LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 28th DAY OF April, 2009
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).
n&k Technology, Inc.: See--
Chen, Shuqiang; and Li, Guoguang
07525672 Cl. 356-625.
Na, Yoo Sam: See--
Hwang, Hyeon Seok; Na, Yoo Sam; Kim, Moon Sun; Jo, Byeong Hak; and Park, Kyoung Seok
07525395 Cl. 333-81R.
Naam, Ramez; and Weare, Christopher B., to Microsoft Corporation System and method for generating attribute-based selectable search extension
07526476 Cl. 707-5.
Nabok, Alexandr Andreevich; to Zakharov, Alexandr Sergeevich Device for shredding wornout tires
07523877 Cl. 241-1.
Naddaka, Vladimir; Davidi, Guy; Saeed, Shady; Arad, Oded; and Kaspi, Joseph, to Chemagis Ltd. Highly pure cilostazol and an improved process for obtaining same
07524960 Cl. 546-158.
Nadeau, Larry: See--
Bue, Brian Lo; Shively, II, Darrell Myers; and Nadeau, Larry
07526533 Cl. 709-220.
Nadeau, Thomas D.; and Koushik, A. S. Kiran, to Cisco Technology, Inc. Method and apparatus for controlled access of requests from virtual private network devices to managed information objects using simple network management protocol and multi-topology routing
07526480 Cl. 707-9.
Nadzan, Alex Michael: See--
Arrhenius, Thomas; Chen, Mi; Chang, Jie Fei; Huang, Yujin; Nadzan, Alex Michael; Penuliar, Richard Julius; Wallace, David Mark; Zhang, Lin; Lopaschuk, Gary D.; and Dyck, Jason R.
07524969 Cl. 548-190.
Nagai, Shintaro: See--
Sato, Masaaki; Nagai, Shintaro; Oi, Hideaki; and Yokomitsu, Sumio
07525927 Cl. 370-254.
Nagai, Takeshi; and Haga, Ryo, to Kabushiki Kaisha Toshiba Semiconductor integrated circuit
07525871 Cl. 365-240.
Nagai, Tomohiro; to Murata Manufacturing Co., Ltd. Radar apparatus
07525479 Cl. 342-158.
Nagano, Hajime; Mizushima, Ichiro; and Miyano, Kiyotaka, to Kabushiki Kaisha Toshiba Semiconductor substrate, manufacturing method therefor, and semiconductor device
07525154 Cl. 257-347.
Nagano, Shingo; to Mitsubishi Electric Corporation Liquid crystal display and method for manufacturing the same
07525626 Cl. 349-141.
Nagano, Susumu: See--
Okamoto, Tetsushi; Tsuchiya, Hiroyoshi; Sawa, Fumio; Iwata, Noriyuki; Koyama, Mitsuhiko; Suzuki, Yukio; Suzuki, Akihiko; Ootaka, Tooru; Ishii, Shigehito; and Nagano, Susumu
07524557 Cl. 428-323.
Nagano, Takahiro: See--
Kondo, Tetsujiro; Ishibashi, Junichi; Sawao, Takashi; Wada, Seiji; Miyake, Tohru; Nagano, Takahiro; and Fujiwara, Naoki
07525574 Cl. 348-208.4.
Nagano, Tetsuo: See--
Nagano, Tetsuo; Urano, Yasuteru; Kenmoku, Suguru; and Kanda, Kohjiro
07524974 Cl. 549-224.
Takakura, Hideo; Urano, Yasuteru; and Nagano, Tetsuo
07524876 Cl. 514-367.
Nagano, Tetsuo; Urano, Yasuteru; Kenmoku, Suguru; and Kanda, Kohjiro, to Nagano, Tetsuo Fluorescent probe
07524974 Cl. 549-224.
Nagaoka, Nobuharu; Watanabe, Masahito; and Hattori, Hiroshi, to Honda Motor Co., Ltd. Vehicle surroundings monitoring apparatus
07526104 Cl. 382-104.
Nagarajan, Radhakrishnan L.: See--
Welch, David F.; Kish, Jr., Fred A.; Nagarajan, Radhakrishnan L.; Nilsson, Alan C.; and Taylor, Robert B.
07526150 Cl. 385-14.
Nagasaka, Akio: See--
Miura, Naoto; Nagasaka, Akio; and Miyatake, Takafumi
07526111 Cl. 382-126.
Nagasawa, Kazuo; Hashimoto, Yuichi; and Kato, Yuko, to Teijin Pharma Limited Vitamin D3 lactam derivative
07524980 Cl. 552-653.
Nagase, Kenji: See--
Yoshikawa, Kazutaka; Nagase, Kenji; Minami, Toshiaki; and Tomita, Hiroshi
07525451 Cl. 340-995.13.
Nagashima, James M.: See--
Patel, Nitinkumar R.; Bae, Bon-Ho; and Nagashima, James M.
07525269 Cl. 318-432.
Nagashima, Tatsuo; Sugimoto, Naoki; Ohara, Seiki; and Hasegawa, Tomoharu, to Asahi Glass Company, Limited Non-lead optical glass and optical fiber
07524781 Cl. 501-50.
Nagata, Satoru: See--
Kaneda, Hideyuki; Miyamae, Yoshitaka; and Nagata, Satoru
07524804 Cl. 510-311.
Nagata, Seiji: See--
Kamijoh, Kohichi; Nagata, Seiji; and Taniguchi, Masaaki
07526099 Cl. 382-100.
Nagata, Yoshihiro; and Konno, Toshio, to Toyo Technology Inc. Wave activated power generation device and wave activated power generation plant
07525213 Cl. 290-53.
Nagatomi, Akira: See--
Sakane, Kenji; and Nagatomi, Akira
07524437 Cl. 252-301.4F.
Nagatomi, Kenji; and Kajiyama, Seiji, to Sanyo Electric Co., Ltd. Optical pickup device
07525897 Cl. 369-112.01.
Nagle, Pierce Joseph: See--
McGrath, Finbarr Joseph; and Nagle, Pierce Joseph
07526260 Cl. 455-127.2.
Nair, Venugopal K.; Baigent, Susan Jean; and Currie, Richard John William, to Wyeth Assay methods for detection of a virus in an avian tissue sample
07524651 Cl. 435-91.2.
Naito, Ryoji: See--
Barry, Keith; Ebbeling, Daniel; Kubota, Eugene; McCray, Dennis; Naito, Ryoji; and Sanchez, Mario
07523898 Cl. 248-71.
Najemy, Daniel D.: See--
Carreras, Ricardo F.; Gomes-Casseres, Glenn; Hertzberg, Marc; Najemy, Daniel D.; and Wakeland, Ray
