LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 28th DAY OF April, 2009
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

n&k Technology, Inc.: See--
Chen, Shuqiang; and Li, Guoguang 07525672 Cl. 356-625.
Na, Yoo Sam: See--
Hwang, Hyeon Seok; Na, Yoo Sam; Kim, Moon Sun; Jo, Byeong Hak; and Park, Kyoung Seok 07525395 Cl. 333-81R.
Naam, Ramez; and Weare, Christopher B., to Microsoft Corporation System and method for generating attribute-based selectable search extension 07526476 Cl. 707-5.
Nabok, Alexandr Andreevich; to Zakharov, Alexandr Sergeevich Device for shredding wornout tires 07523877 Cl. 241-1.
Naddaka, Vladimir; Davidi, Guy; Saeed, Shady; Arad, Oded; and Kaspi, Joseph, to Chemagis Ltd. Highly pure cilostazol and an improved process for obtaining same 07524960 Cl. 546-158.
Nadeau, Larry: See--
Bue, Brian Lo; Shively, II, Darrell Myers; and Nadeau, Larry 07526533 Cl. 709-220.
Nadeau, Thomas D.; and Koushik, A. S. Kiran, to Cisco Technology, Inc. Method and apparatus for controlled access of requests from virtual private network devices to managed information objects using simple network management protocol and multi-topology routing 07526480 Cl. 707-9.
Nadzan, Alex Michael: See--
Arrhenius, Thomas; Chen, Mi; Chang, Jie Fei; Huang, Yujin; Nadzan, Alex Michael; Penuliar, Richard Julius; Wallace, David Mark; Zhang, Lin; Lopaschuk, Gary D.; and Dyck, Jason R. 07524969 Cl. 548-190.
Nagai, Shintaro: See--
Sato, Masaaki; Nagai, Shintaro; Oi, Hideaki; and Yokomitsu, Sumio 07525927 Cl. 370-254.
Nagai, Takeshi; and Haga, Ryo, to Kabushiki Kaisha Toshiba Semiconductor integrated circuit 07525871 Cl. 365-240.
Nagai, Tomohiro; to Murata Manufacturing Co., Ltd. Radar apparatus 07525479 Cl. 342-158.
Nagano, Hajime; Mizushima, Ichiro; and Miyano, Kiyotaka, to Kabushiki Kaisha Toshiba Semiconductor substrate, manufacturing method therefor, and semiconductor device 07525154 Cl. 257-347.
Nagano, Shingo; to Mitsubishi Electric Corporation Liquid crystal display and method for manufacturing the same 07525626 Cl. 349-141.
Nagano, Susumu: See--
Okamoto, Tetsushi; Tsuchiya, Hiroyoshi; Sawa, Fumio; Iwata, Noriyuki; Koyama, Mitsuhiko; Suzuki, Yukio; Suzuki, Akihiko; Ootaka, Tooru; Ishii, Shigehito; and Nagano, Susumu 07524557 Cl. 428-323.
Nagano, Takahiro: See--
Kondo, Tetsujiro; Ishibashi, Junichi; Sawao, Takashi; Wada, Seiji; Miyake, Tohru; Nagano, Takahiro; and Fujiwara, Naoki 07525574 Cl. 348-208.4.
Nagano, Tetsuo: See--
Nagano, Tetsuo; Urano, Yasuteru; Kenmoku, Suguru; and Kanda, Kohjiro 07524974 Cl. 549-224.
Takakura, Hideo; Urano, Yasuteru; and Nagano, Tetsuo 07524876 Cl. 514-367.
Nagano, Tetsuo; Urano, Yasuteru; Kenmoku, Suguru; and Kanda, Kohjiro, to Nagano, Tetsuo Fluorescent probe 07524974 Cl. 549-224.
Nagaoka, Nobuharu; Watanabe, Masahito; and Hattori, Hiroshi, to Honda Motor Co., Ltd. Vehicle surroundings monitoring apparatus 07526104 Cl. 382-104.
Nagarajan, Radhakrishnan L.: See--
Welch, David F.; Kish, Jr., Fred A.; Nagarajan, Radhakrishnan L.; Nilsson, Alan C.; and Taylor, Robert B. 07526150 Cl. 385-14.
Nagasaka, Akio: See--
Miura, Naoto; Nagasaka, Akio; and Miyatake, Takafumi 07526111 Cl. 382-126.
Nagasawa, Kazuo; Hashimoto, Yuichi; and Kato, Yuko, to Teijin Pharma Limited Vitamin D3 lactam derivative 07524980 Cl. 552-653.
Nagase, Kenji: See--
Yoshikawa, Kazutaka; Nagase, Kenji; Minami, Toshiaki; and Tomita, Hiroshi 07525451 Cl. 340-995.13.
Nagashima, James M.: See--
Patel, Nitinkumar R.; Bae, Bon-Ho; and Nagashima, James M. 07525269 Cl. 318-432.
Nagashima, Tatsuo; Sugimoto, Naoki; Ohara, Seiki; and Hasegawa, Tomoharu, to Asahi Glass Company, Limited Non-lead optical glass and optical fiber 07524781 Cl. 501-50.
Nagata, Satoru: See--
Kaneda, Hideyuki; Miyamae, Yoshitaka; and Nagata, Satoru 07524804 Cl. 510-311.
Nagata, Seiji: See--
Kamijoh, Kohichi; Nagata, Seiji; and Taniguchi, Masaaki 07526099 Cl. 382-100.
Nagata, Yoshihiro; and Konno, Toshio, to Toyo Technology Inc. Wave activated power generation device and wave activated power generation plant 07525213 Cl. 290-53.
Nagatomi, Akira: See--
Sakane, Kenji; and Nagatomi, Akira 07524437 Cl. 252-301.4F.
Nagatomi, Kenji; and Kajiyama, Seiji, to Sanyo Electric Co., Ltd. Optical pickup device 07525897 Cl. 369-112.01.
Nagle, Pierce Joseph: See--
McGrath, Finbarr Joseph; and Nagle, Pierce Joseph 07526260 Cl. 455-127.2.
Nair, Venugopal K.; Baigent, Susan Jean; and Currie, Richard John William, to Wyeth Assay methods for detection of a virus in an avian tissue sample 07524651 Cl. 435-91.2.
Naito, Ryoji: See--
Barry, Keith; Ebbeling, Daniel; Kubota, Eugene; McCray, Dennis; Naito, Ryoji; and Sanchez, Mario 07523898 Cl. 248-71.
Najemy, Daniel D.: See--
Carreras, Ricardo F.; Gomes-Casseres, Glenn; Hertzberg, Marc; Najemy, Daniel D.; and Wakeland, Ray 07525440 Cl. 340-573.1.
Nakaaki, Hajime: See--
Shinsho, Masami; and Nakaaki, Hajime 07523800 Cl. 180-219.
Nakabe, Futoshi: See--
Ebara, Hiromi; Kawano, Shinji; and Nakabe, Futoshi 07526625 Cl. 711-163.
Nakadai, Kazuhiro; Okuno, Hiroshi; and Kitano, Hiroaki, to Honda Motor Co., Ltd. Robotics visual and auditory system 07526361 Cl. 700-245.
Nakafuji, Atsushi: See--
Takagaki, Hiromitsu; Fujita, Takashi; Nakafuji, Atsushi; Tamura, Hirohmi; Kunii, Hiroyuki; and Ue, Kohji 07526242 Cl. 399-307.
Nakagaki, Johji; Asahara, Akihiro; Kimura, Hideo; Kitahara, Hiroaki; Nishiwaki, Tatsuya; Shiota, Yasuhiko; and Yamada, Takeshi, to International Business Machines Corporation Apparatus and method for forming an alignment layer 07525107 Cl. 250-492.21.
Nakagawa, Kaku: See--
Mae, Tatsumasa; Tsukagawa, Misuzu; Kitahara, Mikio; Nakagawa, Kaku; Kitamura, Shiro; Ueda, Yasuyoshi; Kuroda, Minpei; Mimaki, Yoshihiro; and Sashida, Yutaka 07524975 Cl. 549-405.
Nakagawa, Toshiyuki; Shimpuku, Yoshihide; and Narahara, Tatsuya, to Sony Corporation Sync signal insertion that breaks a maximum bit-run and has a particular detection distance between two or more sync patterns 07526032 Cl. 375-253.
Nakagawa, Yasutada: See--
Igarashi, Kenji; Shimizu, Masaharu; Wakabayashi, Akiji; Saito, Yasuo; Iso, Machiko; Kishi, Tsuguo; Sakuta, Shigeru; Kitamura, Masaru; Doji, Ryuhachiro; Ide, Hideki; Nambu, Shuya; Yamazaki, Masahiko; Yamada, Katsuya; and Nakagawa, Yasutada 07526070 Cl. 378-149.
Nakagawa, Yoshihito: See--
Ozaki, Satoru; Homma, Hisao; Urabe, Kiichiro; Nakagawa, Yoshihito; and Tamura, Keishi 07526618 Cl. 711-154.
Nakagawa, Yoshinori: See--
Yamada, Masaaki; Horike, Masanori; Miyaguchi, Yohichiroh; Kondoh, Nobuaki; and Nakagawa, Yoshinori 07526238 Cl. 399-279.
Nakagawara, Minoru; to NEC Medical Systems, Ltd. Cuff-block for finger arterial blood pressure monitor 07524291 Cl. 600-499.
Nakagiri, Koji: See--
Mori, Yasuo; Nakagiri, Koji; and Nishikawa, Satoshi 07525682 Cl. 358-1.18.
Nakahara, Naoto; to Hoya Corporation Focus detection method and focus detection apparatus 07526192 Cl. 396-104.
Nakahara, Yuji: See--
Ugai, Yoshikazu; Iwami, Taizo; and Nakahara, Yuji 07524453 Cl. 419-38.
Nakajima, Jun; and Bodas, Devadatta V., to Intel Corporation Performance state-based thread management 07526661 Cl. 713-320.
Nakajima, Mamoru; Yamamoto, Masataka; Saitou, Naoki; and Taguchi, Katsunori, to Honda Giken Kogyo Kabushiki Kaisha Parts list system used for part number management and method for preparing the same 07526441 Cl. 705-29.
Nakajima, Tomohiro; Kojima, Akira; Yamashiro, Ikuko; Suzuki, Seizo; Amada, Taku; Hayashi, Yoshinori; and Shimada, Kazuyuki, to Ricoh Company, Ltd. Optical scanner and image forming apparatus 07525561 Cl. 347-234.
Nakajo, Hironori; and Sasaki, Michio, to Kabushiki Kaisha Toshiba Miniature camera module with lens containing image sensor 07525096 Cl. 250-370.08.
Nakamae, Takayuki: See--
Nakashima, Eishin; Iida, Kiyonobu; Tsuda, Hiroyuki; Morikawa, Akiyoshi; Kobayashi, Noriaki; Ohno, Masaharu; Kawasoe, Hiroyuki; Ozaki, Yuki; Tokunaga, Takahiro; Nakamae, Takayuki; and Takasaki, Mineo 07523726 Cl. 123-41.7.
