US 7,542,856 B2
Structure monitor system
Kinzo Kishida, Kobe (Japan); Motohiro Nakano, Kobe (Japan); and Yoshiaki Yamauchi, Kobe (Japan)
Assigned to Neubrex Co., Ltd., (Japan)
Appl. No. 10/562,922
PCT Filed Jul. 02, 2003, PCT No. PCT/JP03/08395
§ 371(c)(1), (2), (4) Date Dec. 29, 2005,
PCT Pub. No. WO2005/003689, PCT Pub. Date Jan. 13, 2005.
Prior Publication US 2008/0177482 A1, Jul. 24, 2008
Int. Cl. G01B 5/30 (2006.01)
U.S. Cl. 702—35  [702/36] 24 Claims
OG exemplary drawing
 
1. A structure monitor system for analyzing a physical quantity at a specified point of a structure, in which the physical quantity at one point on a boundary or inside of the structure is expressed by a governing equation, by a numerical analysis method by setting a specific boundary condition, and monitoring the structure based on the analysis result, comprising:
a measuring means for, using an optical fiber sensor laid on the boundary of the structure, measuring physical quantities of the structure at points on the boundary of the structure where the optical fiber sensor is laid,
a setting and inputting means for inputting data to make a modeling for the structure;
a numerically analyzing means for calculating the physical quantity at the specified point of the structure by the numerical analysis method using the measured physical quantities by the measuring means as the boundary condition, the numerically analyzing means receiving inputted data to make a modeling, and remake a new modeling based on a result of the calculation of the physical quantity; and
a display means for displaying information on the analyzed physical quantity by the numerical analyzing means in relation to the position of the structure.