| US 7,538,403 B2 | ||
| PIN diode structure with zinc diffusion region | ||
| Xiang Gao, Edison, N.J. (US); Alex Ceruzzi, Princton Junction, N.J. (US); Linlin Liu, Hillsborough, N.J. (US); and Stephen Schwed, Bridgewater, N.J. (US) | ||
| Assigned to Emcore Corporation, Albuquerque, N. Mex. (US) | ||
| Filed on Sep. 19, 2005, as Appl. No. 11/230,959. | ||
| Claims priority of provisional application 60/611152, filed on Sep. 20, 2004. | ||
| Prior Publication US 2006/0060933 A1, Mar. 23, 2006 | ||
| Int. Cl. H01L 27/15 (2006.01) | ||
| U.S. Cl. 257—431 [257/438; 257/461; 257/463; 257/E31.001] | 9 Claims |

| 1. A PIN photodiode comprising:
a substrate;
a first type electrode layer on the substrate;
a first layer comprising a first region of intrinsic material over a portion of the first-type electrode layer;
a first type window layer over said first layer;
an island shaped region comprising a first portion of intrinsic material over said window layer;
a dielectric layer over at least a peripheral portion of said island shaped region wherein the island shaped region has an
opening; and
a diffused dopant beneath an area of the opening to form a PN junction that extends into said first layer.
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