| US 7,541,818 B2 | ||
| Method and apparatus of electromagnetic measurement | ||
| Hirofumi Kosaka, Ishikawa (Japan); Kazuhiko Ikeda, Ishikawa (Japan); Shoichi Kajiwara, Osaka (Japan); Hiroyuki Tani, Osaka (Japan); Yoichiro Ueda, Osaka (Japan); and Atsushi Yamamoto, Kyoto (Japan) | ||
| Assigned to Panasonic Corporation, Osaka (Japan) | ||
| Filed on Jul. 07, 2006, as Appl. No. 11/482,063. | ||
| Claims priority of application No. 2005-198441 (JP), filed on Jul. 07, 2005; and application No. 2005-358366 (JP), filed on Dec. 13, 2005. | ||
| Prior Publication US 2007/0024293 A1, Feb. 01, 2007 | ||
| Int. Cl. G01R 31/302 (2006.01) | ||
| U.S. Cl. 324—750 | 7 Claims |
| 1. A method of electromagnetic measurement, comprising:
directing an electromagnetic field sensor having directivity, such that a received band is widened in accordance with a measurement
distance toward a device under test; and
receiving an electromagnetic wave from the device under test while shifting the received band in sequence to thereby detect
electromagnetic interference,
wherein a plurality of long and short measurement distances between the device under test and the electromagnetic field sensor
are set,
measurement at the long measurement distance is performed a plurality of times, and
measurement at the short measurement distance is performed only on a received band where electromagnetic interference is detected
by the measurement at the long measurement distance.
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