Nakamoto, Ken-ichiro; Ohashi, Syunsuke; Yamamoto, Yuji; Sakanoue, Kenji; Itoh, Chika; and Yasukohchi, Tohru, to NOF Corporation Modified bio-related substance, process for producing the same, and intermediate 07524875 Cl. 514-359.
Nakamura, Akio; Seki, Fujio; Funakoshi, Katsuya; and Miyatsu, Keiji, to Fujitsu Component Limited Movable console device 07524004 Cl. 312-223.2.
Nakamura, Charles: See--
Caimi, Perry; and Nakamura, Charles 07524660 Cl. 435-159.
Nakamura, Go: See--
Aoki, Kunimitsu; Furuya, Yoshiyuki; Kageyama, Hideaki; and Nakamura, Go 07525734 Cl. 359-631.
Nakamura, Junichi: See--
Haga, Tomohiro; and Nakamura, Junichi 07524113 Cl. 384-123.
Takayanagi, Isao; and Nakamura, Junichi 07525588 Cl. 348-314.
Nakamura, Katsunori: See--
Fujii, Noriaki; Nakamura, Katsunori; and Yonekawa, Akiyuki 07523727 Cl. 123-90.17.
Nakamura, Minoru: See--
Aoyama, Kazunari; Nakamura, Minoru; and Komatsu, Takaaki 07525263 Cl. 318-77.
Nakamura, Osamu; and Akiba, Mai, to Semiconductor Energy Laboratory Co., Ltd. Test element group, method of manufacturing a test element group, method of testing a semiconductor device, and semiconductor device 07525118 Cl. 257-48.
Nakamura, Ryosuke; to Seiko Epson Corporation Optical device 07525713 Cl. 359-260.
Nakamura, Sensaburo: See--
Sugimoto, Hiroyuki; Nakamura, Sensaburo; and Minami, Nobuyuki 07525601 Cl. 348-578.
Nakamura, Shohei; Hioki, Shouichi; Ito, Hiroyoshi; Mayumi, Tooru; and Sasabe, Mitsuo, to NTN Corporation Machine components having IC tags, quality control method and abnormality detecting system 07525430 Cl. 340-572.1.
Nakamura, Takeshi: See--
Kozakai, Kenji; Nakamura, Takeshi; Ishii, Tatsuya; Tsunoda, Motoyasu; Iguchi, Shinya; and Maruyama, Junichi 07525852 Cl. 365-189.09.
Nakamura, Tomoaki: See--
Abe, Kenji; Nakamura, Tomoaki; and Zaima, Tsutomu 07526082 Cl. 379-433.11.
Nakanishi, Akinobu: See--
Matsumoto, Yoshiyuki; Imai, Minoru; Sawai, Yoshiyuki; Takeuchi, Susumu; Nakanishi, Akinobu; Minamizono, Kunio; and Yokoyama, Tomonori 07524841 Cl. 514-223.2.
Nakanishi, Kazuo: See--
Livshits, Vitaliy Arkadievich; Zakataeva, Natalia Pavlovna; Nakanishi, Kazuo; Aleshin, Vladimir Veniaminovich; Troshin, Petr Vladimirovich; and Tokhmakova, Irina Lyvovna 07524656 Cl. 435-106.
Nakanishi, Satoshi: See--
Arai, Hitoshi; Matsumura, Tsutomu; Ishida, Hiroshi; Yamaura, Yosuke; Aratake, Seiji; Ohshima, Etsuo; Yanagawa, Koji; Miyama, Motoki; Suzuki, Koji; Kawabe, Ari; Nakanishi, Satoshi; Kobayashi, Katsuya; Sato, Takashi; Miki, Ichiro; Ueno, Kimihisa; Fujii, Shinya; and Iwase, Miho 07524852 Cl. 514-264.11.
Nakanishi, Toru; Kondo, Kazunori; Hoshida, Shigehiro; and Amano, Tadashi, to Shin-Etsu Chemical Co., Ltd. Flame retardant adhesive composition, and adhesive sheet, coverlay film and flexible copper-clad laminate using same 07524394 Cl. 156-330.
Nakanishi, Toru; Kondo, Kazunori; Hoshida, Shigehiro; and Amano, Tadashi, to Shin-Etsu Chemical Co., Ltd. Flame retardant adhesive composition, and adhesive sheet, coverlay film and flexible copper-clad laminate using same 07524563 Cl. 428-416.
Nakano, Akinori: See--
Kawahara, Jun; Kinoshita, Keizo; Kunimi, Nobutaka; and Nakano, Akinori 07524908 Cl. 526-279.
Nakano, Hiroyuki; and Fukashiro, Yasuyuki, to Hitachi Communication Technologies, Ltd. Wavelength-division multiplexing optical transmitter 07526200 Cl. 398-34.
Nakano, Susumu: See--
Hayakawa, Hiroshi; Nakano, Susumu; and Takahashi, Kentaro 07526130 Cl. 382-183.
Nakano, Toshihiro: See--
Fukao, Takeshi; and Nakano, Toshihiro 07524238 Cl. 451-450.
Nakano, Yasushi: See--
Sakamoto, Kei; Nakano, Yasushi; Kondou, Yoshihisa; Yamada, Toshiro; and Nemoto, Hisao 07524978 Cl. 549-465.
Nakano, Yosuke: See--
Takeda, Kazuhisa; Nakano, Yosuke; and Sekizawa, Tsuyoshi 07523934 Cl. 271-314.
Nakao, Seigo; and Tanaka, Yasuhiro, to Sanyo Electric Co., Ltd. Method and apparatus for transmitting signals, method and apparatus for receiving the signals, and communication system utilizing the same 07526258 Cl. 455-101.
Nakao, Yoshizumi: See--
Toyoda, Takashi; Nakao, Yoshizumi; and Masaki, Yasuo 07525081 Cl. 250-208.1.
Nakashima, Atsuhisa; to Brother Kogyo Kabushiki Kaisha Recording apparatus 07524049 Cl. 347-104.
Nakashima, Eishin; Iida, Kiyonobu; Tsuda, Hiroyuki; Morikawa, Akiyoshi; Kobayashi, Noriaki; Ohno, Masaharu; Kawasoe, Hiroyuki; Ozaki, Yuki; Tokunaga, Takahiro; Nakamae, Takayuki; and Takasaki, Mineo, to Kubota Corporation Air-cooled V-shaped engine 07523726 Cl. 123-41.7.
Nakashima, Gosuke: See--
Umeda, Hiroyuki; Nakashima, Gosuke; and Yoshida, Noriyuki 07523879 Cl. 241-34.
Nakashima, Shigeo; and Sato, Takehiko, to Canon Kabushiki Kaisha Optical apparatus having a driving source for driving a lens in an optical axis direction 07525235 Cl. 310-328.
Nakata, Hiroyuki: See--
Mukai, Yasushi; Kawamoto, Atsuhiro; Ikeda, Tatsuya; Nakata, Hiroyuki; and Kowa, Masaru 07525066 Cl. 219-124.01.
Nakaya, Kazuhiko; to RICOH Company Ltd. Method and apparatus for image reading capable of obtaining adequate white reference data for shading correction 07525692 Cl. 358-461.
Nakayama, Junichi: See--
Tsuchiya, Tomihisa; Ohkubo, Kenji; Yano, Masaaki; Taira, Iwao; and Nakayama, Junichi 07523742 Cl. 123-470.
Nakayama, Masahiko: See--
Kai, Tadashi; Nakayama, Masahiko; Ikegawa, Sumio; Fukuzumi, Yoshiaki; and Iwata, Yoshihisa 07525837 Cl. 365-158.
Nakayama, Tomonobu: See--
Aono, Masakazu; Hasegawa, Tsuyoshi; Terabe, Kazuya; and Nakayama, Tomonobu 07525410 Cl. 338-309.
Nakazato, Norio; and Sudo, Kimihiko, to Hitachi, Ltd. Semiconductor light source device 07525191 Cl. 257-713.
Nakazato, Satoshi; to NEC Corporation Multiport cache memory which reduces probability of bank contention and access control system thereof 07526612 Cl. 711-131.
Nakazawa, Akira: See--
Berry, Norman Micheal; Nakazawa, Akira; and Silverbrook, Kia 07524017 Cl. 347-29.
Silverbrook, Kia; Berry, Norman Michael; Nakazawa, Akira; Mackey, Paul Ian; and Jackson, Garry Raymond 07524023 Cl. 347-49.
Silverbrook, Kia; Berry, Norman Micheal; Jackson, Garry Raymond; and Nakazawa, Akira 07524021 Cl. 347-42.
Silverbrook, Kia; Nakazawa, Akira; Hibbard, Christopher; Mackey, Paul Ian; Berry, Norman Micheal; and Jackson, Garry Raymond 07524016 Cl. 347-29.
Silverbrook, Kia; Nakazawa, Akira; Hibbard, Christopher; MacKey, Paul Ian; Berry, Norman Micheal; and Jackson, Garry Raymond 07524043 Cl. 347-84.
Nakazono, Keisuke; and Ueno, Akira, to Olympus Corporation Image processing apparatus and image processing method 07525577 Cl. 348-231.3.
Nalamliang, Tanong: See--
Yamamoto, David T.; Rapues, Neil T.; and Nalamliang, Tanong 07524000 Cl. 303-126.
Nam, Hyo-Rak: See--
Mun, Joong-Hyun; Song, Jang-Kun; Choi, Yong-Woo; Kim, Bo-Sung; Jung, Kwan-Wook; Lee, Jung-Ho; and Nam, Hyo-Rak 07525621 Cl. 349-129.
Nam, Seung Hee: See--
Cho, Heung Lyul; Yoo, Soon Sung; Kwon, Oh Nam; and Nam, Seung Hee 07525619 Cl. 349-126.
Lee, Kyoung-Mook; Choi, Nack-Bong; Nam, Seung-Hee; and Oh, Jae-Young 07525630 Cl. 349-152.
Lee, Kyoung Mook; Nam, Seung Hee; and Oh, Jae Young 07525120 Cl. 257-59.
Nam, Seung-Hoon: See--
Kim, Kyeongyeon; Lee, Chungyong; Chung, Jae-Hak; Shim, Seijoon; and Nam, Seung-Hoon 07526039 Cl. 375-267.
Nambu, Shuya: See--
Igarashi, Kenji; Shimizu, Masaharu; Wakabayashi, Akiji; Saito, Yasuo; Iso, Machiko; Kishi, Tsuguo; Sakuta, Shigeru; Kitamura, Masaru; Doji, Ryuhachiro; Ide, Hideki; Nambu, Shuya; Yamazaki, Masahiko; Yamada, Katsuya; and Nakagawa, Yasutada 07526070 Cl. 378-149.
Namekawa, Takumi; Kitamura, Yoshio; and Shinobu, Hidaka, to Sony Corporation Image forming apparatus 07524121 Cl. 400-625.
Namgoong, Ji-na; Hwang, Kyu-youn; and Shim, Jeo-young, to Samsung Electronics Co., Ltd. Method of storing substrate having active group or probe molecule immobilized thereon using UV film, method of producing microarray using the UV film, and substrate having the UV film attached thereto 07524662 Cl. 435-174.
