US 7,538,043 B2
Phase change memory device and fabrication method thereof
Chien-Min Lee, Kaohsiung (Taiwan)
Assigned to Industrial Technology Research Institute, Hsinchu (Taiwan); Powerchip Semiconductor Corp., Hsin-Chu (Taiwan); Nanya Technology Corporation, Taoyuan (Taiwan); ProMOS Technologies Inc., Hsinchu (Taiwan); and Winbond Electronics Corp., Hsinchu (Taiwan)
Filed on Dec. 22, 2006, as Appl. No. 11/615,909.
Claims priority of application No. 95122930 A (TW), filed on Jun. 26, 2006.
Prior Publication US 2007/0295949 A1, Dec. 27, 2007
Int. Cl. H01L 21/31 (2006.01)
U.S. Cl. 438—758 9 Claims
OG exemplary drawing
 
1. A method for forming a phase change memory device, comprising:
providing a substrate, comprising a transistor with a source or a drain formed therein;
forming a bottom dielectric layer with vias therein overlying the substrate, the vias electrically connecting the source or the drain of the transistor;
forming a first dielectric layer with a strip-shaped lower electrode therein overlying the bottom dielectric layer and vias, comprising the steps of:
forming a metal layer on the bottom dielectric layer and the vias;
patterning the metal layer to form the strip-shaped lower electrode;
depositing a first dielectric layer on the strip-shaped lower electrode and the bottom dielectric layer; and
polishing a first dielectric layer, exposing the strip-shaped lower electrode;
forming a second dielectric layer with a phase change layer therein overlying the first dielectric layer and the strip-shaped lower electrode, the phase change layer crossing and contacting the strip-shaped lower electrode at a cross region and the phase change layer is a strip-shaped; and
forming a top electrode, electrically connecting the phase change layer,
wherein the step of patterning the metal layer to form the strip-shaped lower electrode comprises:
forming a patterned photoresist layer on the metal layer, wherein the patterned photoresist layer is strip-shaped;
trimming the patterned photoresist layer to reduce width of the patterned photoresist layer; and
etching the metal layer using the trimmed patterned photoresist layer as a mask to form the strip-shaped lower electrode.