07525440 Cl. 340-573.1.
Nakaaki, Hajime: See--
Shinsho, Masami; and Nakaaki, Hajime
07523800 Cl. 180-219.
Nakabe, Futoshi: See--
Ebara, Hiromi; Kawano, Shinji; and Nakabe, Futoshi
07526625 Cl. 711-163.
Nakadai, Kazuhiro; Okuno, Hiroshi; and Kitano, Hiroaki, to Honda Motor Co., Ltd. Robotics visual and auditory system
07526361 Cl. 700-245.
Nakafuji, Atsushi: See--
Takagaki, Hiromitsu; Fujita, Takashi; Nakafuji, Atsushi; Tamura, Hirohmi; Kunii, Hiroyuki; and Ue, Kohji
07526242 Cl. 399-307.
Nakagaki, Johji; Asahara, Akihiro; Kimura, Hideo; Kitahara, Hiroaki; Nishiwaki, Tatsuya; Shiota, Yasuhiko; and Yamada, Takeshi, to International Business Machines Corporation Apparatus and method for forming an alignment layer
07525107 Cl. 250-492.21.
Nakagawa, Kaku: See--
Mae, Tatsumasa; Tsukagawa, Misuzu; Kitahara, Mikio; Nakagawa, Kaku; Kitamura, Shiro; Ueda, Yasuyoshi; Kuroda, Minpei; Mimaki, Yoshihiro; and Sashida, Yutaka
07524975 Cl. 549-405.
Nakagawa, Toshiyuki; Shimpuku, Yoshihide; and Narahara, Tatsuya, to Sony Corporation Sync signal insertion that breaks a maximum bit-run and has a particular detection distance between two or more sync patterns
07526032 Cl. 375-253.
Nakagawa, Yasutada: See--
Igarashi, Kenji; Shimizu, Masaharu; Wakabayashi, Akiji; Saito, Yasuo; Iso, Machiko; Kishi, Tsuguo; Sakuta, Shigeru; Kitamura, Masaru; Doji, Ryuhachiro; Ide, Hideki; Nambu, Shuya; Yamazaki, Masahiko; Yamada, Katsuya; and Nakagawa, Yasutada
07526070 Cl. 378-149.
Nakagawa, Yoshihito: See--
Ozaki, Satoru; Homma, Hisao; Urabe, Kiichiro; Nakagawa, Yoshihito; and Tamura, Keishi
07526618 Cl. 711-154.
Nakagawa, Yoshinori: See--
Yamada, Masaaki; Horike, Masanori; Miyaguchi, Yohichiroh; Kondoh, Nobuaki; and Nakagawa, Yoshinori
07526238 Cl. 399-279.
Nakagawara, Minoru; to NEC Medical Systems, Ltd. Cuff-block for finger arterial blood pressure monitor
07524291 Cl. 600-499.
Nakagiri, Koji: See--
Mori, Yasuo; Nakagiri, Koji; and Nishikawa, Satoshi
07525682 Cl. 358-1.18.
Nakahara, Naoto; to Hoya Corporation Focus detection method and focus detection apparatus
07526192 Cl. 396-104.
Nakahara, Yuji: See--
Ugai, Yoshikazu; Iwami, Taizo; and Nakahara, Yuji
07524453 Cl. 419-38.
Nakajima, Jun; and Bodas, Devadatta V., to Intel Corporation Performance state-based thread management
07526661 Cl. 713-320.
Nakajima, Mamoru; Yamamoto, Masataka; Saitou, Naoki; and Taguchi, Katsunori, to Honda Giken Kogyo Kabushiki Kaisha Parts list system used for part number management and method for preparing the same
07526441 Cl. 705-29.
Nakajima, Tomohiro; Kojima, Akira; Yamashiro, Ikuko; Suzuki, Seizo; Amada, Taku; Hayashi, Yoshinori; and Shimada, Kazuyuki, to Ricoh Company, Ltd. Optical scanner and image forming apparatus
07525561 Cl. 347-234.
Nakajo, Hironori; and Sasaki, Michio, to Kabushiki Kaisha Toshiba Miniature camera module with lens containing image sensor
07525096 Cl. 250-370.08.
Nakamae, Takayuki: See--
Nakashima, Eishin; Iida, Kiyonobu; Tsuda, Hiroyuki; Morikawa, Akiyoshi; Kobayashi, Noriaki; Ohno, Masaharu; Kawasoe, Hiroyuki; Ozaki, Yuki; Tokunaga, Takahiro; Nakamae, Takayuki; and Takasaki, Mineo
07523726 Cl. 123-41.7.
Nakamoto, Ken-ichiro; Ohashi, Syunsuke; Yamamoto, Yuji; Sakanoue, Kenji; Itoh, Chika; and Yasukohchi, Tohru, to NOF Corporation Modified bio-related substance, process for producing the same, and intermediate
07524875 Cl. 514-359.
Nakamura, Akio; Seki, Fujio; Funakoshi, Katsuya; and Miyatsu, Keiji, to Fujitsu Component Limited Movable console device
07524004 Cl. 312-223.2.
Nakamura, Charles: See--
Caimi, Perry; and Nakamura, Charles
07524660 Cl. 435-159.
Nakamura, Go: See--
Aoki, Kunimitsu; Furuya, Yoshiyuki; Kageyama, Hideaki; and Nakamura, Go
07525734 Cl. 359-631.
Nakamura, Junichi: See--
Haga, Tomohiro; and Nakamura, Junichi
07524113 Cl. 384-123.
Takayanagi, Isao; and Nakamura, Junichi
07525588 Cl. 348-314.
Nakamura, Katsunori: See--
Fujii, Noriaki; Nakamura, Katsunori; and Yonekawa, Akiyuki
07523727 Cl. 123-90.17.
Nakamura, Minoru: See--
Aoyama, Kazunari; Nakamura, Minoru; and Komatsu, Takaaki
07525263 Cl. 318-77.
Nakamura, Osamu; and Akiba, Mai, to Semiconductor Energy Laboratory Co., Ltd. Test element group, method of manufacturing a test element group, method of testing a semiconductor device, and semiconductor device
07525118 Cl. 257-48.
Nakamura, Ryosuke; to Seiko Epson Corporation Optical device
07525713 Cl. 359-260.
Nakamura, Sensaburo: See--
Sugimoto, Hiroyuki; Nakamura, Sensaburo; and Minami, Nobuyuki
07525601 Cl. 348-578.
Nakamura, Shohei; Hioki, Shouichi; Ito, Hiroyoshi; Mayumi, Tooru; and Sasabe, Mitsuo, to NTN Corporation Machine components having IC tags, quality control method and abnormality detecting system
07525430 Cl. 340-572.1.
Nakamura, Takeshi: See--
Kozakai, Kenji; Nakamura, Takeshi; Ishii, Tatsuya; Tsunoda, Motoyasu; Iguchi, Shinya; and Maruyama, Junichi
07525852 Cl. 365-189.09.
Nakamura, Tomoaki: See--
Abe, Kenji; Nakamura, Tomoaki; and Zaima, Tsutomu
07526082 Cl. 379-433.11.
Nakanishi, Akinobu: See--
Matsumoto, Yoshiyuki; Imai, Minoru; Sawai, Yoshiyuki; Takeuchi, Susumu; Nakanishi, Akinobu; Minamizono, Kunio; and Yokoyama, Tomonori