Namiki, Hiroaki: See--
Kayama, Naonori; Namiki, Hiroaki; and Yoshimura, Shotaro 07526244 Cl. 399-405.
Namiki Seimitsu Houseki Kabuhsiki Kaisha: See--
Uchiumi, Hidehiro; Suzuki, Toshio; Aoyagi, Tomohide; Kogawa, Takeshi; and Morita, Kazuo 07525225 Cl. 310-81.
Nan, Nan: See--
Nguyen, David; Nan, Nan; Ni, Jim Chin-Nan; Lee, Charles Chung; and Shen, Ming-Shiang 07524198 Cl. 439-131.
Nan Ya Printed Circuit Board Corporation: See--
Hsu, Hung-En; Wang, Binwei; and Ho, Shing-Fun 07524429 Cl. 216-18.
Nangle, Leslie A.: See--
Doring, Volker; Nangle, Leslie A.; Hendrickson, Tamara L.; Crecy-Lagard, Valerie De; Schimmel, Paul; and Marliere, Philippe 07524646 Cl. 435-69.1.
Nanjo, Yusuke: See--
Suzaki, Mitsuhiro; Nanjo, Yusuke; Minato, Atsuo; and Arita, Shinichi 07525729 Cl. 359-557.
Nannerup, Lars: See--
Torring, Ditte; Lauersen, Christian; Baekgard, Arne; Nannerup, Lars; Nielsen, Flemming K.; Schmidt, Richard D.; and Jorgensen, Gert 07523718 Cl. 119-203.
Nannor Technologies: See--
Zhang, Shuo; and Jia, Yongbo 07526746 Cl. 716-18.
Nanologix, Inc.: See--
Gazenko, Sergey 07524623 Cl. 435-4.
Nanomist Systems, LLC: See--
Adiga, Kayyani C. 07524442 Cl. 264-14.
Nanyang Technological University: See--
Chen, Tu Pei; and Ng, Chi Yung 07525147 Cl. 257-314.
Nappa, Mario Joseph; Rao, Velliyur Nott Mallikarjuna; and Sievert, Allen Capron, to E. I. du Pont de Nemours and Company Process for the production of 1,1,1,3,3,3-hexafluoropropane 07524999 Cl. 570-169.
Napper, Jonathon Leigh: See--
Koubaroulis, Dimitrios; Napper, Jonathon Leigh; Lapstun, Paul; and Silverbrook, Kia 07526128 Cl. 382-179.
Narahara, Tatsuya: See--
Nakagawa, Toshiyuki; Shimpuku, Yoshihide; and Narahara, Tatsuya 07526032 Cl. 375-253.
Narasimhan, Partha: See--
Iyer, Pradeep J.; Narasimhan, Partha; Melkote, Keerti G.; and Taylor, John 07525943 Cl. 370-338.
Narayan-Sarathy, Sridevi: See--
Gould, Michael L.; Hammond, Terry E.; and Narayan-Sarathy, Sridevi 07524565 Cl. 428-441.
Närhi, Harri: See--
Niiranen, Erkki; Närhi, Harri; Puoskari, Jukka; and Koskela, Pertti 07526263 Cl. 455-130.
Narita, Masaaki; Kawamura, Nobuo; Hirohata, Kiyomi; and Hoshino, Ryuichi, to Hitachi, Ltd. Method and system of database management with shared area 07526469 Cl. 707-2.
Naruse, Yuuichi: See--
Matsui, Kenichi; Yagi, Takeshi; Naruse, Yuuichi; Murayama, Junichi; and Kaneda, Masaki 07525919 Cl. 370-238.
Narvel, James; to Monsanto Technology LLC Soybean variety 4614131 07525017 Cl. 800-312.
Nascimento Sobrinho, Elói Ricardo: See--
Dall'Agnol, Alcir; Osvaldo Baldus, Ari; Dariva, Cláudio; Nascimento Sobrinho, Elói Ricardo; and Vladimir De Oliveira, José 07524982 Cl. 554-174.
Naseh, Zeeshan; and Gundi, Vinay, to Cisco Technology, Inc. Disaster recovery for active-standby data center using route health and BGP 07525906 Cl. 370-221.
Nashimoto, Keiichi; and Sugahara, Yoshiyuki, to EpiPhotonics Corp. Optical amplifier and fabrication method thereof 07526176 Cl. 385-141.
National Chiao Tung University: See--
Chang, Shu-Wei; Hwang, Wei; Chang, Ming-Hung; and Huang, Po-Tsang 07525827 Cl. 365-49.1.
National Institute of Information and Communications Technology: See--
Kawanishi, Tetsuya; and Izutsu, Masayuki 07526209 Cl. 398-187.
National Instruments Corporation: See--
Peck, Joseph E.; Novacek, Matthew; Andrade, Hugo A.; Petersen, Newton G.; Ranganathan, Ganesh; Sierer, Brian; and Pasquarette, John 07526535 Cl. 709-220.
National Oilwell, Inc.: See--
El-Rayes, Kosay I.; Shwets, Peter J.; and Melhem, Nazeeh 07523792 Cl. 175-92.
National-Oilwell, L.P.: See--
Aday, James C.; Drzewiecki, Lopek; Kubinski, Michael J.; and Riley, Andrew Dale 07523694 Cl. 92-171.1.
National Presto Industries, Inc.: See--
Hedrington, James A. 07523697 Cl. 99-348.
National Research Council of Canada: See--
Zheng, Zhifu; Uchacz, Tina; and Taylor, Janet 07524943 Cl. 536-23.1.
National Semiconductor Corporation: See--
Henry, Paul Michael 07525365 Cl. 327-307.
Hopper, Peter J.; Hwang, Kyuwoon; Smeys, Peter I.; and Papou, Andrei 07525323 Cl. 324-691.
Lorenz, Perry Scott 07524107 Cl. 374-170.
Maloberti, Franco; Yousefi, Masood; and Bahai, Ahmad 07525464 Cl. 341-143.
Sallaway, Peter J.; and Raghavan, Sreen 07526053 Cl. 375-350.
Taft, Robert Callaghan; and Menkus, Christopher Alan 07525358 Cl. 327-175.
Ziazadeh, Ramsin M. 07525348 Cl. 327-65.
National Taiwan University: See--
Liu, Zhi-Yuan; and Chen, Yi-Jan 07525388 Cl. 330-296.
National Taiwan University of Science and Technology: See--
Hsu, Shih-Hsiang 07526146 Cl. 385-2.
National University Corporation Shizuoka University: See--
Sumiya, Masatomo; Fuke, Shunro; Nihashi, Tokuaki; and Hagino, Minoru 07525131 Cl. 257-184.
Natsume, Kazuma: See--
Takano, Gaku; Yamano, Chiharu; Natsume, Kazuma; Miyake, Yasuyuki; and Sakuma, Yasushi 07525478 Cl. 342-145.
Natural Selection, Inc.: See--
Fogel, David B. 07526467 Cl. 706-62.
Naulin, Jean-Yves: See--
Vennetier, Perig; and Naulin, Jean-Yves 07524098 Cl. 362-555.
Nault, Gabe: See--
Wright, Michael; Boucher, Peter; Nault, Gabe; Smith, Merrill; Jacobson, Sterling K.; Wood, Jonathan; and Mims, Robert 07526800 Cl. 726-11.
Nause, Jeffrey E.; and Ganesan, Shanthi, to Cermet, Inc. Zinc-oxide-based double-heterostructure light-emitting diode 07525128 Cl. 257-102.
Nave, Shawn M.; Thorn, Jeffrey L.; and Yardy, Raymond, to International Business Machines Corporation Accessor and rails for a data storage library 07525756 Cl. 360-92.1.
Naxellent, LLC: See--
Xue, Jiuzhi 07525604 Cl. 349-16.
Naya, Hidemitsu; Tomiyoshi, Rikio; Moriyama, Shigeo; Kikuchi, Mutsumi; and Shimamura, Kotaro, to Hitachi, Ltd. Semiconductor production system 07526352 Cl. 700-95.
Nayak, Chetan: See--
Freedman, Michael; Nayak, Chetan; and Shtengel, Kirill 07525202 Cl. 257-798.
Naylor, Charles A.: See--
Tsikos, Constantine J.; Schnee, Michael D.; Zhu, Xiaoxun; Amundsen, Thomas; Naylor, Charles A.; Dobbs, Russell Joseph; and Knowles, Carl Harry 07523863 Cl. 235-454.
Neale, Richard S.: See--
Román, Kendyl A.; Hoomani, Cyrus J.; and Neale, Richard S. 07526029 Cl. 375-240.23.
Nease, Joseph L.; and Owsley Nease, Karen Method and apparatus for image interpretation into sound 07525034 Cl. 84-485R.
Nebashi, Satoshi: See--
Fukushima, Hitoshi; Nebashi, Satoshi; Ishida, Masaya; Huck, Wilhelm J S; Holmes, Andrew B; and Luscombe, Christine K 07524998 Cl. 570-129.
Nebeker, Michael O.: See--
LaConte, Richard J.; and Nebeker, Michael O. 07524154 Cl. 411-551.
NEC Corporation: See--
Asada, Hideaki 07526318 Cl. 455-558.
Fujinami, Makoto 07525966 Cl. 370-390.
Hiroya, Tsutomu; Sumiyoshi, Ken; and Shigemura, Kouji 07525618 Cl. 349-123.
Iga, Daisuke 07525135 Cl. 257-250.
Inoue, Hiroaki; Ito, Yoshiyuki; Sakai, Junji; and Edahiro, Masato 07526673 Cl. 714-11.
Kajita, Mikihiro 07526390 Cl. 702-57.
Kakura, Yoshikazu; Atarashi, Hiroyuki; and Maeda, Noriyuki 07526041 Cl. 375-285.
Kawahara, Jun; Kinoshita, Keizo; Kunimi, Nobutaka; and Nakano, Akinori 07524908 Cl. 526-279.
Kikuma, Tomohiro 07525916 Cl. 370-235.
Matsumoto, Junko; and Akimoto, Tetsuya 07526399 Cl. 702-125.
Nakazato, Satoshi 07526612 Cl. 711-131.
Oonaka, Shinichi 07526363 Cl. 700-245.
Saida, Yasumasa 07526629 Cl. 712-2.
Sekine, Hiroyuki 07525527 Cl. 345-87.
Tago, Masamoto 07525189 Cl. 257-698.
Tahara, Hiromitsu; and Mutou, Takanori 07525220 Cl. 307-85.
Uehara, Shin-ichi; Sato, Yuko; Sumiyoshi, Ken; Kaneko, Setsuo; and Matsushima, Jin 07525732 Cl. 359-620.
Yano, Yutaka 07526204 Cl. 398-81.
Yoshida, Hisashi; and Yoshimatsu, Ryo 07524476 Cl. 423-263.
NEC Electronics Corporation: See--
Aoki, Yoshiyuki 07526697 Cl. 714-731.
