US 7,538,520 B2
Method and apparatus for quantifying quiescent period temperature effects upon an electric energy storage device
Andrew M. Zettel, Ann Arbor, Mich. (US); and Anthony H. Heap, Ann Arbor, Mich. (US)
Assigned to GM Global Technology Operations, Inc., Detroit, Mich. (US)
Filed on Jun. 07, 2006, as Appl. No. 11/422,610.
Prior Publication US 2007/0285063 A1, Dec. 13, 2007
Int. Cl. H02J 7/04 (2006.01); H02J 7/16 (2006.01)
U.S. Cl. 320—150  [320/153; 700/299; 324/431] 16 Claims
OG exemplary drawing
 
1. Method for quantifying an effect of temperature during a quiescent period of an electrical energy storage device operation upon the electrical energy storage device, comprising:
determining a weighted average temperature of the electrical energy storage device during the quiescent period based upon an average temperature of the electrical energy storage device during the quiescent period and a temperature of the electrical energy storage device substantially contemporaneous with the start of the quiescent period; and,
determining a resting temperature factor for the electrical energy storage device based upon the weighted average temperature of the device during the quiescent period.