07524841 Cl. 514-223.2.
Nakanishi, Kazuo: See--
Livshits, Vitaliy Arkadievich; Zakataeva, Natalia Pavlovna; Nakanishi, Kazuo; Aleshin, Vladimir Veniaminovich; Troshin, Petr Vladimirovich; and Tokhmakova, Irina Lyvovna
07524656 Cl. 435-106.
Nakanishi, Satoshi: See--
Arai, Hitoshi; Matsumura, Tsutomu; Ishida, Hiroshi; Yamaura, Yosuke; Aratake, Seiji; Ohshima, Etsuo; Yanagawa, Koji; Miyama, Motoki; Suzuki, Koji; Kawabe, Ari; Nakanishi, Satoshi; Kobayashi, Katsuya; Sato, Takashi; Miki, Ichiro; Ueno, Kimihisa; Fujii, Shinya; and Iwase, Miho
07524852 Cl. 514-264.11.
Nakanishi, Toru; Kondo, Kazunori; Hoshida, Shigehiro; and Amano, Tadashi, to Shin-Etsu Chemical Co., Ltd. Flame retardant adhesive composition, and adhesive sheet, coverlay film and flexible copper-clad laminate using same
07524394 Cl. 156-330.
Nakanishi, Toru; Kondo, Kazunori; Hoshida, Shigehiro; and Amano, Tadashi, to Shin-Etsu Chemical Co., Ltd. Flame retardant adhesive composition, and adhesive sheet, coverlay film and flexible copper-clad laminate using same
07524563 Cl. 428-416.
Nakano, Akinori: See--
Kawahara, Jun; Kinoshita, Keizo; Kunimi, Nobutaka; and Nakano, Akinori
07524908 Cl. 526-279.
Nakano, Hiroyuki; and Fukashiro, Yasuyuki, to Hitachi Communication Technologies, Ltd. Wavelength-division multiplexing optical transmitter
07526200 Cl. 398-34.
Nakano, Susumu: See--
Hayakawa, Hiroshi; Nakano, Susumu; and Takahashi, Kentaro
07526130 Cl. 382-183.
Nakano, Toshihiro: See--
Fukao, Takeshi; and Nakano, Toshihiro
07524238 Cl. 451-450.
Nakano, Yasushi: See--
Sakamoto, Kei; Nakano, Yasushi; Kondou, Yoshihisa; Yamada, Toshiro; and Nemoto, Hisao
07524978 Cl. 549-465.
Nakano, Yosuke: See--
Takeda, Kazuhisa; Nakano, Yosuke; and Sekizawa, Tsuyoshi
07523934 Cl. 271-314.
Nakao, Seigo; and Tanaka, Yasuhiro, to Sanyo Electric Co., Ltd. Method and apparatus for transmitting signals, method and apparatus for receiving the signals, and communication system utilizing the same
07526258 Cl. 455-101.
Nakao, Yoshizumi: See--
Toyoda, Takashi; Nakao, Yoshizumi; and Masaki, Yasuo
07525081 Cl. 250-208.1.
Nakashima, Atsuhisa; to Brother Kogyo Kabushiki Kaisha Recording apparatus
07524049 Cl. 347-104.
Nakashima, Eishin; Iida, Kiyonobu; Tsuda, Hiroyuki; Morikawa, Akiyoshi; Kobayashi, Noriaki; Ohno, Masaharu; Kawasoe, Hiroyuki; Ozaki, Yuki; Tokunaga, Takahiro; Nakamae, Takayuki; and Takasaki, Mineo, to Kubota Corporation Air-cooled V-shaped engine
07523726 Cl. 123-41.7.
Nakashima, Gosuke: See--
Umeda, Hiroyuki; Nakashima, Gosuke; and Yoshida, Noriyuki
07523879 Cl. 241-34.
Nakashima, Shigeo; and Sato, Takehiko, to Canon Kabushiki Kaisha Optical apparatus having a driving source for driving a lens in an optical axis direction
07525235 Cl. 310-328.
Nakata, Hiroyuki: See--
Mukai, Yasushi; Kawamoto, Atsuhiro; Ikeda, Tatsuya; Nakata, Hiroyuki; and Kowa, Masaru
07525066 Cl. 219-124.01.
Nakaya, Kazuhiko; to RICOH Company Ltd. Method and apparatus for image reading capable of obtaining adequate white reference data for shading correction
07525692 Cl. 358-461.
Nakayama, Junichi: See--
Tsuchiya, Tomihisa; Ohkubo, Kenji; Yano, Masaaki; Taira, Iwao; and Nakayama, Junichi
07523742 Cl. 123-470.
Nakayama, Masahiko: See--
Kai, Tadashi; Nakayama, Masahiko; Ikegawa, Sumio; Fukuzumi, Yoshiaki; and Iwata, Yoshihisa
07525837 Cl. 365-158.
Nakayama, Tomonobu: See--
Aono, Masakazu; Hasegawa, Tsuyoshi; Terabe, Kazuya; and Nakayama, Tomonobu
07525410 Cl. 338-309.
Nakazato, Norio; and Sudo, Kimihiko, to Hitachi, Ltd. Semiconductor light source device
07525191 Cl. 257-713.
Nakazato, Satoshi; to NEC Corporation Multiport cache memory which reduces probability of bank contention and access control system thereof
07526612 Cl. 711-131.
Nakazawa, Akira: See--
Berry, Norman Micheal; Nakazawa, Akira; and Silverbrook, Kia
07524017 Cl. 347-29.
Silverbrook, Kia; Berry, Norman Michael; Nakazawa, Akira; Mackey, Paul Ian; and Jackson, Garry Raymond
07524023 Cl. 347-49.
Silverbrook, Kia; Berry, Norman Micheal; Jackson, Garry Raymond; and Nakazawa, Akira
07524021 Cl. 347-42.
Silverbrook, Kia; Nakazawa, Akira; Hibbard, Christopher; Mackey, Paul Ian; Berry, Norman Micheal; and Jackson, Garry Raymond
07524016 Cl. 347-29.
Silverbrook, Kia; Nakazawa, Akira; Hibbard, Christopher; MacKey, Paul Ian; Berry, Norman Micheal; and Jackson, Garry Raymond
07524043 Cl. 347-84.
Nakazono, Keisuke; and Ueno, Akira, to Olympus Corporation Image processing apparatus and image processing method
07525577 Cl. 348-231.3.
Nalamliang, Tanong: See--
Yamamoto, David T.; Rapues, Neil T.; and Nalamliang, Tanong
07524000 Cl. 303-126.
Nam, Hyo-Rak: See--
Mun, Joong-Hyun; Song, Jang-Kun; Choi, Yong-Woo; Kim, Bo-Sung; Jung, Kwan-Wook; Lee, Jung-Ho; and Nam, Hyo-Rak
