US 7,543,253 B2
Method and apparatus for compensating for temperature drift in semiconductor processes and circuitry
Stefan Marinca, Dooradoyle (Ireland); and Thomas G. O'Dwyer, Clonlara (Ireland)
Assigned to Analog Devices, Inc., Norwood, Mass. (US)
Filed on Oct. 07, 2003, as Appl. No. 10/680,265.
Prior Publication US 2005/0073290 A1, Apr. 07, 2005
Int. Cl. G06F 17/50 (2006.01); H03K 17/78 (2006.01); G05F 3/20 (2006.01)
U.S. Cl. 716—3  [716/1; 716/4; 327/512; 327/540; 323/313; 323/315] 23 Claims
OG exemplary drawing
 
1. A method for compensating for temperature effects during operation of a semiconductor circuit comprising:
scaling an output value of said circuit to a desired output value at a first temperature; and
altering the temperature of the circuit from the first temperature to a second temperature and correcting said output value at the second temperature to match said desired output value, such that the correction which is to provide said desired output value at the second temperature does not change the output value at the first temperature, matching being effected by the addition or subtraction of the difference between two balanced trimming PTAT and CTAT currents.