| US 7,542,248 B2 | ||
| Magnetoresistance effect element, magnetic head and magnetic recording and/or reproducing system | ||
| Yuuzo Kamiguchi, Yokohama (Japan); Hiromi Yuasa, Yokohama (Japan); Tomohiko Nagata, Yokohama (Japan); and Hiroaki Yoda, Kawasaki (Japan) | ||
| Assigned to Kabushiki Kaisha Toshiba, Tokyo (Japan) | ||
| Filed on Nov. 23, 2007, as Appl. No. 11/984,865. | ||
| Application 11/984865 is a continuation of application No. 10/970278, filed on Oct. 22, 2004, granted, now 7,359,162. | ||
| Application 10/970278 is a continuation of application No. 09/947355, filed on Sep. 07, 2001, abandoned. | ||
| Claims priority of application No. 2000-275417 (JP), filed on Sep. 11, 2000. | ||
| Prior Publication US 2008/0088981 A1, Apr. 17, 2008 | ||
| Int. Cl. G11B 5/39 (2006.01) | ||
| U.S. Cl. 360—324.11 [360/324.12; 338/32 R] | 6 Claims |

| 1. A magnetoresistance effect element comprising:
a magnetization fixed layer in which a direction of magnetization is substantially fixed to one direction, the magnetization
fixed layer having a first stacked body including first and second ferromagnetic films, the first and second ferromagnetic
films in the first stacked body being ferromagnetically coupled to each other in the first stacked body;
a magnetization free layer in which a direction of magnetization varies in response to an external magnetic field, the magnetization
free layer having a second stacked body including third and fourth ferromagnetic films, the third and fourth ferromagnetic
films in the second stacked body being ferromagnetically coupled to each other in the second stacked body;
a non-magnetic intermediate layer provided between the magnetization fixed layer and the magnetization free layer;
a high conductive layer provided on a surface of the magnetization free layer opposite from the non-magnetic intermediate
layer, the high conductive layer having a higher conductivity than those of the magnetization fixed layer and the magnetization
free layer;
a resistance of the magnetoresistance effect element varying in accordance with a relative angle between the direction of
magnetization of the magnetization fixed layer and the direction of magnetization of the magnetization free layer; and
a sense current flowing to the magnetization fixed layer, the non-magnetic intermediate layer and the magnetization free layer
in a direction substantially perpendicular to surfaces of those layers.
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