07525621 Cl. 349-129.
Nam, Seung Hee: See--
Cho, Heung Lyul; Yoo, Soon Sung; Kwon, Oh Nam; and Nam, Seung Hee
07525619 Cl. 349-126.
Lee, Kyoung-Mook; Choi, Nack-Bong; Nam, Seung-Hee; and Oh, Jae-Young
07525630 Cl. 349-152.
Lee, Kyoung Mook; Nam, Seung Hee; and Oh, Jae Young
07525120 Cl. 257-59.
Nam, Seung-Hoon: See--
Kim, Kyeongyeon; Lee, Chungyong; Chung, Jae-Hak; Shim, Seijoon; and Nam, Seung-Hoon
07526039 Cl. 375-267.
Nambu, Shuya: See--
Igarashi, Kenji; Shimizu, Masaharu; Wakabayashi, Akiji; Saito, Yasuo; Iso, Machiko; Kishi, Tsuguo; Sakuta, Shigeru; Kitamura, Masaru; Doji, Ryuhachiro; Ide, Hideki; Nambu, Shuya; Yamazaki, Masahiko; Yamada, Katsuya; and Nakagawa, Yasutada
07526070 Cl. 378-149.
Namekawa, Takumi; Kitamura, Yoshio; and Shinobu, Hidaka, to Sony Corporation Image forming apparatus
07524121 Cl. 400-625.
Namgoong, Ji-na; Hwang, Kyu-youn; and Shim, Jeo-young, to Samsung Electronics Co., Ltd. Method of storing substrate having active group or probe molecule immobilized thereon using UV film, method of producing microarray using the UV film, and substrate having the UV film attached thereto
07524662 Cl. 435-174.
Namiki, Hiroaki: See--
Kayama, Naonori; Namiki, Hiroaki; and Yoshimura, Shotaro
07526244 Cl. 399-405.
Namiki Seimitsu Houseki Kabuhsiki Kaisha: See--
Uchiumi, Hidehiro; Suzuki, Toshio; Aoyagi, Tomohide; Kogawa, Takeshi; and Morita, Kazuo
07525225 Cl. 310-81.
Nan, Nan: See--
Nguyen, David; Nan, Nan; Ni, Jim Chin-Nan; Lee, Charles Chung; and Shen, Ming-Shiang
07524198 Cl. 439-131.
Nan Ya Printed Circuit Board Corporation: See--
Hsu, Hung-En; Wang, Binwei; and Ho, Shing-Fun
07524429 Cl. 216-18.
Nangle, Leslie A.: See--
Doring, Volker; Nangle, Leslie A.; Hendrickson, Tamara L.; Crecy-Lagard, Valerie De; Schimmel, Paul; and Marliere, Philippe
07524646 Cl. 435-69.1.
Nanjo, Yusuke: See--
Suzaki, Mitsuhiro; Nanjo, Yusuke; Minato, Atsuo; and Arita, Shinichi
07525729 Cl. 359-557.
Nannerup, Lars: See--
Torring, Ditte; Lauersen, Christian; Baekgard, Arne; Nannerup, Lars; Nielsen, Flemming K.; Schmidt, Richard D.; and Jorgensen, Gert
07523718 Cl. 119-203.
Nannor Technologies: See--
Zhang, Shuo; and Jia, Yongbo
07526746 Cl. 716-18.
Nanologix, Inc.: See--
Nanomist Systems, LLC: See--
Nanyang Technological University: See--
Chen, Tu Pei; and Ng, Chi Yung
07525147 Cl. 257-314.
Nappa, Mario Joseph; Rao, Velliyur Nott Mallikarjuna; and Sievert, Allen Capron, to E. I. du Pont de Nemours and Company Process for the production of 1,1,1,3,3,3-hexafluoropropane
07524999 Cl. 570-169.
Napper, Jonathon Leigh: See--
Koubaroulis, Dimitrios; Napper, Jonathon Leigh; Lapstun, Paul; and Silverbrook, Kia
07526128 Cl. 382-179.
Narahara, Tatsuya: See--
Nakagawa, Toshiyuki; Shimpuku, Yoshihide; and Narahara, Tatsuya
07526032 Cl. 375-253.
Narasimhan, Partha: See--
Iyer, Pradeep J.; Narasimhan, Partha; Melkote, Keerti G.; and Taylor, John
07525943 Cl. 370-338.
Narayan-Sarathy, Sridevi: See--
Gould, Michael L.; Hammond, Terry E.; and Narayan-Sarathy, Sridevi
07524565 Cl. 428-441.
Närhi, Harri: See--
Niiranen, Erkki; Närhi, Harri; Puoskari, Jukka; and Koskela, Pertti
07526263 Cl. 455-130.
Narita, Masaaki; Kawamura, Nobuo; Hirohata, Kiyomi; and Hoshino, Ryuichi, to Hitachi, Ltd. Method and system of database management with shared area
07526469 Cl. 707-2.
Naruse, Yuuichi: See--
Matsui, Kenichi; Yagi, Takeshi; Naruse, Yuuichi; Murayama, Junichi; and Kaneda, Masaki
07525919 Cl. 370-238.
Narvel, James; to Monsanto Technology LLC Soybean variety 4614131
07525017 Cl. 800-312.
Nascimento Sobrinho, Elói Ricardo: See--
Dall'Agnol, Alcir; Osvaldo Baldus, Ari; Dariva, Cláudio; Nascimento Sobrinho, Elói Ricardo; and Vladimir De Oliveira, José
07524982 Cl. 554-174.
Naseh, Zeeshan; and Gundi, Vinay, to Cisco Technology, Inc. Disaster recovery for active-standby data center using route health and BGP
07525906 Cl. 370-221.
Nashimoto, Keiichi; and Sugahara, Yoshiyuki, to EpiPhotonics Corp. Optical amplifier and fabrication method thereof
07526176 Cl. 385-141.
National Chiao Tung University: See--
Chang, Shu-Wei; Hwang, Wei; Chang, Ming-Hung; and Huang, Po-Tsang
07525827 Cl. 365-49.1.
National Institute of Information and Communications Technology: See--
Kawanishi, Tetsuya; and Izutsu, Masayuki
07526209 Cl. 398-187.
National Instruments Corporation: See--
Peck, Joseph E.; Novacek, Matthew; Andrade, Hugo A.; Petersen, Newton G.; Ranganathan, Ganesh; Sierer, Brian; and Pasquarette, John
07526535 Cl. 709-220.
National Oilwell, Inc.: See--
El-Rayes, Kosay I.; Shwets, Peter J.; and Melhem, Nazeeh
07523792 Cl. 175-92.
National-Oilwell, L.P.: See--
Aday, James C.; Drzewiecki, Lopek; Kubinski, Michael J.; and Riley, Andrew Dale
07523694 Cl. 92-171.1.
National Presto Industries, Inc.: See--
Hedrington, James A.
07523697 Cl. 99-348.
National Research Council of Canada: See--
Zheng, Zhifu; Uchacz, Tina; and Taylor, Janet
07524943 Cl. 536-23.1.
National Semiconductor Corporation: See--
Henry, Paul Michael
07525365 Cl. 327-307.
Hopper, Peter J.; Hwang, Kyuwoon; Smeys, Peter I.; and Papou, Andrei
07525323 Cl. 324-691.
Lorenz, Perry Scott
07524107 Cl. 374-170.
Maloberti, Franco; Yousefi, Masood; and Bahai, Ahmad
07525464 Cl. 341-143.
Sallaway, Peter J.; and Raghavan, Sreen
07526053 Cl. 375-350.
Taft, Robert Callaghan; and Menkus, Christopher Alan
07525358 Cl. 327-175.
Ziazadeh, Ramsin M.
