| US 7,540,885 B2 | ||
| Method of processing a ceramic capacitor | ||
| Gaku Kamitani, Kyoto (Japan) | ||
| Assigned to Murata Manufacturing Co., Ltd., Nagaokakyo-Shi, Kyoto-Fu (Japan) | ||
| Filed on Aug. 15, 2002, as Appl. No. 10/218,395. | ||
| Claims priority of application No. 2001-251424 (JP), filed on Aug. 22, 2001; and application No. 2002-219434 (JP), filed on Jul. 29, 2002. | ||
| Prior Publication US 2003/0061694 A1, Apr. 03, 2003 | ||
| Int. Cl. H01G 9/00 (2006.01) | ||
| U.S. Cl. 29—25.03 [29/25.41; 29/593; 324/548; 361/321.1] | 5 Claims |
| 1. A method of processing a ceramic capacitor, in which electric charge remaining in an internal electrode thereof is reduced
after applying a first DC voltage to the ceramic capacitor, the method comprising the steps of:
performing screening tests on the ceramic capacitor by applying the first DC voltage;
discharging charges stored in the ceramic capacitor after said screening tests; and
after the discharging step, neutralizing electrostatic absorption charge in the ceramic capacitor by applying a voltage that
generates a polarity opposite to a polarity generated in the ceramic capacitor when the first DC voltage is applied,
wherein an amount of the electrostatic absorption charge in the ceramic capacitor is monitored while the voltage that generates
a polarity opposite to the first DC voltage is applied and the voltage is adjusted based on the amount of the electrostatic
absorption charge measured, such that the ceramic capacitor is neutralizing after the voltage is applied.
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