| US 7,538,707 B2 | ||
| Digital-to-analog converting circuit and digital-to-analog converting method | ||
| Satoshi Sakurai, Kanagawa (Japan); and Asami Saito, Hyogo (Japan) | ||
| Assigned to Kabushiki Kaisha Toshiba, Tokyo (Japan) | ||
| Filed on Sep. 26, 2007, as Appl. No. 11/861,547. | ||
| Claims priority of application No. 2006-268816 (JP), filed on Sep. 29, 2006. | ||
| Prior Publication US 2008/0079619 A1, Apr. 03, 2008 | ||
| Int. Cl. H03M 1/66 (2006.01) | ||
| U.S. Cl. 341—144 [341/153] | 5 Claims |

| 1. A digital-to-analog converting circuit comprising:
m×N (m is an integer equal to or more than two and N is an integer equal to or more than two) or more number of digital-to-analog
converting elements converting an input digital code of N+1 values to an analog code in one of three states of H level, L
level, and non-selection to output;
a first selecting section selecting digital-to-analog converting elements that output r (r is an integer equal to or smaller
than N) number of H levels for a thermometer digital code expressing the input digital code with the number of H levels and
L levels; and
a second selecting section selecting the digital-to-analog converting elements that output N−r number of L levels,
wherein selecting of the digital-to-analog converting element is controlled so that the same digital-to-analog converting
element does not continuously output the same analog code as the first and second selecting sections cause the digital-to-analog
converting elements selected respectively at the first digital-to-analog converting timing and at the second digital-to-analog
converting timing to circulate in an inverse direction to each other.
|