07525348 Cl. 327-65.
National Taiwan University: See--
Liu, Zhi-Yuan; and Chen, Yi-Jan
07525388 Cl. 330-296.
National Taiwan University of Science and Technology: See--
National University Corporation Shizuoka University: See--
Sumiya, Masatomo; Fuke, Shunro; Nihashi, Tokuaki; and Hagino, Minoru
07525131 Cl. 257-184.
Natsume, Kazuma: See--
Takano, Gaku; Yamano, Chiharu; Natsume, Kazuma; Miyake, Yasuyuki; and Sakuma, Yasushi
07525478 Cl. 342-145.
Natural Selection, Inc.: See--
Naulin, Jean-Yves: See--
Vennetier, Perig; and Naulin, Jean-Yves
07524098 Cl. 362-555.
Nault, Gabe: See--
Wright, Michael; Boucher, Peter; Nault, Gabe; Smith, Merrill; Jacobson, Sterling K.; Wood, Jonathan; and Mims, Robert
07526800 Cl. 726-11.
Nause, Jeffrey E.; and Ganesan, Shanthi, to Cermet, Inc. Zinc-oxide-based double-heterostructure light-emitting diode
07525128 Cl. 257-102.
Nave, Shawn M.; Thorn, Jeffrey L.; and Yardy, Raymond, to International Business Machines Corporation Accessor and rails for a data storage library
07525756 Cl. 360-92.1.
Naxellent, LLC: See--
Naya, Hidemitsu; Tomiyoshi, Rikio; Moriyama, Shigeo; Kikuchi, Mutsumi; and Shimamura, Kotaro, to Hitachi, Ltd. Semiconductor production system
07526352 Cl. 700-95.
Nayak, Chetan: See--
Freedman, Michael; Nayak, Chetan; and Shtengel, Kirill
07525202 Cl. 257-798.
Naylor, Charles A.: See--
Tsikos, Constantine J.; Schnee, Michael D.; Zhu, Xiaoxun; Amundsen, Thomas; Naylor, Charles A.; Dobbs, Russell Joseph; and Knowles, Carl Harry
07523863 Cl. 235-454.
Neale, Richard S.: See--
Román, Kendyl A.; Hoomani, Cyrus J.; and Neale, Richard S.
07526029 Cl. 375-240.23.
Nease, Joseph L.; and Owsley Nease, Karen Method and apparatus for image interpretation into sound
07525034 Cl. 84-485R.
Nebashi, Satoshi: See--
Fukushima, Hitoshi; Nebashi, Satoshi; Ishida, Masaya; Huck, Wilhelm J S; Holmes, Andrew B; and Luscombe, Christine K
07524998 Cl. 570-129.
Nebeker, Michael O.: See--
LaConte, Richard J.; and Nebeker, Michael O.
07524154 Cl. 411-551.
NEC Corporation: See--
Hiroya, Tsutomu; Sumiyoshi, Ken; and Shigemura, Kouji
07525618 Cl. 349-123.
Inoue, Hiroaki; Ito, Yoshiyuki; Sakai, Junji; and Edahiro, Masato
07526673 Cl. 714-11.
Kakura, Yoshikazu; Atarashi, Hiroyuki; and Maeda, Noriyuki
07526041 Cl. 375-285.
Kawahara, Jun; Kinoshita, Keizo; Kunimi, Nobutaka; and Nakano, Akinori
07524908 Cl. 526-279.
Matsumoto, Junko; and Akimoto, Tetsuya
07526399 Cl. 702-125.
Tahara, Hiromitsu; and Mutou, Takanori
07525220 Cl. 307-85.
Uehara, Shin-ichi; Sato, Yuko; Sumiyoshi, Ken; Kaneko, Setsuo; and Matsushima, Jin
07525732 Cl. 359-620.
Yoshida, Hisashi; and Yoshimatsu, Ryo
07524476 Cl. 423-263.
NEC Electronics Corporation: See--
Koyama, Tetsuhiro; and Matsumoto, Tetsuya
07525369 Cl. 327-536.
Shioda, Junyou; and Furihata, Hirobumi
07525550 Cl. 345-545.
Tetsuka, Takashi; and Yamamoto, Hiroki
07525804 Cl. 361-718.
NEC Laboratories America, Inc.: See--
Moon, Hankyu; and Miller, Matthew L.
07526123 Cl. 382-159.
NEC Medical Systems, Ltd.: See--
Nakagawara, Minoru
07524291 Cl. 600-499.
NEC TOKIN Corporation: See--
Sakata, Koji; Saito, Takeshi; Yoshida, Yuji; Kasuga, Takeo; Takahashi, Masanori; and Yoshida, Katsuhiro
07525791 Cl. 361-528.
NEC Viewtechnology, Ltd.: See--
Murayama, Syuuji; and Oura, Keiji
07524069 Cl. 353-69.
Neer, Jay H.; Lloyd, Brian Keith; Brinkerhoff, Cleaver; Dambach, Philip J.; Kiley, Deborah; and Reed, Bruce, to Molex Incorporated Keyed housing for use with small size plug connectors
07524213 Cl. 439-680.
Negevtech Ltd.: See--
Furman, Dov; Neumann, Gad; Wagner, Mark; Dotan, Noam; Segal, Ram; and Silberstein, Shai
07525659 Cl. 356-400.
Negi, Yasuharu: See--
Suyama, Motohiro; Kyushima, Hiroyuki; Kimura, Suenori; Negi, Yasuharu; Fukasawa, Atsuhito; Kawai, Yoshihiko; Uchiyama, Atsushi; and Egawa, Yasuyuki
07525249 Cl. 313-542.
Nehagi, Takatoshi: See--
Ohnishi, Takao; Yamada, Tomohiro; and Nehagi, Takatoshi
07525324 Cl. 324-727.
Neisser, Mark: See--
Chen, Chunwei; Lu, Ping-Hung; Zhuang, Hong; and Neisser, Mark
07524606 Cl. 430-270.1.
Nekovee, Maziar; and Olafsson, Sverrir, to British Telecommunications public limited company Timer-based feedback in multicast communication
07526523 Cl. 709-204.
Nelsen, Daniel: See--
Petrie, Aidan; Nelsen, Daniel; Smith, Daniel; Pereira, Michael C.; and Zins, Kenneth
07524127 Cl. 402-19.
Nelson, Cory J.: See--
Kubicek, Chris A.; Nelson, Cory J.; Montei, Matthew S.; and Furner, Paul E.