Koyama, Tetsuhiro; and Matsumoto, Tetsuya 07525369 Cl. 327-536.
Kuwabara, Keiichi 07526602 Cl. 711-106.
Orio, Masao 07526711 Cl. 714-755.
Shioda, Junyou; and Furihata, Hirobumi 07525550 Cl. 345-545.
Tetsuka, Takashi; and Yamamoto, Hiroki 07525804 Cl. 361-718.
Uchida, Shinichi 07525172 Cl. 257-500.
Yamamoto, Ichiro 07524723 Cl. 438-240.
NEC Laboratories America, Inc.: See--
Moon, Hankyu; and Miller, Matthew L. 07526123 Cl. 382-159.
NEC Medical Systems, Ltd.: See--
Nakagawara, Minoru 07524291 Cl. 600-499.
NEC TOKIN Corporation: See--
Kida, Fumio 07525790 Cl. 361-523.
Sakata, Koji; Saito, Takeshi; Yoshida, Yuji; Kasuga, Takeo; Takahashi, Masanori; and Yoshida, Katsuhiro 07525791 Cl. 361-528.
NEC Viewtechnology, Ltd.: See--
Murayama, Syuuji; and Oura, Keiji 07524069 Cl. 353-69.
Neer, Jay H.; Lloyd, Brian Keith; Brinkerhoff, Cleaver; Dambach, Philip J.; Kiley, Deborah; and Reed, Bruce, to Molex Incorporated Keyed housing for use with small size plug connectors 07524213 Cl. 439-680.
Negevtech Ltd.: See--
Furman, Dov; Neumann, Gad; Wagner, Mark; Dotan, Noam; Segal, Ram; and Silberstein, Shai 07525659 Cl. 356-400.
Negi, Yasuharu: See--
Suyama, Motohiro; Kyushima, Hiroyuki; Kimura, Suenori; Negi, Yasuharu; Fukasawa, Atsuhito; Kawai, Yoshihiko; Uchiyama, Atsushi; and Egawa, Yasuyuki 07525249 Cl. 313-542.
Nehagi, Takatoshi: See--
Ohnishi, Takao; Yamada, Tomohiro; and Nehagi, Takatoshi 07525324 Cl. 324-727.
Neisser, Mark: See--
Chen, Chunwei; Lu, Ping-Hung; Zhuang, Hong; and Neisser, Mark 07524606 Cl. 430-270.1.
Nekovee, Maziar; and Olafsson, Sverrir, to British Telecommunications public limited company Timer-based feedback in multicast communication 07526523 Cl. 709-204.
Nelsen, Daniel: See--
Petrie, Aidan; Nelsen, Daniel; Smith, Daniel; Pereira, Michael C.; and Zins, Kenneth 07524127 Cl. 402-19.
Nelson, Cory J.: See--
Kubicek, Chris A.; Nelson, Cory J.; Montei, Matthew S.; and Furner, Paul E. 07524187 Cl. 431-291.
Nelson, Keith Allen: See--
Jiang, Peijun; Nelson, Keith Allen; Curry, Christopher Lewis; Dekmezian, Armenag Hagop; Sims, Charles Lewis; Abhari, Ramin; Garcia-Franco, Cesar Alberto; Canich, Jo Ann Marie; Kappes, Nicolas; Faissat, Michel Louis; and Jacob, Lutz Erich 07524910 Cl. 526-348.
Nelson, Troy D.: See--
Grauzer, Attila; Bourbour, Feraidoon; Nelson, Troy D.; Rynda, Robert J.; Scheper, Paul K.; Stasson, James Bernard; and Swanson, Ronald R. 07523936 Cl. 273-149R.
Grauzer, Attila; Bourbour, Feraidoon; Nelson, Troy D.; Scheper, Paul K.; Stasson, James B.; and Swanson, Ronald R. 07523935 Cl. 273-149R.
Nemani, Srinivas D.; Lee, Young S.; Yieh, Ellie Y.; Wang, Anchuan; Bloking, Jason Thomas; and Han, Lung-Tien, to Applied Materials, Inc. Integrated process modulation (IPM) a novel solution for gapfill with HDP-CVD 07524750 Cl. 438-597.
Nemat, Awais Bin: See--
Zhang, Ming; Nemat, Awais Bin; and Bliss, David Edward 07526518 Cl. 708-492.
Nemazie, Sam; and Chong, Andrew Hyonil, to LSI Corporation Dual port serial advanced technology attachment (SATA) disk drive 07526587 Cl. 710-74.
Nemecek, Craig; to Cypress Semiconductor Corporation System and a method for checking lock-step consistency between an in circuit emulation and a microcontroller 07526422 Cl. 703-28.
Nemeth, Elizabeta: See--
Bryant-Greenwood, Gillian D.; Tashima, Lily S.; Ognjanovic, Simona; Nemeth, Elizabeta; and Millar, Lynnae K. 07524636 Cl. 435-7.1.
Nemetz, Leah T.: See--
Coats, Joel R.; Peterson, Christopher J.; Zhu, Junwei; Baker, Thomas C.; and Nemetz, Leah T. 07524888 Cl. 514-729.
Nemoto, Hisao: See--
Sakamoto, Kei; Nakano, Yasushi; Kondou, Yoshihisa; Yamada, Toshiro; and Nemoto, Hisao 07524978 Cl. 549-465.
Nemoto, Kazuhiko; to Sony Corporation Semiconductor integrated device 07525895 Cl. 369-112.01.
Nemzov, Julius: See--
Meyer, Klaus; Nemzov, Julius; and Mueller, Ulrich 07523670 Cl. 73-776.
Neose Technologies, Inc.: See--
Johnson, Karl F.; Bezila, Daniel James; Taylor, Diane E.; Simala-Grant, Joanne; and Rasko, David 07524655 Cl. 435-97.
NeosemiTech Corporation: See--
Song, Joon-Suk; Seo, Soo-Hyung; and Oh, Myung-Hwan 07524708 Cl. 438-150.
Nesbit, Larry Alan: See--
Hakey, Mark Charles; Holmes, Steven John; Horak, David Vaclav; Koburger, III, Charles William; Mitchell, Peter H.; and Nesbit, Larry Alan 07525156 Cl. 257-347.
Nesheiwat, Jeries I.: See--
Huang, Misty; Medicino, Frank D.; Yang, Yurun; Nesheiwat, Jeries I.; and O'Keefe, Brendan J. 07524915 Cl. 528-28.
Nestec S.A.: See--
Rosse, Meinrad; and Gaillard, Julien 07524178 Cl. 425-313.
Vidal, Karine; Van Den Broek, Peter; Offord Cavin, Elizabeth; and Donnet-Hughes, Anne 07524815 Cl. 514-8.
Netafim, Ltd.: See--
Masarwa, Abed 07523965 Cl. 285-139.2.
Netapp, Inc.: See--
McGovern, William P. 07526620 Cl. 711-159.
Neto, José Batista Ferreira: See--
Bergmann, Herberto; Omoto, Arnaldo Hiroyuki; Pereira, Luis Ricardo Luzardo; Neto, José Batista Ferreira; Jensen, David L.; and Malkowski, Jr., Chester 07525809 Cl. 361-752.
Netscape Communications Corporation: See--
Musil, Alex; Uberti, Justin; and Wick, Andy 07525951 Cl. 370-352.
Nettles, Alice Method and apparatus for celebration money hanger 07523575 Cl. 40-661.04.
Network Appliance, Inc.: See--
Pittman, Joseph C. 07526558 Cl. 709-227.
Neubauer, Antonie; and Ziegler, Christina, to Boehringer Ingelheim Vetmedica GmbH gM-negative EHV-mutants without heterologous elements 07524506 Cl. 424-199.1.
Neubauer, III, William C.: See--
Klug, Keith M.; Kreitzer, Stuart S.; McKay, Brent M.; Rainbolt, Bradley J.; Villa, Fred R.; Boillot, Marc A.; Lindteigen, Ty B.; McKibben, Bernard R.; Neubauer, III, William C.; Ray, Jerry D.; Savage, Michael A.; Sutherland, Bryce; and Winterfield, Barbara S. 07526276 Cl. 455-411.
Neuendorffer, Stephen A.; and Blodget, Brandon J., to Xilinx, Inc. Method and apparatus for accessing internal registers of hardware blocks in a programmable logic device 07525343 Cl. 326-40.
Neuhoff, Heinz: See--
Tschuor, Remigi; Neuhoff, Heinz; and Strelkov, Iouri 07524168 Cl. 416-97R.
Neuman, Darren: See--
Kumar, Sathish; Ramakrishnan, Lakshmanan; and Neuman, Darren 07526024 Cl. 375-240.
Neumann, Gad: See--
Furman, Dov; Neumann, Gad; Wagner, Mark; Dotan, Noam; Segal, Ram; and Silberstein, Shai 07525659 Cl. 356-400.
Neumann, Jeffrey: See--
Bossemeyer, Jr., Robert Wesley; Halling, Dale Brian; Goering, Scott Christopher; Gorman, Michael George; Kagan, Denise Violetta; Neumann, Jeffrey; Pickard, Michael Steven; Tisiker, Michael; and Stuckman, Bruce Edward 07525990 Cl. 370-468.
Neurath, Markus F.; and Schwab, Matthias, to Robert Bosch Gesellschaft fur Medizinische Forschung (RBMF) Diagnostic methods for therapeutic compounds and methods for monitoring azathioprine therapy 07524851 Cl. 514-262.1.
Neurosearch A/S: See--
Peters, Dan; Olsen, Gunnar M.; Nielsen, Elsebet Østergaard; and Scheel-Krüger, Jørgen 07524958 Cl. 546-112.
NeuStar, Inc.: See--
Fridman, Sharon; Volach, Ben; and Makavy, Ran 07525930 Cl. 370-259.
Nevejans, Filip: See--
Sohn, Martin; Stroefer, Eckhard; Nevejans, Filip; Penzel, Ulrich; Pallasch, Hans-Juergen; Van Den Abeel, Peter; Deberdt, Filip; Jacobs, Jan D.; and Mackenroth, Wolfgang 07524405 Cl. 203-80.
Neveling, Arno: See--
Blann, Kevin; Bollmann, Annette; Dixon, John Thomas; Neveling, Arno; Morgan, David Hedley; Maumela, Hulisani; Killian, Esna; Hess, Fiona Millicent; Otto, Stefanus; and Overett, Matthew James 07525009 Cl. 585-527.
Nevid, Jeffrey S.: See--
Rathus, Spencer A.; Nevid, Jeffrey S.; and Fichner-Rathus, Lois 07523868 Cl. 235-472.01.
Nevin, Joseph: See--
Ahn, Chong H.; Choi, Jin-Woo; Beaucage, Gregory; and Nevin, Joseph 07524464 Cl. 422-177.
Nevoret, Damien; Swei, Gwo; and Zanoli, Alain, to Saint-Gobain Abrasives, Inc. Rapid tooling system and methods for manufacturing abrasive articles 07524345 Cl. 51-298.
New Jersey Institute of Technology: See--
Dreizin, Edward Leonid; and Schoenitz, Mirko 07524355 Cl. 75-375.
