, Michael
07542715 Cl. 455-3.01.
EPCOS AG: See--
Schmidhammer, Edgar
07541717 Cl. 310-320.
Epi-Energy, Ltd.: See--
Epistar Corporation: See--
Ying, Tse-Liang; and Chen, Shi-Ming
07541205 Cl. 438-22.
Epoch Biosciences, Inc.: See--
Lukhtanov, Eugeny A.
07541454 Cl. 536-25.32.
Eppe, Klaus-Peter: See--
Weber, Ralf; Weingärtner, Steffen; and Eppe, Klaus-Peter
07540790 Cl. 439-716.
Eppich, Anton P.; to Micron Technology, Inc. Relaxed-pitch method of aligning active area to digit line
07541632 Cl. 257-296.
Epson Imaging Devices Corporation: See--
Tanaka, Shinichiro
07542115 Cl. 349-114.
Epstein, Dennis L.; to KAI U.S.A., Ltd. Paring knife blade
D0593373 Cl. D7-649.
Epstein, Jordan; and Epstein, Monique, to Kraftware Three piece container
D0593368 Cl. D7-602.
Epstein, Mark E.; and Lewis, James R., to International Business Machines Corporation Biasing a speech recognizer based on prompt context
07542907 Cl. 704-275.
Epstein, Michael: See--
Warren, David S.; Swift, Terrance L.; Vidrevich, Tatyana; Ramakrishnan, Iv; Pokorny, L. Robert; Beggs, Alex; Rued, Christopher; Epstein, Michael; Singh, Harpreet; and Davulcu, Hasan
07542958 Cl. 706-48.
Epstein, Monique: See--
Epstein, Jordan; and Epstein, Monique
D0593368 Cl. D7-602.
Equifax, Inc.: See--
Satterfield, Markus Ray; Elliott-Sinnock, Jan Eileen; Lester, IV, James David; Atwood, Christopher Colin Puckett; and Killebrew, Stephen Ray
07542993 Cl. 707-104.1.
EraGen Biosciences, Inc.: See--
Marshall, David J.; Prudent, James R.; Sherrill, Christopher B.; Shapiro, Gideon; Jurczyk, Simona; and Ptacin, Jerod L.
07541147 Cl. 435-6.
Erckert, Ricardo: See--
Hausperger, Christian; Kindler, Edgar; Erckert, Ricardo; and Rollgen, Bernhard
07541799 Cl. 324-117H.
Erdman, Arthur G.: See--
Stackley, Mark A.; Erdman, Arthur G.; Buesseler, Ryan; and Hanubal, Shivakumar
07540043 Cl. 5-81.1C.
Erez, Adi: See--
Halahmi, Izhar; Erez, Oded; and Erez, Adi
07541084 Cl. 428-174.
Erez, Oded: See--
Halahmi, Izhar; Erez, Oded; and Erez, Adi
07541084 Cl. 428-174.
Eric Beare Associates Limited: See--
Erker, Gregory J.: See--
Barrett, Ian Gordon; Erker, Gregory J.; Smith, Michael James; Muma, Scott Arthur; Roe, Jeffrey S.; and Guay, Bernard
07543193 Cl. 714-48.
ERNI Electronics GmbH: See--
Ernst, Michael D.: See--
Awai, George K.; and Ernst, Michael D.
07540628 Cl. 362-227.
Escalera, Jose R.: See--
Bell, Jr., Robert H.; Escalera, Jose R.; Herescu, Octavian F.; Miller, Vernon W.; and Roll, Michael D.
07543109 Cl. 711-113.
Eserkaln, Paul W.: See--
Kurth, Michael J.; Eserkaln, Paul W.; Kaiser, Kurt R.; and Zerger, Terry P.
07540957 Cl. 210-232.
Kurth, Michael J.; Zerger, Terry P.; Eserkaln, Paul W.; and Steinhardt, Michael D.
07540956 Cl. 210-232.
Eshkoli, Noam; and Elbaz, Moshe, to Polycom, Inc. Method and system for controlling multimedia video communication
07542068 Cl. 348-14.08.
Esparza, Jose Oscar; and Zabaras, George John, to Shell Oil Company Separator for multi-phase slug flow and method of designing same
07540902 Cl. 95-243.
Espinoza, Rafael L.: See--
Rangarajan, Priya; McDonald, Steven R.; Allison, Joe D.; Lawson, Keith H.; Odueyungbo, Oluwaseyi A.; Jack, Doug S.; and Espinoza, Rafael L.
07541504 Cl. 585-304.
Espinoza, Rafael L.; Jothimurugesan, Kandaswamy; Coy, Kevin L.; Ortego, Jr., James Dale; Srinivasan, Nithya; and Ionkina, Olga P., to ConocoPhillips Company Silica-alumina catalyst support, catalysts made therefrom and methods of making and using same
07541310 Cl. 502-326.
Esser, Gregor: See--
Welk, Andrea; Haimerl, Walter; Esser, Gregor; Baumbach, Peter; Altheimer, Helmut; and Wehner, Edda
07540611 Cl. 351-177.
Essilor International (Compagnie Generale d'Optique): See--
Carimalo, Céline; and Deldalle, Bénédicte
07540610 Cl. 351-175.
Estes, Andrew C.; Stobaugh, Kyle A.; Moody, Mark A.; Estes, Jeremy B.; Balaster, Ray W.; and Danzy, Kurt R., to Cooling & Applied Technology, Inc. Vacuum transfer apparatus having load isolation weighing system including a rigid pipe section pivotally mounted to a support frame
07541549 Cl. 177-116.
Estes, Jeremy B.: See--
Estes, Andrew C.; Stobaugh, Kyle A.; Moody, Mark A.; Estes, Jeremy B.; Balaster, Ray W.; and Danzy, Kurt R.