07524187 Cl. 431-291.
Nelson, Keith Allen: See--
Jiang, Peijun; Nelson, Keith Allen; Curry, Christopher Lewis; Dekmezian, Armenag Hagop; Sims, Charles Lewis; Abhari, Ramin; Garcia-Franco, Cesar Alberto; Canich, Jo Ann Marie; Kappes, Nicolas; Faissat, Michel Louis; and Jacob, Lutz Erich
07524910 Cl. 526-348.
Nelson, Troy D.: See--
Grauzer, Attila; Bourbour, Feraidoon; Nelson, Troy D.; Rynda, Robert J.; Scheper, Paul K.; Stasson, James Bernard; and Swanson, Ronald R.
07523936 Cl. 273-149R.
Grauzer, Attila; Bourbour, Feraidoon; Nelson, Troy D.; Scheper, Paul K.; Stasson, James B.; and Swanson, Ronald R.
07523935 Cl. 273-149R.
Nemani, Srinivas D.; Lee, Young S.; Yieh, Ellie Y.; Wang, Anchuan; Bloking, Jason Thomas; and Han, Lung-Tien, to Applied Materials, Inc. Integrated process modulation (IPM) a novel solution for gapfill with HDP-CVD
07524750 Cl. 438-597.
Nemat, Awais Bin: See--
Zhang, Ming; Nemat, Awais Bin; and Bliss, David Edward
07526518 Cl. 708-492.
Nemazie, Sam; and Chong, Andrew Hyonil, to LSI Corporation Dual port serial advanced technology attachment (SATA) disk drive
07526587 Cl. 710-74.
Nemecek, Craig; to Cypress Semiconductor Corporation System and a method for checking lock-step consistency between an in circuit emulation and a microcontroller
07526422 Cl. 703-28.
Nemeth, Elizabeta: See--
Bryant-Greenwood, Gillian D.; Tashima, Lily S.; Ognjanovic, Simona; Nemeth, Elizabeta; and Millar, Lynnae K.
07524636 Cl. 435-7.1.
Nemetz, Leah T.: See--
Coats, Joel R.; Peterson, Christopher J.; Zhu, Junwei; Baker, Thomas C.; and Nemetz, Leah T.
07524888 Cl. 514-729.
Nemoto, Hisao: See--
Sakamoto, Kei; Nakano, Yasushi; Kondou, Yoshihisa; Yamada, Toshiro; and Nemoto, Hisao
07524978 Cl. 549-465.
Nemoto, Kazuhiko; to Sony Corporation Semiconductor integrated device
07525895 Cl. 369-112.01.
Nemzov, Julius: See--
Meyer, Klaus; Nemzov, Julius; and Mueller, Ulrich
07523670 Cl. 73-776.
Neose Technologies, Inc.: See--
Johnson, Karl F.; Bezila, Daniel James; Taylor, Diane E.; Simala-Grant, Joanne; and Rasko, David
07524655 Cl. 435-97.
NeosemiTech Corporation: See--
Song, Joon-Suk; Seo, Soo-Hyung; and Oh, Myung-Hwan
07524708 Cl. 438-150.
Nesbit, Larry Alan: See--
Hakey, Mark Charles; Holmes, Steven John; Horak, David Vaclav; Koburger, III, Charles William; Mitchell, Peter H.; and Nesbit, Larry Alan
07525156 Cl. 257-347.
Nesheiwat, Jeries I.: See--
Huang, Misty; Medicino, Frank D.; Yang, Yurun; Nesheiwat, Jeries I.; and O'Keefe, Brendan J.
07524915 Cl. 528-28.
Nestec S.A.: See--
Rosse, Meinrad; and Gaillard, Julien
07524178 Cl. 425-313.
Vidal, Karine; Van Den Broek, Peter; Offord Cavin, Elizabeth; and Donnet-Hughes, Anne
07524815 Cl. 514-8.
Netafim, Ltd.: See--
Netapp, Inc.: See--
McGovern, William P.
07526620 Cl. 711-159.
Neto, José Batista Ferreira: See--
Bergmann, Herberto; Omoto, Arnaldo Hiroyuki; Pereira, Luis Ricardo Luzardo; Neto, José Batista Ferreira; Jensen, David L.; and Malkowski, Jr., Chester
07525809 Cl. 361-752.
Netscape Communications Corporation: See--
Musil, Alex; Uberti, Justin; and Wick, Andy
07525951 Cl. 370-352.
Nettles, Alice Method and apparatus for celebration money hanger
07523575 Cl. 40-661.04.
Network Appliance, Inc.: See--
Pittman, Joseph C.
07526558 Cl. 709-227.
Neubauer, Antonie; and Ziegler, Christina, to Boehringer Ingelheim Vetmedica GmbH gM-negative EHV-mutants without heterologous elements
07524506 Cl. 424-199.1.
Neubauer, III, William C.: See--
Klug, Keith M.; Kreitzer, Stuart S.; McKay, Brent M.; Rainbolt, Bradley J.; Villa, Fred R.; Boillot, Marc A.; Lindteigen, Ty B.; McKibben, Bernard R.; Neubauer, III, William C.; Ray, Jerry D.; Savage, Michael A.; Sutherland, Bryce; and Winterfield, Barbara S.
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07525343 Cl. 326-40.
Neuhoff, Heinz: See--
Tschuor, Remigi; Neuhoff, Heinz; and Strelkov, Iouri
07524168 Cl. 416-97R.
Neuman, Darren: See--
Kumar, Sathish; Ramakrishnan, Lakshmanan; and Neuman, Darren
07526024 Cl. 375-240.
Neumann, Gad: See--
Furman, Dov; Neumann, Gad; Wagner, Mark; Dotan, Noam; Segal, Ram; and Silberstein, Shai
07525659 Cl. 356-400.
Neumann, Jeffrey: See--
Bossemeyer, Jr., Robert Wesley; Halling, Dale Brian; Goering, Scott Christopher; Gorman, Michael George; Kagan, Denise Violetta; Neumann, Jeffrey; Pickard, Michael Steven; Tisiker, Michael; and Stuckman, Bruce Edward
07525990 Cl. 370-468.
Neurath, Markus F.; and Schwab, Matthias, to Robert Bosch Gesellschaft fur Medizinische Forschung (RBMF) Diagnostic methods for therapeutic compounds and methods for monitoring azathioprine therapy
07524851 Cl. 514-262.1.
Neurosearch A/S: See--
Peters, Dan; Olsen, Gunnar M.; Nielsen, Elsebet Østergaard; and Scheel-Krüger, Jørgen
07524958 Cl. 546-112.
NeuStar, Inc.: See--
Fridman, Sharon; Volach, Ben; and Makavy, Ran
07525930 Cl. 370-259.
Nevejans, Filip: See--
Sohn, Martin; Stroefer, Eckhard; Nevejans, Filip; Penzel, Ulrich; Pallasch, Hans-Juergen; Van Den Abeel, Peter; Deberdt, Filip; Jacobs, Jan D.; and Mackenroth, Wolfgang
07524405 Cl. 203-80.
Neveling, Arno: See--
Blann, Kevin; Bollmann, Annette; Dixon, John Thomas; Neveling, Arno; Morgan, David Hedley; Maumela, Hulisani; Killian, Esna; Hess, Fiona Millicent; Otto, Stefanus; and Overett, Matthew James
