| US 7,539,599 B2 | ||
| Abnormality diagnosing method, condition appraisal apparatus, image forming apparatus, management apparatus and management system | ||
| Kunio Hasegawa, Tokyo (Japan); Yasuhiko Saka, Kanagawa (Japan); Kohsuke Tsunashima, Chiba (Japan); Mitsuo Hasebe, Tokyo (Japan); and Shigeru Mita, Saitama (Japan) | ||
| Assigned to Ricoh Company, Ltd., Tokyo (Japan) | ||
| Filed on Feb. 11, 2005, as Appl. No. 11/55,773. | ||
| Claims priority of application No. 2004-035817 (JP), filed on Feb. 12, 2004. | ||
| Prior Publication US 2005/0193027 A1, Sep. 01, 2005 | ||
| Int. Cl. G06F 15/00 (2006.01); G06F 11/30 (2006.01) | ||
| U.S. Cl. 702—185 [702/110; 702/111; 702/188; 700/9; 700/10] | 34 Claims |
| 1. An abnormality diagnosing method comprising:
acquiring in advance a plurality of sets of data of a plurality of types of information related to a condition of an electronic
device;
determining an index value calculation equation for calculating an index value employed for a condition appraisal of the electronic
device based on a reference data group made up of said plurality of sets of data;
acquiring said data of a plurality of types of information about the electronic device that serves as the subject for condition
appraisal;
calculating an index value based on said index value calculation equation and said data of a plurality of types of information
acquired about said electronic device that serves as the subject for condition appraisal; and
appraising the condition of said electronic device that serves as the subject for condition appraisal and diagnosing the occurrence
of abnormality in said electronic devices based on a result of a comparison result of said index value and a reference value
established in advance,
wherein acquisition of the plurality of sets of data that make up said reference data group is performed for a plurality of
electronic devices of the same type as said electronic device that serves as the subject for condition appraisal during operation
tests following the manufacture of said plurality of electronic devices,
and the reference data group containing all of said plurality of sets of data acquired during the operation tests conducted
on said plurality of electronic devices is employed as an initial reference data group for determining said index value calculation
equation.
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