Newbury, Terence D.: See--
Black, Donald N.; Newbury, Terence D.; Jones, Alan; Parr, R. Dean; and Bunce, Bayne 07525501 Cl. 343-773.
Newfrey LLC: See--
Ebert, David Allan 07523971 Cl. 292-358.
Kawai, Yasuhiro; Kawasaki, Yoshiharu; Okinaka, Shuichi; and Nogami, Mitsuo 07523959 Cl. 280-730.2.
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Newhall, Jr., William P.; and Van Dyke, James M., to Nvidia Corporation Anisotropic texture prefiltering 07525551 Cl. 345-587.
Newlander, Kenneth A.: See--
Miller, William H.; Newlander, Kenneth A.; Seefeld, Mark A.; Uzinskas, Irene N.; Dewolf, Jr., Walter E.; and Jakas, Dalia R. 07524843 Cl. 514-230.5.
Newman, Mark Webster: See--
Edwards, Warren Keith; Newman, Mark Webster; Smith, Trevor; Sedivy, Jana Zdislava; Marcelo, Karen; Izadi, Shahram; and Hong, Jason 07526482 Cl. 707-10.
Newport Media, Inc.: See--
Elwan, Hassan; Fahim, Amr; Ismail, Aly; and Youssoufian, Edward 07525372 Cl. 327-552.
Elwan, Hassan; and Wang, Dejun 07525465 Cl. 341-143.
Yousef, Nabil 07525993 Cl. 370-473.
Newton, Lee; and Bailey, Mark, to AstraZeneca UK Limited Process for the preparation of pyrimidine compounds 07524955 Cl. 544-297.
Nextreme Thermal Solutions, Inc.: See--
Venkatasubramanian, Rama; Alley, Randall G.; Addepalli, Pratima; Reddy, Anil J.; Siivola, Edward P.; O'Quinn, Brooks C.; Coonley, Kip D.; Posthill, John; and Colpitts, Thomas 07523617 Cl. 62-3.7.
NextWave Broadband, Inc.: See--
Gould, Adam; Librizzi, Michael S.; and Stanwood, Kenneth L. 07526248 Cl. 455-11.1.
Ng, Chi Yung: See--
Chen, Tu Pei; and Ng, Chi Yung 07525147 Cl. 257-314.
Ng, Joh Joh: See--
Maniam, Selvan; Ng, Joh Joh; Lin, Khee Boon; and Chia, Chee Wai 07525685 Cl. 358-1.9.
Ng, Keat Chuan: See--
Aizar, Abdul Karim Norfidathul; Lee, Chiau Jin; Ng, Keat Chuan; Ong, Kiam Soon; and Tan, Kheng Leng 07524087 Cl. 362-267.
Ng, Say Hwee; and Tang, Tian Cheng, to Swann Industries Pte Ltd. Interlock door switch 07525054 Cl. 200-10.
Ng, Tze Sing Eugene: See--
Guo, Katherine Hua; Hofmann, Markus Andreas; Ng, Tze Sing Eugene; Paul, Sanjoy; and Zhang, Hui 07526564 Cl. 709-231.
Ngai, Gary C.: See--
Tan, Leng Leng; Putzolu, Gianfranco; Sarwal, Richard; Tsukerman, Alex; Ngai, Gary C.; Wood, Graham Stephen; Dias, Karl; Ramacher, Mark; Dageville, Benoit; Ziauddin, Mohamed; Lahiri, Tirthankar; Muthulingam, Sujatha; Karra, Vishwanath; Sanchez, Francisco; Su, Hsiao-Te; Yang, Wanli; Krishnaswamy, Vasudha; and Kumar, Sushil 07526508 Cl. 707-200.
NGK Insulators, Ltd.: See--
Goto, Yoshinobu; and Tsuruta, Hideyoshi 07525071 Cl. 219-543.
Marada, Masashi; Ichikawa, Shuichi; Otsuka, Aiko; Kaneda, Atsushi; and Noguchi, Yasushi 07524450 Cl. 264-630.
Ohnishi, Takao; Yamada, Tomohiro; and Nehagi, Takatoshi 07525324 Cl. 324-727.
NGK Spark Plug Co., Ltd.: See--
Hirasawa, Makoto; Yoshiyasu, Shohei; and Matsubara, Yoshiaki 07524407 Cl. 204-425.
Yuri, Shinji; and Muramatsu, Masaki 07525814 Cl. 361-761.
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Ngo, Son Truong: See--
Tabatabaee, Vahid; and Ngo, Son Truong 07525978 Cl. 370-411.
Nguyen, Bich-Yen: See--
Adetutu, Olubunmi O.; Sadaka, Mariam G.; White, Ted R.; and Nguyen, Bich-Yen 07524707 Cl. 438-150.
Nguyen, David; Nan, Nan; Ni, Jim Chin-Nan; Lee, Charles Chung; and Shen, Ming-Shiang, to Super Talent Electronics, Inc. Press/push flash drive 07524198 Cl. 439-131.
Nguyen, Dinh Cong: See--
Bassler, Jürgen; Henzler, Steffen; and Nguyen, Dinh Cong 07524262 Cl. 476-42.
Nguyen, Don J.; Hsu, Pochang; Jackson, Robert T.; and Horigan, John W., to Intel Corporation Method and apparatus for reducing the power consumed by a computer system 07526663 Cl. 713-323.
Nguyen, Dzung H.; and Roohparvar, Frankie F., to Micron Technology, Inc. Increased NAND flash memory read throughput 07525842 Cl. 365-185.17.
Nguyen, Huy M.; Gadde, Vijay; and Lau, Benedict, to Rambus Inc. Calibration methods and circuits for optimized on-die termination 07525338 Cl. 326-30.
Nguyen, Khai: See--
Wang, Xiaobao; Sung, Chiakang; and Nguyen, Khai 07525360 Cl. 327-175.
Nguyen, Khoi M.: See--
Connors, Kevin G.; Pintauro, William L.; Wallin, Sheila K.; Kilcoyne, John T.; Cao, Hung H.; Nguyen, Khoi M.; and Yurek, Matthew T. 07524280 Cl. 600-29.
Nguyen, Thai: See--
Zhang, Nan; Ayral-Kaloustian, Semiramis; and Nguyen, Thai 07524849 Cl. 514-255.05.
Nguyen, The-Linh: See--
Aronson, Lewis B.; Giarreta, Girogio; and Nguyen, The-Linh 07526207 Cl. 398-164.
Nguyen, Thien: See--
Marchisio, Giovanni B.; Koperski, Krzysztof; Liang, Jisheng; Nguyen, Thien; Tusk, Carsten; Dhillon, Navdeep S.; Pochman, Lubos; and Brown, Matthew E. 07526425 Cl. 704-9.
Nguyen, Thien Ngoc: See--
Corvaia, Nathalie; Nguyen, Thien Ngoc; Beck, Alain; and Plotnicky, Hélène 07524627 Cl. 435-5.
Nhan, Davis-Dang Hoang: See--
Ales, Thomas Michael; and Nhan, Davis-Dang Hoang 07524195 Cl. 439-66.
NHK Spring Co., Ltd.: See--
Yamaguchi, Hiroyoshi 07523987 Cl. 297-216.12.
Nho, Jun Seok: See--
Cho, Seung Beom; Nho, Jun Seok; Shin, Dong Mok; Kim, Jong Pil; Oh, Myoung Hwan; Kim, Jang Yul; Choi, Eun Mi; and Ko, Min Jin 07524475 Cl. 423-263.
Ni, Bin: See--
Liu, Jingfeng; Oberg, Mats; Keirn, Zachary; and Ni, Bin 07525460 Cl. 341-120.
Ni, Jiahong: See--
Wang, Lai-Xi; Ni, Jiahong; Li, Hengguang; and Singh, Suddham 07524821 Cl. 514-25.
Ni, Jim Chin-Nan: See--
Nguyen, David; Nan, Nan; Ni, Jim Chin-Nan; Lee, Charles Chung; and Shen, Ming-Shiang 07524198 Cl. 439-131.
Nichia Corporation: See--
Kotani, Yasuhisa 07525123 Cl. 257-81.
Nicholes, Christopher T. Animal feeder apparatus 07523717 Cl. 119-51.01.
Nichols, Jonathan L.: See--
Janik, Craig M.; Kalayjian, Nicholas; Nichols, Jonathan L.; and Fuchs, Axel 07525289 Cl. 320-158.
Nichols, Mark; and Steinman, Richard, to University of Pittsburgh - of the Commonwealth System of Higher Education Small interfering RNA libraries and methods of synthesis and use 07524653 Cl. 435-91.41.
Nickolls, John R.: See--
Duluk, Jr., Jerome F.; Lew, Stephen D.; and Nickolls, John R. 07526634 Cl. 712-216.
Nicox S.A.: See--
Del Soldato, Piero 07524836 Cl. 514-182.
Nicros, Inc.: See--
Postma, Nathan B.; and Cieszkowski, Kevin E. 07524269 Cl. 482-37.
Nidec Corporation: See--
Tamaoka, Takehito 07525231 Cl. 310-216.
Nidek Co., Ltd.: See--
Mimura, Yoshiaki 07524063 Cl. 351-208.
Nie, Xiaoning: See--
Gazsi, Lajos; Lin, Jinan; Mehrgardt, Soenke; and Nie, Xiaoning 07526636 Cl. 712-228.
Niederauer, Gabriele G.: See--
Slivka, Michael A.; Niederauer, Gabriele G.; Kieswetter, Kristine; and Leatherbury, Neil C. 07524335 Cl. 623-23.75.
Nieglos, Donald J.: See--
Ammann, Kelly G.; Burns, Ralph E.; Hansberry, Ernest V.; Horner, Glenn A.; Jakub, Cheryl A.; Kling, John E.; Nieglos, Donald J.; Schneider, Robert E.; and Smith, Robert J. 07524652 Cl. 435-91.2.
Nielsen, Elsebet Østergaard: See--
Peters, Dan; Olsen, Gunnar M.; Nielsen, Elsebet Østergaard; and Scheel-Krüger, Jørgen 07524958 Cl. 546-112.
Nielsen, Flemming K.: See--
Torring, Ditte; Lauersen, Christian; Baekgard, Arne; Nannerup, Lars; Nielsen, Flemming K.; Schmidt, Richard D.; and Jorgensen, Gert 07523718 Cl. 119-203.
Nielsen, Karl Allen: See--
Kolvick, Jr., Robert John; and Nielsen, Karl Allen 07526686 Cl. 714-54.
Nielsen, Martin Dybendal; Skovgaard, Peter M. W.; Broeng, Jes; and Vienne, Guillaume, to Crystal Fibre A/S Optical coupler devices, methods of their production and use 07526165 Cl. 385-125.
Nielson, Scott L; and Gifford, Craig P, to American Equities Management, LLC Method, process and computer program to automatically create a customized three-dimensional nail object by welding 07526416 Cl. 703-6.
Niemi, Aki: See--
Khartabil, Hisham; Isomäki, Markus; Niemi, Aki; and Veikkolainen, Simo 07526281 Cl. 455-416.