07525009 Cl. 585-527.
Nevid, Jeffrey S.: See--
Rathus, Spencer A.; Nevid, Jeffrey S.; and Fichner-Rathus, Lois
07523868 Cl. 235-472.01.
Nevin, Joseph: See--
Ahn, Chong H.; Choi, Jin-Woo; Beaucage, Gregory; and Nevin, Joseph
07524464 Cl. 422-177.
Nevoret, Damien; Swei, Gwo; and Zanoli, Alain, to Saint-Gobain Abrasives, Inc. Rapid tooling system and methods for manufacturing abrasive articles
07524345 Cl. 51-298.
New Jersey Institute of Technology: See--
Dreizin, Edward Leonid; and Schoenitz, Mirko
07524355 Cl. 75-375.
Newbury, Terence D.: See--
Black, Donald N.; Newbury, Terence D.; Jones, Alan; Parr, R. Dean; and Bunce, Bayne
07525501 Cl. 343-773.
Newfrey LLC: See--
Ebert, David Allan
07523971 Cl. 292-358.
Kawai, Yasuhiro; Kawasaki, Yoshiharu; Okinaka, Shuichi; and Nogami, Mitsuo
07523959 Cl. 280-730.2.
Strader, Walter; Bloom, Mark S.; and Chong, Gerald
07525411 Cl. 340-5.53.
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07525551 Cl. 345-587.
Newlander, Kenneth A.: See--
Miller, William H.; Newlander, Kenneth A.; Seefeld, Mark A.; Uzinskas, Irene N.; Dewolf, Jr., Walter E.; and Jakas, Dalia R.
07524843 Cl. 514-230.5.
Newman, Mark Webster: See--
Edwards, Warren Keith; Newman, Mark Webster; Smith, Trevor; Sedivy, Jana Zdislava; Marcelo, Karen; Izadi, Shahram; and Hong, Jason
07526482 Cl. 707-10.
Newport Media, Inc.: See--
Elwan, Hassan; Fahim, Amr; Ismail, Aly; and Youssoufian, Edward
07525372 Cl. 327-552.
Elwan, Hassan; and Wang, Dejun
07525465 Cl. 341-143.
Newton, Lee; and Bailey, Mark, to AstraZeneca UK Limited Process for the preparation of pyrimidine compounds
07524955 Cl. 544-297.
Nextreme Thermal Solutions, Inc.: See--
Venkatasubramanian, Rama; Alley, Randall G.; Addepalli, Pratima; Reddy, Anil J.; Siivola, Edward P.; O'Quinn, Brooks C.; Coonley, Kip D.; Posthill, John; and Colpitts, Thomas
07523617 Cl. 62-3.7.
NextWave Broadband, Inc.: See--
Gould, Adam; Librizzi, Michael S.; and Stanwood, Kenneth L.
07526248 Cl. 455-11.1.
Ng, Chi Yung: See--
Chen, Tu Pei; and Ng, Chi Yung
07525147 Cl. 257-314.
Ng, Joh Joh: See--
Maniam, Selvan; Ng, Joh Joh; Lin, Khee Boon; and Chia, Chee Wai
07525685 Cl. 358-1.9.
Ng, Keat Chuan: See--
Aizar, Abdul Karim Norfidathul; Lee, Chiau Jin; Ng, Keat Chuan; Ong, Kiam Soon; and Tan, Kheng Leng
07524087 Cl. 362-267.
Ng, Say Hwee; and Tang, Tian Cheng, to Swann Industries Pte Ltd. Interlock door switch
07525054 Cl. 200-10.
Ng, Tze Sing Eugene: See--
Guo, Katherine Hua; Hofmann, Markus Andreas; Ng, Tze Sing Eugene; Paul, Sanjoy; and Zhang, Hui
07526564 Cl. 709-231.
Ngai, Gary C.: See--
Tan, Leng Leng; Putzolu, Gianfranco; Sarwal, Richard; Tsukerman, Alex; Ngai, Gary C.; Wood, Graham Stephen; Dias, Karl; Ramacher, Mark; Dageville, Benoit; Ziauddin, Mohamed; Lahiri, Tirthankar; Muthulingam, Sujatha; Karra, Vishwanath; Sanchez, Francisco; Su, Hsiao-Te; Yang, Wanli; Krishnaswamy, Vasudha; and Kumar, Sushil
07526508 Cl. 707-200.
NGK Insulators, Ltd.: See--
Goto, Yoshinobu; and Tsuruta, Hideyoshi
07525071 Cl. 219-543.
Marada, Masashi; Ichikawa, Shuichi; Otsuka, Aiko; Kaneda, Atsushi; and Noguchi, Yasushi
07524450 Cl. 264-630.
Ohnishi, Takao; Yamada, Tomohiro; and Nehagi, Takatoshi
07525324 Cl. 324-727.
NGK Spark Plug Co., Ltd.: See--
Hirasawa, Makoto; Yoshiyasu, Shohei; and Matsubara, Yoshiaki
07524407 Cl. 204-425.
Yuri, Shinji; and Muramatsu, Masaki
07525814 Cl. 361-761.
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07525393 Cl. 331-25.
Ngo, Son Truong: See--
Tabatabaee, Vahid; and Ngo, Son Truong
07525978 Cl. 370-411.
Nguyen, Bich-Yen: See--
Adetutu, Olubunmi O.; Sadaka, Mariam G.; White, Ted R.; and Nguyen, Bich-Yen
07524707 Cl. 438-150.
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07524198 Cl. 439-131.
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Bassler, Jürgen; Henzler, Steffen; and Nguyen, Dinh Cong
07524262 Cl. 476-42.
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07526663 Cl. 713-323.
Nguyen, Dzung H.; and Roohparvar, Frankie F., to Micron Technology, Inc. Increased NAND flash memory read throughput
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07525338 Cl. 326-30.
Nguyen, Khai: See--
Wang, Xiaobao; Sung, Chiakang; and Nguyen, Khai
07525360 Cl. 327-175.
Nguyen, Khoi M.: See--
Connors, Kevin G.; Pintauro, William L.; Wallin, Sheila K.; Kilcoyne, John T.; Cao, Hung H.; Nguyen, Khoi M.; and Yurek, Matthew T.
07524280 Cl. 600-29.
Nguyen, Thai: See--
Zhang, Nan; Ayral-Kaloustian, Semiramis; and Nguyen, Thai
07524849 Cl. 514-255.05.
Nguyen, The-Linh: See--
Aronson, Lewis B.; Giarreta, Girogio; and Nguyen, The-Linh
07526207 Cl. 398-164.
Nguyen, Thien: See--
Marchisio, Giovanni B.; Koperski, Krzysztof; Liang, Jisheng; Nguyen, Thien; Tusk, Carsten; Dhillon, Navdeep S.; Pochman, Lubos; and Brown, Matthew E.
