| US 7,530,749 B2 | ||
| Coater/developer and coating/developing method | ||
| Taro Yamamoto, Koshi-Machi (Japan); and Osamu Hirakawa, Koshi-Machi (Japan) | ||
| Assigned to Tokyo Electron Limited, Tokyo-To (Japan) | ||
| Appl. No. 10/581,713 PCT Filed Dec. 03, 2004, PCT No. PCT/JP2004/018061 § 371(c)(1), (2), (4) Date Jun. 05, 2006, PCT Pub. No. WO2005/067011, PCT Pub. Date Jul. 21, 2005. |
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| Claims priority of application No. 2004-002324 (JP), filed on Jan. 07, 2004. | ||
| Prior Publication US 2007/0122551 A1, May 31, 2007 | ||
| Int. Cl. G03D 5/00 (2006.01); G03B 27/52 (2006.01); G03B 27/32 (2006.01) | ||
| U.S. Cl. 396—611 [396/578; 355/27; 355/30] | 6 Claims |

| 1. A coating and developing system comprising:
a carrier station for loading a carrier containing a plurality of substrates from outside of the carrier station, and for
unloading developed substrates that are contained in the carrier to the outside;
a processing block including a coating unit and a development unit, the coating unit for coating a surface of a substrate
with a resist fi1m, the developing unit for processing the coated substrate by an immersion exposure process that forms a liquid film on the
surface of the resist film for immersion exposure;
an interface block including a substrate transfer part, an inspection unit, a control unit, and a drying unit, the interface
block disposed adjacent to the processing block and connected to an exposure system for performing an immersion exposure process
to a substrate, wherein
the substrate transfer part receives the coated substrate from the processing block, sends the coated substrate to the exposure
system, receives the exposed substrate from the exposure system, and sends the exposed substrate to the processing block,
the inspection unit includes a substrate support device for supporting the exposed substrate and a liquid detector for detecting
at least a liquid used for forming the liquid film and adhering to the surface of the substrate supported by the substrate
support device,
the control unit determines whether or not the substrate needs to be processed by a drying process on the basis of a result
of detection made by the liquid detector of the inspection unit, and
the drying unit dries the substrate if the control unit decides that the substrate needs to be processed by a drying process.
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