Niemi, Valtteri: See--
Hurtta, Tuija; Asokan, Nadarajah; Ginzboorg, Philip; Niemi, Valtteri; Poikselkä, Miikka; and Rantalainen, Timo M. 07526642 Cl. 713-155.
Nierlich, Florent: See--
Thibault, Julien; and Nierlich, Florent 07523812 Cl. 188-71.5.
Nieto, John Wesley; to Harris Corporation Low complexity equalizer 07526022 Cl. 375-233.
Nihashi, Tokuaki: See--
Sumiya, Masatomo; Fuke, Shunro; Nihashi, Tokuaki; and Hagino, Minoru 07525131 Cl. 257-184.
Nihei, Norio: See--
Yakushiji, Gaku; Kitano, Hajime; Murata, Kazuya; Nihei, Norio; Takagi, Koji; Masuda, Yoshitomo; and Kawagoe, Takahiro 07525719 Cl. 359-296.
Niinuma, Koichiro; Semba, Satoshi; and Shinzaki, Takashi, to Fujitsu Limited Biometric information authentication device, biometric information authentication method, and computer-readable recording medium with biometric information authentication program recorded thereon 07526110 Cl. 382-125.
Niiranen, Erkki; Närhi, Harri; Puoskari, Jukka; and Koskela, Pertti, to Filtronic Comtek Oy Input arrangement for a low-noise amplifier pair 07526263 Cl. 455-130.
Niiya, Wataru: See--
Mimura, Hiroshi; Niiya, Wataru; and Kamada, Toshiyuki 07523829 Cl. 206-710.
NIKE, Inc.: See--
Schepke, Kyle; and Hanif, Umar 07524055 Cl. 351-103.
Nikolau, Basil J.; Wurtele, Eve S.; Oliver, David J.; Schnable, Patrick S.; and Wen, Tsui-Jung, to Iowa State University Research Foundation, Inc. Materials and methods for the alteration of enzyme and acetyl CoA levels in plants 07524678 Cl. 435-375.
Nilsson, Alan C.: See--
Welch, David F.; Kish, Jr., Fred A.; Nagarajan, Radhakrishnan L.; Nilsson, Alan C.; and Taylor, Robert B. 07526150 Cl. 385-14.
Nilsson, Björn M.: See--
Caldirola, Patrizia; Nilsson, Björn M.; and Johansson, Gary 07524839 Cl. 514-218.
Ning, Steven L.: See--
Cho, Yong K.; Ning, Steven L.; Mongeon, Luc R.; Davie, Scott W.; Sheldon, Todd J.; Erickson, Mark K.; and Markowitz, H. Toby 07524292 Cl. 600-529.
Ninomiya, Masaki; to Ricoh Company, Ltd. Optical information recording medium, an optical information recording apparatus, an information processing apparatus, program and information recording method 07525888 Cl. 369-47.53.
Ninomiya, Yasunori: See--
Terada, Nobuto; Shioi, Naoto; Totokawa, Masashi; and Ninomiya, Yasunori 07524893 Cl. 523-457.
Nippon Sheet Glass Co., Ltd.: See--
Koyo, Hirotaka; Koyama, Tadashi; and Tsunetomo, Keiji 07524783 Cl. 501-65.
Nippon Shokubai Co., Ltd.: See--
Miyazaki, Atsushi; Ito, Akio; and Kushino, Mitsuo 07525720 Cl. 359-296.
Nippon Telegraph and Telephone Corporation: See--
Matsui, Kenichi; Yagi, Takeshi; Naruse, Yuuichi; Murayama, Junichi; and Kaneda, Masaki 07525919 Cl. 370-238.
Nipro Corporation: See--
Sunohara, Takashi; Anbo, Hidehiko; and Masuda, Toshiaki 07524417 Cl. 210-321.79.
Nirel, Zvi: See--
Dishon, Giora; Finarov, Moshe; Nirel, Zvi; and Cohen, Yoel 07525634 Cl. 355-27.
Niro-Plan AG: See--
Marr, Duncan B.; Bomatter, Christian; Gross, Wolfgang; and Jost, Uli 07523511 Cl. 4-633.
Nisca Corporation: See--
Akaike, Yutaka 07525695 Cl. 358-471.
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Nishida, Katsutoshi; Okagawa, Takatoshi; and Jo, Manhee, to NTT DoCoMo, Inc. Router and address identification information management server 07526569 Cl. 709-239.
Nishidate, Masahiro: See--
Tsuchiya, Masahisa; and Nishidate, Masahiro 07525227 Cl. 310-90.
Nishiguchi, Katsuya: See--
Gendou, Toshiyuki; Sugimoto, Yukihiro; Nishiguchi, Katsuya; Takase, Kenji; and Shoji, Yohei 07523851 Cl. 228-112.1.
Nishiie, Takehiro: See--
Murakami, Kazushi; Komiya, Takaaki; Onuki, Yoshio; Nishiie, Takehiro; Kura, Yasuhito; and Ichikawa, Hiroaki 07524284 Cl. 600-106.
Nishikata, Akinobu: See--
Aoyagi, Shigeo; Nishikata, Akinobu; Fujii, Takayuki; and Kasahara, Shigeru 07523593 Cl. 53-117.
Nishikawa, Mutsuo; Ueyanagi, Katsumichi; Uematsu, Katsuyuki; and Fujimoto, Yuko, to Fuji Electric Device Technology Co., Ltd. Signal amplifier circuit with a limiting voltage device 07525389 Cl. 330-298.
Nishikawa, Satoshi: See--
Mori, Yasuo; Nakagiri, Koji; and Nishikawa, Satoshi 07525682 Cl. 358-1.18.
Nishikawa, Takahiro; Ogasawara, Hirotsugu; Suda, Akihiro; Hara, Masayuki; Sawabe, Hiroyuki; Yoshida, Hiroyuki; and Hashimoto, Akira, to Sanyo Electric Co., Ltd. Compression system, multicylinder rotary compressor, and refrigeration apparatus using the same 07524174 Cl. 418-60.
Nishikawa, Tohru: See--
Toizumi, Tomoko; Akazawa, Yoshiaki; Ogawa, Satoshi; Suzuki, Masao; Matsumoto, Akio; Onda, Hiroshi; Toizumi, Kiyoshi; Ishida, Toshihisa; Sawai, Tadayuki; Kida, Kouji; Nishikawa, Tohru; and Kubo, Masahiko 07524600 Cl. 430-108.3.
Nishimoto, Tetsuro; to Juon Co., Ltd. Method to measure exhaust-gas components 07523641 Cl. 73-23.2.
Nishimura, Ken; Larson, III, John D.; and Gilbert, Stephen R., to Avago Technologies General IP (Singapore) Pte. Ltd. Acoustically communicating data signals across an electrical isolation barrier 07525398 Cl. 333-189.
Nishimura, Michiyo; to Canon Kabushiki Kaisha Method of producing an electron emission device, method of producing an electron source, method of producing an image display device, and method of driving an electron emission device 07524227 Cl. 445-6.
Nishimura, Mitsuo: See--
Fujii, Hirofumi; and Nishimura, Mitsuo 07525644 Cl. 355-75.
Nishimura, Takayuki: See--
Nomizu, Yasuyuki; Sakuyama, Hiroyuki; Hara, Junichi; Matsuura, Nekka; Yano, Takanori; Kodama, Taku; Miyazawa, Toshio; Shinkai, Yasuyuki; and Nishimura, Takayuki 07526133 Cl. 382-232.
Nishino, Keita; and Koga, Teruyoshi, to Kaneka Corporation Process for producing carbapenem compound for oral administration 07524952 Cl. 540-350.
Nishiura, Katsunori; Fukuda, Kazuyuki; and Takaki, Toshihiko, to Mitsui Chemicals, Inc. Gas-barrier composition, coating film and method for production of the same, and layered material 07524900 Cl. 525-192.
Nishiwaki, Tatsuya: See--
Nakagaki, Johji; Asahara, Akihiro; Kimura, Hideo; Kitahara, Hiroaki; Nishiwaki, Tatsuya; Shiota, Yasuhiko; and Yamada, Takeshi 07525107 Cl. 250-492.21.
Nishiyama, Hidetoshi; Nozoe, Mari; and Shinada, Hiroyuki, to Hitachi, Ltd. Inspection method and inspection system using charged particle beam 07526747 Cl. 716-21.
Nishiyama, Yasuhiro: See--
Paul, Sudhir; and Nishiyama, Yasuhiro 07524663 Cl. 435-188.5.
Nissan Chemical Industries, Ltd.: See--
Tsutsui, Kimiaki; Sakai, Takahiro; and Goto, Kohei 07524541 Cl. 428-1.26.
Nissan Motor Co., Ltd.: See--
Ayame, Yutaka 07523744 Cl. 123-491.
Tsutsumi, Junji; and Katou, Yuusuke 07526372 Cl. 701-43.
Nissan Technical Center North America, Inc.: See--
Thompson, Bryan Scot; Devers, Raymond; Mazzei, Anke; and Saiki, Hideshi 07523991 Cl. 297-452.62.
Nissov, Morten: See--
Mohs, Georg H.; Abbott, Stuart M.; Kerfoot, III, Franklin W.; Jander, R. Brian; and Nissov, Morten 07526201 Cl. 398-37.
Nitta, Tatsuo; to Kabushiki Kaisha Toshiba Magnetic disk drive apparatus and method of controlling the same 07525745 Cl. 360-31.
Nitto Denko Corporation: See--
Ohsawa, Tetsuya; Funada, Yasuhito; and Kanagawa, Hitoki 07525764 Cl. 360-234.5.
Niu, Qiwen: See--
Zuo, Jianru; Niu, Qiwen; and Chua, Nam-Hai 07525012 Cl. 800-278.
Niwa, Takashi: See--
Oumi, Manabu; Mitsuoka, Yasuyuki; Chiba, Norio; Kasama, Nobuyuki; Kato, Kenji; and Niwa, Takashi 07525880 Cl. 369-13.31.
Nixon, John Perry: See--
Lepola, William; and Nixon, John Perry 07523764 Cl. 138-98.
Nixon, Mark J.: See--
Lucas, J. Michael; Webb, Arthur; Nixon, Mark J.; Jundt, Larry O.; Li, Jian; Stevenson, Dennis L.; Ott, Michael G.; Koska, Herschel O.; and Havekost, Robert B. 07526347 Cl. 700-79.
Njoki, Peter N.: See--
Zhong, Chuan-Jian; Njoki, Peter N.; and Luo, Jin 07524354 Cl. 75-370.
No, Yang Hwan: See--
Kim, Jong Seok; No, Yang Hwan; Cho, Han Ki; Jung, Yeon Su; Kang, Jung Hoon; Park, Myung Sik; and Ha, Young Hoon 07523627 Cl. 68-196.
Noborio, Daichi; and Akatsuka, Hidenori, to Yamaha Hatsudoki Kabushiki Kaisha Intake control device for a vehicle 07523732 Cl. 123-184.55.