07541549 Cl. 177-116.
Estrada, Andrew Xavier; to QUALCOMM Incorporated Apparatus and method for implementing a low complexity digital modulator
07542520 Cl. 375-303.
ETA SA Manufacture Horlogère Suisse: See--
Cabezas Jurin, Andrés; and Conus, Thierry
07540654 Cl. 368-127.
Ethen, Donald J.: See--
Malnati, James R.; Midboe, Tyson R.; Trierweiler, John E.; and Ethen, Donald J.
07543027 Cl. 709-206.
Eto, Tomohiro: See--
Shundo, Ryushi; and Eto, Tomohiro
07541071 Cl. 428-1.1.
Etter, Walter; to Alcatel-Lucent USA Inc. Method and apparatus for adjusting the level of a speech signal in its encoded format
07542899 Cl. 704-225.
Eubank, Robert Decorative stand for a shot glass in the shape of a crocodile head
D0593366 Cl. D7-516.
Eun, Dong-Seog; and Chang, Sung-Nam, to Samsung Electronics Co., Ltd. Methods of forming integrated circuit devices having gate electrodes formed on non-uniformly thick gate insulating layers
07541243 Cl. 438-264.
Eun, Sung-Ho; Oh, Jae-Hee; Park, Jae-Hyun; Kim, Jung-In; Ko, Seung-Pil; and Oh, Yong-Tae, to Samsung Electronics Co., Ltd. Methods of fabricating a semiconductor device including a self-aligned cell diode
07541252 Cl. 438-381.
European Copper, LLC: See--
Arnold, Jr., John G.
D0593671 Cl. D23-374.
Evanchik, Stephen A .; and Weitzman, Louis M., to International Business Machines Corporation Multistage virtual memory paging system
07543123 Cl. 711-159.
Evans, Conor: See--
Murugkar, Sangeeta; Anis, Hanan; Xie, Xiaoliang Sunney; and Evans, Conor
07542137 Cl. 356-301.
Evans, Donald L. Container with lid and internal dividers
D0593325 Cl. D3-313.
Everlight USA, Inc.: See--
Lai, Bao-Kun; Hsu, Cheng-Hsiang; Tseng, Ya-Chi; and Huang, Huei-Chin
07540883 Cl. 8-641.
EverSpin Technologies, Inc.: See--
Chung, Young Sir; Baird, Robert W.; and Engel, Bradley N.
07541804 Cl. 324-244.
Nahas, Joseph J.; Andre, Thomas W.; and Subramanian, Chitra K.
07543211 Cl. 714-752.
Evoinvent AG: See--
Evonik Stockhausen GmbH: See--
Reimann, Armin; Van Stiphoudt, Manfred; and Vorholt, Herbert
07541395 Cl. 523-346.
Exar Corporation: See--
Kernahan, Kent; Thomas, John Carl; and Lambert, Craig Norman
07543163 Cl. 713-300.
Excellatron Solid State, LLC: See--
Zhang, Ji-Guang; Johnson, Lonnie G.; and Buckingham, Steve
07540886 Cl. 29-623.3.
ExxonMobil Chemical Patents Inc.: See--
Abhari, Ramin; Sims, Charles Lewis; Brant, Patrick; and Jiang, Peijun
07541402 Cl. 524-272.
Crowther, Donna J.; and Perez, Celestino M.
07541413 Cl. 526-171.
Dakka, Jihad Mohammed; Goris, Hans K. T.; Mathys, Georges M. K.; Eijkhoudt, Roger; Puttemans, Marc P. H.; and Brown, Stephen Harold
07541507 Cl. 585-533.
ExxonMobil Upstream Research Company: See--
Fielding, Brian J.; and Lu, Xinyou
07541996 Cl. 343-719.
Yung, Tin-Woo; Slocum, Scott T.; Sandstrom, Robert E.; Ding, Zhong; and Smitt, Leif
07540200 Cl. 73-807.
ExxonMobile Chemical Patents Inc.: See--
Vaughn, Stephen N.; Chang, Yun-feng; Martens, Luc R. M.; Clem, Kenneth R.; Mertens, Machteld M.; and Schweizer, Albert E.
07541508 Cl. 585-640.
Eyer, Mark Kenneth: See--
Stone, Glen David; Smyers, Scott David; Faiman, Bruce Alan; and Eyer, Mark Kenneth
07542474 Cl. 370-401.
Ezuka, Toshiharu: See--
Ogasawara, Masakazu; and Ezuka, Toshiharu
07542397 Cl. 369-112.02.
Ezumi, Yosuke; Nohata, Yukio; Takahashi, Atsushi; Nakao, Muneki; and Kogure, Shinya, to Canon Kabushiki Kaisha Communication terminal and method for controlling the same
07542066 Cl. 348-14.01.