| US 7,541,815 B2 | ||
| Electronic device, testing apparatus, and testing method | ||
| Kiyotaka Ichiyama, Tokyo (Japan); Masahiro Ishida, Tokyo (Japan); and Takahiro Yamaguchi, Tokyo (Japan) | ||
| Assigned to Advantest Corporation, Tokyo (Japan) | ||
| Filed on Mar. 10, 2006, as Appl. No. 11/371,939. | ||
| Prior Publication US 2007/0210802 A1, Sep. 13, 2007 | ||
| Int. Cl. G01R 31/02 (2006.01) | ||
| U.S. Cl. 324—537 [324/763; 324/765; 714/733; 714/734; 257/48; 329/327] | 12 Claims |
| 1. A BIST (Built-In-Self-Test) electronic device, comprising:
an operation circuit for outputting an output signal to be tested or evaluated;
a demodulator having externally controllable gain, operative to receive said output signal from said operation circuit and
output a demodulation signal representing a demodulated phase-modulated or frequency-modulated component of said output signal,
wherein the operations circuit further comprises an output section for externally outputting an output signal when the said
electronic device is actually operated, and externally outputting said demodulation signal when said electronic device is
tested; and,
the electronic device further comprises a package section for containing said operation circuit, said demodulator and said
output section therein, wherein said electronic device outputs said output signal and said demodulation signal from said package
section.
|