Nobumoto, Hidetoshi; Shoya, Taizou; Ueda, Takayuki; and Mamiya, Kiyotaka, to Mazda Motor Corporation Engine starting system for power train 07524266 Cl. 477-110.
Noda, Kazuhiro: See--
Mal, Nawal Kishor; Hinokuma, Koichiro; and Noda, Kazuhiro 07524916 Cl. 528-30.
Noda, Sayuri; to Largan Precision Co., Ltd. Two-piece optical lens system for taking image 07525741 Cl. 359-795.
Noda, Tatsuya: See--
Shimada, Kei; Hirata, Takashi; Ashihara, Jun; Noda, Tatsuya; and Ikeuchi, Yasushi 07524297 Cl. 602-16.
NOF Corporation: See--
Kubo, Kazuhiro; Itoh, Chika; Ohhashi, Syunsuke; Yasukohchi, Tohru; Ohkawa, Yusuke; Kikuchi, Hiroshi; Suzuki, Norio; Takahashi, Miho; and Yamauchi, Hitoshi 07524981 Cl. 554-78.
Nakamoto, Ken-ichiro; Ohashi, Syunsuke; Yamamoto, Yuji; Sakanoue, Kenji; Itoh, Chika; and Yasukohchi, Tohru 07524875 Cl. 514-359.
Nogami, Keiji: See--
Asao, Haruhiko; Koshiba, Yutaka; Nogami, Keiji; Masui, Tutomu; Hori, Kazumasa; Wakiguchi, Kenji; Wada, Masahiko; and Hattori, Yoshiaki 07524356 Cl. 75-646.
Nogami, Mitsuo: See--
Kawai, Yasuhiro; Kawasaki, Yoshiharu; Okinaka, Shuichi; and Nogami, Mitsuo 07523959 Cl. 280-730.2.
Noguchi, Junichi: See--
Takasu, Yasuo; Takahashi, Isoko; Terasawa, Isamu; Noguchi, Junichi; and Tsuneoka, Kazunori 07524554 Cl. 428-292.4.
Noguchi, Katsuhiko: See--
Sasaki, Toshiro; Ando, Takashi; Yamamoto, Yasuo; Imai, Takahiro; Kubota, Dai; Noguchi, Katsuhiko; Hori, Nobuyuki; Shitara, Eiki; Atsumi, Kunio; and Yasuda, Shohei 07524951 Cl. 540-200.
Noguchi, Yasushi: See--
Marada, Masashi; Ichikawa, Shuichi; Otsuka, Aiko; Kaneda, Atsushi; and Noguchi, Yasushi 07524450 Cl. 264-630.
Noh, Tae-Yong: See--
Park, Sang-Hoon; Noh, Tae-Yong; Kim, Sang-Yeol; Pu, Lyong-Sun; Lee, Soo-Hyoung; Kang, In-Nam; and Son, Jhun-Mo 07524567 Cl. 428-690.
Nojima, Shigeki: See--
Kotani, Toshiya; Tanaka, Satoshi; Nojima, Shigeki; and Inoue, Soichi 07526748 Cl. 716-21.
NOK Corporation: See--
Kanda, Tsuyoshi 07523945 Cl. 277-549.
Nokia Corporation: See--
Astala, Arto; Ellila, Timo; Asunmaa, Petri; Djupsjobacka, Kimmo; Grundy, John; Saarikivi, Ilari; Savolainen, Sampo; Lindblom, Patrik; Frisk, Anders; Zimet, Martha; Ylonen, Otso; and Abrahamson, Thomas 07526762 Cl. 717-171.
Bestle, Nikolaj; Friis, Lars; Schroll, Esbjorn; Wood, Todd; Vad, Thomas; Schlunsen, Jacob; and Aresteen, Lars 07525597 Cl. 348-376.
Helkiö, Risto; Salmenkaita, Jukka-Pekka; and Moilanen, Pirjo 07523869 Cl. 235-472.01.
Hui, Ping; and Van Wonterghem, Jari 07525502 Cl. 343-835.
Hurtta, Tuija; Asokan, Nadarajah; Ginzboorg, Philip; Niemi, Valtteri; Poikselkä, Miikka; and Rantalainen, Timo M. 07526642 Cl. 713-155.
Ingimundarson, Jon Ingi; Regnier, Jean; Thorkelsson, Haraldur; and Vachon, Gaetan 07526563 Cl. 709-230.
Khartabil, Hisham; Isomäki, Markus; Niemi, Aki; and Veikkolainen, Simo 07526281 Cl. 455-416.
Leinonen, Marko; and Rousu, Seppo 07525481 Cl. 342-357.12.
Rodrigo, Anthony 07526547 Cl. 709-225.
Schwarz, Uwe; Hakalin, Petteri; and Tölli, Antti 07526289 Cl. 455-439.
Schwarz, Uwe; Muszynski, Peter; Holma, Harri; Korpela, Sari; and Numminen, Jussi 07525948 Cl. 370-350.
Sebire, Benoist 07525946 Cl. 370-343.
Tirkkonen, Olav; and Hottinen, Ari 07526708 Cl. 714-751.
Vatanparast, Ramin; Aarras, Mikko; Dunford, Steven O.; Fujii, Takaharu; Lainonen, Juhani; Nousiainen, Jaakko; Rantala, Jukka I.; Tanskanen, Pia; and Yamamoto, Tetsuya 07523546 Cl. 29-832.
Vesikivi, Petri 07526790 Cl. 725-135.
Nokia Siemens Networks GmbH & Co. KG: See--
Altham, Andrew; and Domokos, John 07525377 Cl. 330-136.
Horn, Guenther 07526273 Cl. 455-410.
Mecklenbraeuker, Christoph; and Slanina, Peter 07526307 Cl. 455-522.
Nokia Siemens Networks Oy: See--
Trossen, Dirk; and Chaskar, Hemant M. 07525940 Cl. 370-331.
Nolan, Daniel Aloysius: See--
Bookbinder, Dana Craig; Li, Ming-Jun; Murtagh, Michael Thomas; Nolan, Daniel Aloysius; Tandon, Pushkar; and Wang, Ji 07526166 Cl. 385-125.
Nomiya, Makoto: See--
Hayashi, Kenji; Koyama, Mikio; Shirose, Meizo; and Nomiya, Makoto 07524601 Cl. 430-108.4.
Nomizu, Yasuyuki; Sakuyama, Hiroyuki; Hara, Junichi; Matsuura, Nekka; Yano, Takanori; Kodama, Taku; Miyazawa, Toshio; Shinkai, Yasuyuki; and Nishimura, Takayuki, to Ricoh Company, Ltd. Image processing apparatus, image processing program, and storage medium 07526133 Cl. 382-232.
Nomoto, Tsuyoshi; and Yano, Tetsuya, to Canon Kabushiki Kaisha Isogenic strain line of bacterium for producing polyhydroxyalkanoate in which polyhydroxyalkanoate synthase gene is disrupted and method for producing polyhydroxyalkanoate using the same 07524659 Cl. 435-135.
Nomura, Hiroshi; Suzuka, Shinya; and Endo, Ken, to Hoya Corporation Optical image stabilizer 07526189 Cl. 396-55.
Nomura, Shinichiro; Kato, Takayuki; Atarashiya, Takao; Sugiyama, Hiroki; and Moritai, Satoshi, to Epson Imaging Devices Corporation Liquid crystal display device and manufacturing method thereof 07525605 Cl. 349-38.
Non Stop Hydro Excavation Ltd.: See--
Pobihushchy, Victor 07523570 Cl. 37-318.
Nordell, II, Benjamin Theodore: See--
Edelstein, Peter Seth; and Nordell, II, Benjamin Theodore 07525426 Cl. 340-539.13.
Nordex Energy GmbH: See--
Kabatzke, Wolfgang; and Richter, Kay 07525209 Cl. 290-44.
Noritz Corporation: See--
Hamada, Tetsurou; Hara, Hitoshi; Yoshitomi, Hideaki; Uehara, Kozo; and Takashima, Hiroaki 07523721 Cl. 122-31.1.
Norman, John Anthony Thomas: See--
Garg, Diwakar; Cheng, Hansong; Norman, John Anthony Thomas; Machado, Eduardo; and Ordejon, Pablo 07524533 Cl. 427-250.
Norman, Mark H.: See--
Doherty, Elizabeth M.; Zhu, Jiawang; Stec, Markian; Norman, Mark H.; Ognyanov, Vassil I.; Fotsch, Christopher H.; Chen, Ning; Chakrabarti, Partha P.; Pettus, Liping H.; Wang, Hui-Ling; Wang, Xianghong; and Arasasingham, Premilla 07524874 Cl. 514-345.
Norman, Terry: See--
MacQueen, Jason; Gastineau, Gary L.; Norman, Terry; Weber, Clifford J.; Alexander, Carol; and Baker, Charles A. 07526445 Cl. 705-36R.
Norris, Jeffrey J.; and Kluempke, Shari K., to ADC Telecommunications, Inc. Digital switching cross-connect module 07524211 Cl. 439-668.
Norsworthy, Steven R.; to STMicroelectronics N.V. Coder apparatus for resonant power conversion and method 07525455 Cl. 341-50.
Nortel Networks Limited: See--
He, Haixiang; Fedyk, Donald; and Dondeti, Lakshminath 07526658 Cl. 713-193.
Mancour, Timothy 07525974 Cl. 370-400.
Mcnicol, John D.; Wu, Kuang Tsan; and Comeau, Adrien A 07526211 Cl. 398-204.
Skalecki, Darek R.; Ashwood Smith, Peter J.; and Trobridge, Peter 07525907 Cl. 370-228.
North, Diane: See--
Ouderkirk, Andrew J.; Allen, Richard C.; Fleming, Patrick R.; North, Diane; Ruff, Andrew T.; and Thunhorst, Kristin L. 07526164 Cl. 385-115.
North, Todd Michael Networking cable with lighting system for cable tracing 07524082 Cl. 362-219.
Northrop Grumman Corporation: See--
Yu, Adam M. 07523517 Cl. 15-103.
Northrop Grumman, Inc.: See--
Meyer, A. Douglas 07526147 Cl. 385-12.
Northrop Grumman Systems Corporation: See--
Gigioli, George W.; Bope, David W.; Hairston, Peter P.; and Miller, Edward A. 07525660 Cl. 356-417.
Singh, Narsingh Bahadur; Pesetski, Aaron A.; Berghmans, Andre; Wagner, Brian P.; Kahler, David; Knuteson, David J.; and Thomson, Darren 07525099 Cl. 250-372.
Northwestern University: See--
Mirkin, Chad A.; Piner, Richard; and Hong, Seunghun 07524534 Cl. 427-258.
Nosella, Kimberly D.: See--
Vanbesien, Daryl; Moffat, Karen A.; Moore, Emily L.; Nosella, Kimberly D.; Sanders, David J.; Anderson, Christine; and Vong, Cuong 07524602 Cl. 430-108.7.
Nosov, Alexander E.: See--
El-Shimi, Ahmed; Nosov, Alexander E.; Muhlestein, Travis; Kenny, Patrick R.; and McCollum, Raymond W. 07526484 Cl. 707-10.
