| US 7,526,873 B2 | ||
| Use of surface measurement probes | ||
| Kevyn Barry Jonas, Bristol (United Kingdom); and Geoffrey McFarland, Dursley (United Kingdom) | ||
| Assigned to Renishaw PLC, Gloucestershire (United Kingdom) | ||
| Appl. No. 11/658,162 PCT Filed Aug. 05, 2005, PCT No. PCT/GB2005/003095 § 371(c)(1), (2), (4) Date Jan. 23, 2007, PCT Pub. No. WO2006/013387, PCT Pub. Date Feb. 09, 2006. |
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| Claims priority of application No. 0417536.0 (GB), filed on Aug. 06, 2004. | ||
| Prior Publication US 2008/0028626 A1, Feb. 07, 2008 | ||
| Int. Cl. G01B 5/008 (2006.01) | ||
| U.S. Cl. 33—561 [702/95] | 27 Claims |
| 1. A method of measuring an artefact using a machine on which a measuring probe is mounted for relative movement with respect
to the artefact, said machine having at least one measuring device for providing an output indicative of the relative position
of the probe, the probe having at least one measuring device to provide one or more probe outputs which in combination with
the machine output are indicative of the position of a point on the surface of the artefact, the method having the following
steps in any suitable order:
(a) determining the approximate position of one or more points on the surface of the artefact;
(b) using the approximate position determined in step (a) to drive at least one of the probe and artefact to one or more desired
relative positions of the probe and the surface and taking one or more surface measurements of said one or more points on
the surface of the artefact at said position, wherein there is no relative movement between the probe and the artefact whilst
the one or more surface measurements are taken; and
(c) using data from step (b) to determine a position of the one or more points on the surface in which dynamic error is substantially
reduced.
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