Notohamiprodjo, Hubertus; and Chen, Liang, to Marvell International Ltd. Power supply switching circuit for a halogen lamp 07525293 Cl. 323-235.
Nousiainen, Jaakko: See--
Vatanparast, Ramin; Aarras, Mikko; Dunford, Steven O.; Fujii, Takaharu; Lainonen, Juhani; Nousiainen, Jaakko; Rantala, Jukka I.; Tanskanen, Pia; and Yamamoto, Tetsuya 07523546 Cl. 29-832.
Nova Bus, Division de Groupe Volvo Canada Inc.: See--
Daneault, Louis-Philippe; Boudreau, Marc-André; and Beaulieu, Steve 07523993 Cl. 297-464.
Nova Measuring Instruments Ltd.: See--
Dishon, Giora; Finarov, Moshe; Nirel, Zvi; and Cohen, Yoel 07525634 Cl. 355-27.
Nova Oceanic Energy Systems: See--
Atilano Medina, Alvaro Jose; and Uzcategui Trinkl, Rafael 07525214 Cl. 290-53.
Nova, Richard C.: See--
Covey, Kevin K.; McGrath, Thomas J.; Sullivan, Joseph L.; Nygaard, Larry R.; and Nova, Richard C. 07526345 Cl. 607-142.
Novacek, Matthew: See--
Peck, Joseph E.; Novacek, Matthew; Andrade, Hugo A.; Petersen, Newton G.; Ranganathan, Ganesh; Sierer, Brian; and Pasquarette, John 07526535 Cl. 709-220.
Novack, Brian M.; to AT & T Intellectual Property I, L.P. Integrated disparate intelligent peripherals 07526080 Cl. 379-221.11.
Novak, Michael J.: See--
Dideriksen, Tedd; Feller, Chris; Harris, Geoffrey; Novak, Michael J.; and Olson, Kipley J. 07526505 Cl. 707-104.1.
NovAtel Inc.: See--
Fenton, Patrick C. 07526386 Cl. 702-14.
Novell, Inc.: See--
Friedman, Nathaniel Dourif 07526478 Cl. 707-6.
Taylor, Neil W. 07526811 Cl. 726-26.
Wright, Michael; Boucher, Peter; Nault, Gabe; Smith, Merrill; Jacobson, Sterling K.; Wood, Jonathan; and Mims, Robert 07526800 Cl. 726-11.
Novelle, Anthony J.; Raddatz, Claus D.; Long, Steven J.; and Tomerlin, Kenneth F., to Delphi Technologies, Inc. Multifunction switch assembly for power adjusted vehicle passenger seat 07525052 Cl. 200-5R.
Novellus Systems, Inc: See--
Gauri, Vishal; Humayun, Raashina; Lang, Chi-I; Huang, Judy H.; Barnes, Michael; and Shanker, Sunil 07524735 Cl. 438-436.
Novo Nordisk Health Care AG: See--
Zundel, Magali A.; Peschke, Bernd; Dörwald, Florencio Zaragoza; Fiil, Niels Peter; Johansen, Nils Langeland; and Stennicke, Henning Ralf 07524813 Cl. 514-3.
Novotney, Donald J.: See--
Schubert, Emily C.; Leung, Wang Chun; Lydon, Gregory T.; Krueger, Scott; Holden, Paul; Archibald, John; Bolton, Lawrence G.; Novotney, Donald J.; Filson, John B.; and Tupman, David 07526588 Cl. 710-105.
Tupman, David John; Farrar, Doug M.; Fisher, Jr., Joseph R.; Dorogusker, Jesse L.; and Novotney, Donald J. 07525216 Cl. 307-39.
Novotny, Lukas; and Brown, Thomas G., to University of Rochester System and method for high resolution optical imaging, data storage, lithography, and inspection 07526158 Cl. 385-33.
Noy, Oded; and Maso, Brian, to Path Reliability, Inc. Application manager for monitoring and recovery of software based application processes 07526685 Cl. 714-47.
Noyama, Hideo: See--
Miyazaki, Kunihiko; Iwamura, Mitsuru; Matsumoto, Tsutomu; Sasaki, Ryoichi; Yoshiura, Hiroshi; Aoshima, Hirokazu; Noyama, Hideo; Susaki, Seiichi; and Matsuki, Takeshi 07526645 Cl. 713-167.
Noyola, Joan M.: See--
Pekurovsky, Mikhail L.; Noyola, Joan M.; and Ciliske, Scott L. 07524377 Cl. 118-669.
Nozaki, Kazutoshi; Honda, Atsushi; Abe, Akiharu; and Ota, Hirofumi, to Toyota Jidosha Kabushiki Kaisha Control apparatus for vehicular automatic transmission 07524267 Cl. 477-130.
Nozaki, Tomohiro: See--
Kobayashi, Takato; Nozaki, Tomohiro; and Watanabe, Kimihiko 07525061 Cl. 200-520.
Nozawa, Natsuki: See--
Kimura, Akihiro; and Nozawa, Natsuki 07523797 Cl. 180-65.2.
Nozoe, Mari: See--
Nishiyama, Hidetoshi; Nozoe, Mari; and Shinada, Hiroyuki 07526747 Cl. 716-21.
nQUEUE, Inc.: See--
Zwiefelhofer, Ray 07526212 Cl. 399-8.
Zwiefelhofer, Ray 07526213 Cl. 399-8.
NTN Corporation: See--
Komori, Kazuo 07524115 Cl. 384-476.
Nakamura, Shohei; Hioki, Shouichi; Ito, Hiroyoshi; Mayumi, Tooru; and Sasabe, Mitsuo 07525430 Cl. 340-572.1.
NTT DoCoMo, Inc.: See--
Abe, Tetsushi; Shi, Hui; Asai, Takahiro; and Yoshino, Hitoshi 07525939 Cl. 370-328.
Asai, Mao; Watanabe, Nobuyuki; and Tsuda, Masayuki 07526766 Cl. 718-103.
Maeda, Noriyuki; Atarashi, Hiroyuki; and Sawahashi, Mamoru 07526011 Cl. 375-141.
Matta, Johnny M. 07525923 Cl. 370-252.
Nishida, Katsutoshi; Okagawa, Takatoshi; and Jo, Manhee 07526569 Cl. 709-239.
Roman, Manuel; and Islam, Nayeem 07526771 Cl. 719-316.
Nuccetelli, Gary L.: See--
Axtell, III, Enos A.; Sakoske, George E.; Swiler, Daniel R.; Hensel, Michael; Baumann, Martin; Matalka, David J.; and Nuccetelli, Gary L. 07524531 Cl. 427-226.
NuFlare Technology, Inc.: See--
Suzuki, Junichi; Emi, Keiko; and Abe, Takayuki 07525110 Cl. 250-492.22.
Numed, Inc.: See--
Tower, Allen J. 07524302 Cl. 604-96.01.
Numminen, Jussi: See--
Schwarz, Uwe; Muszynski, Peter; Holma, Harri; Korpela, Sari; and Numminen, Jussi 07525948 Cl. 370-350.
Nunes, Jack: See--
Martinez, Robert E.; Goyen, Todd; and Nunes, Jack 07525222 Cl. 307-326.
Nunogawa, Yasuhiro: See--
Kohjiro, Iwamichi; Nunogawa, Yasuhiro; Kikuchi, Sakae; Kondo, Shizuo; Adachi, Tetsuaki; Kagaya, Osamu; Sekine, Kenji; Hase, Eiichi; and Yamashita, Kiichi 07525813 Cl. 361-760.
Nunokawa, Hirokazu; to Seiko Epson Corporation Printing method, test pattern, method of producing test pattern, and printing apparatus 07524012 Cl. 347-19.
Nunoue, Shinya: See--
Hattori, Yasushi; Saito, Shinji; Nunoue, Shinya; Yamamoto, Masahiro; Shida, Naomi; Kaneko, Kei; and Hatakoshi, Genichi 07525127 Cl. 257-99.
Nussbaum, Howard S.: See--
Davidoff, Loan T.; Nussbaum, Howard S.; and Chia, Jackson Y. 07526052 Cl. 375-350.
Nuvera Fuel Cells Europe, S.r.l.: See--
Facchi, Daniele; Trifoni, Eduardo; Toro, Antonino; Merlo, Luca; Lenardon, Matteo; and Binelli, Paolo 07524574 Cl. 429-38.
Nvidia Corporation: See--
Azar, Hassane S.; and Diard, Franck R. 07525548 Cl. 345-504.
Danilak, Radoslav 07526604 Cl. 711-112.
Diard, Franck R. 07525547 Cl. 345-502.
Diard, Franck R.; Young, Wayne Douglas; and Johnson, Philip Browning 07525549 Cl. 345-505.
Duluk, Jr., Jerome F.; Lew, Stephen D.; and Nickolls, John R. 07526634 Cl. 712-216.
Mandal, Manas; Tsu, William P.; Case, Colyn S.; and Kaul, Ashish Kishen 07526593 Cl. 710-310.
Newhall, Jr., William P.; and Van Dyke, James M. 07525551 Cl. 345-587.
Overby, Mark A.; and Currid, Andrew 07526619 Cl. 711-154.
Soni, Tejvansh S. 07526666 Cl. 713-500.
Zhang, Lihua; Tonge, Richard; Sequeira, Dilip; and Maher, Monier 07526456 Cl. 706-10.
NXP, B.V.: See--
Barenbrug, Bart Gerard Bernard; and Meinds, Kornelis 07525553 Cl. 345-619.
De Jongh, Petra Elisabeth; Roks, Edwin; Wolters, Robertus Adrianus Maria; and Peek, Hermanus Leonardus 07525330 Cl. 324-763.
Van Eijndhoven, Josephus Theodorus Johannes; Rutten, Martijn Johan; and Pol, Evert-Jan Daniël 07526613 Cl. 711-133.
Nya Hamlet Pharma AB: See--
Svanborg, Catharina; Hakansson, Per Anders; and Svensson, Malin Wilhelmina 07524932 Cl. 530-366.
Nygaard, Larry R.: See--
Covey, Kevin K.; McGrath, Thomas J.; Sullivan, Joseph L.; Nygaard, Larry R.; and Nova, Richard C. 07526345 Cl. 607-142.
Nyroenen, Tommi: See--
Hirvelae, Leena; Johansson, Nina; Koskimies, Pasi; Pentikaeinen, Olli Taneli; Nyroenen, Tommi; Salminen, Tiina Annamaria; Johnson, Mark Stuart; Lehtovuori, Pekka; Saarenketo, Pauli; Van Steen, Bartholomeus Johannes; Thole, Heinrich-Hubert; Unkila, Mikko; Messinger, Josef; Kiviniemi, Johanna; Pirkkala, Lila; and Husen, Bettina 07524853 Cl. 514-267.
Nyse Alternext US LLC: See--
MacQueen, Jason; Gastineau, Gary L.; Norman, Terry; Weber, Clifford J.; Alexander, Carol; and Baker, Charles A. 07526445 Cl. 705-36R.