07526425 Cl. 704-9.
Nguyen, Thien Ngoc: See--
Corvaia, Nathalie; Nguyen, Thien Ngoc; Beck, Alain; and Plotnicky, Hélène
07524627 Cl. 435-5.
Nhan, Davis-Dang Hoang: See--
Ales, Thomas Michael; and Nhan, Davis-Dang Hoang
07524195 Cl. 439-66.
NHK Spring Co., Ltd.: See--
Yamaguchi, Hiroyoshi
07523987 Cl. 297-216.12.
Nho, Jun Seok: See--
Cho, Seung Beom; Nho, Jun Seok; Shin, Dong Mok; Kim, Jong Pil; Oh, Myoung Hwan; Kim, Jang Yul; Choi, Eun Mi; and Ko, Min Jin
07524475 Cl. 423-263.
Ni, Bin: See--
Liu, Jingfeng; Oberg, Mats; Keirn, Zachary; and Ni, Bin
07525460 Cl. 341-120.
Ni, Jiahong: See--
Wang, Lai-Xi; Ni, Jiahong; Li, Hengguang; and Singh, Suddham
07524821 Cl. 514-25.
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Nguyen, David; Nan, Nan; Ni, Jim Chin-Nan; Lee, Charles Chung; and Shen, Ming-Shiang
07524198 Cl. 439-131.
Nichia Corporation: See--
Nicholes, Christopher T. Animal feeder apparatus
07523717 Cl. 119-51.01.
Nichols, Jonathan L.: See--
Janik, Craig M.; Kalayjian, Nicholas; Nichols, Jonathan L.; and Fuchs, Axel
07525289 Cl. 320-158.
Nichols, Mark; and Steinman, Richard, to University of Pittsburgh - of the Commonwealth System of Higher Education Small interfering RNA libraries and methods of synthesis and use
07524653 Cl. 435-91.41.
Nickolls, John R.: See--
Duluk, Jr., Jerome F.; Lew, Stephen D.; and Nickolls, John R.
07526634 Cl. 712-216.
Nicox S.A.: See--
Del Soldato, Piero
07524836 Cl. 514-182.
Nicros, Inc.: See--
Postma, Nathan B.; and Cieszkowski, Kevin E.
07524269 Cl. 482-37.
Nidec Corporation: See--
Nidek Co., Ltd.: See--
Nie, Xiaoning: See--
Gazsi, Lajos; Lin, Jinan; Mehrgardt, Soenke; and Nie, Xiaoning
07526636 Cl. 712-228.
Niederauer, Gabriele G.: See--
Slivka, Michael A.; Niederauer, Gabriele G.; Kieswetter, Kristine; and Leatherbury, Neil C.
07524335 Cl. 623-23.75.
Nieglos, Donald J.: See--
Ammann, Kelly G.; Burns, Ralph E.; Hansberry, Ernest V.; Horner, Glenn A.; Jakub, Cheryl A.; Kling, John E.; Nieglos, Donald J.; Schneider, Robert E.; and Smith, Robert J.
07524652 Cl. 435-91.2.
Nielsen, Elsebet Østergaard: See--
Peters, Dan; Olsen, Gunnar M.; Nielsen, Elsebet Østergaard; and Scheel-Krüger, Jørgen
07524958 Cl. 546-112.
Nielsen, Flemming K.: See--
Torring, Ditte; Lauersen, Christian; Baekgard, Arne; Nannerup, Lars; Nielsen, Flemming K.; Schmidt, Richard D.; and Jorgensen, Gert
07523718 Cl. 119-203.
Nielsen, Karl Allen: See--
Kolvick, Jr., Robert John; and Nielsen, Karl Allen
07526686 Cl. 714-54.
Nielsen, Martin Dybendal; Skovgaard, Peter M. W.; Broeng, Jes; and Vienne, Guillaume, to Crystal Fibre A/S Optical coupler devices, methods of their production and use
07526165 Cl. 385-125.
Nielson, Scott L; and Gifford, Craig P, to American Equities Management, LLC Method, process and computer program to automatically create a customized three-dimensional nail object by welding
07526416 Cl. 703-6.
Niemi, Aki: See--
Khartabil, Hisham; Isomäki, Markus; Niemi, Aki; and Veikkolainen, Simo
07526281 Cl. 455-416.
Niemi, Valtteri: See--
Hurtta, Tuija; Asokan, Nadarajah; Ginzboorg, Philip; Niemi, Valtteri; Poikselkä, Miikka; and Rantalainen, Timo M.
07526642 Cl. 713-155.
Nierlich, Florent: See--
Thibault, Julien; and Nierlich, Florent
07523812 Cl. 188-71.5.
Nieto, John Wesley; to Harris Corporation Low complexity equalizer
07526022 Cl. 375-233.
Nihashi, Tokuaki: See--
Sumiya, Masatomo; Fuke, Shunro; Nihashi, Tokuaki; and Hagino, Minoru
07525131 Cl. 257-184.
Nihei, Norio: See--
Yakushiji, Gaku; Kitano, Hajime; Murata, Kazuya; Nihei, Norio; Takagi, Koji; Masuda, Yoshitomo; and Kawagoe, Takahiro
07525719 Cl. 359-296.
Niinuma, Koichiro; Semba, Satoshi; and Shinzaki, Takashi, to Fujitsu Limited Biometric information authentication device, biometric information authentication method, and computer-readable recording medium with biometric information authentication program recorded thereon
07526110 Cl. 382-125.
Niiranen, Erkki; Närhi, Harri; Puoskari, Jukka; and Koskela, Pertti, to Filtronic Comtek Oy Input arrangement for a low-noise amplifier pair
07526263 Cl. 455-130.
Niiya, Wataru: See--
Mimura, Hiroshi; Niiya, Wataru; and Kamada, Toshiyuki
07523829 Cl. 206-710.
NIKE, Inc.: See--
Schepke, Kyle; and Hanif, Umar
07524055 Cl. 351-103.
Nikolau, Basil J.; Wurtele, Eve S.; Oliver, David J.; Schnable, Patrick S.; and Wen, Tsui-Jung, to Iowa State University Research Foundation, Inc. Materials and methods for the alteration of enzyme and acetyl CoA levels in plants
07524678 Cl. 435-375.
Nilsson, Alan C.: See--
Welch, David F.; Kish, Jr., Fred A.; Nagarajan, Radhakrishnan L.; Nilsson, Alan C.; and Taylor, Robert B.
07526150 Cl. 385-14.
Nilsson, Björn M.: See--
Caldirola, Patrizia; Nilsson, Björn M.; and Johansson, Gary
07524839 Cl. 514-218.
Ning, Steven L.: See--
Cho, Yong K.; Ning, Steven L.; Mongeon, Luc R.; Davie, Scott W.; Sheldon, Todd J.; Erickson, Mark K.; and Markowitz, H. Toby
07524292 Cl. 600-529.
Ninomiya, Masaki; to Ricoh Company, Ltd. Optical information recording medium, an optical information recording apparatus, an information processing apparatus, program and information recording method
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Ninomiya, Yasunori: See--
Terada, Nobuto; Shioi, Naoto; Totokawa, Masashi; and Ninomiya, Yasunori
07524893 Cl. 523-457.
Nippon Sheet Glass Co., Ltd.: See--
Koyo, Hirotaka; Koyama, Tadashi; and Tsunetomo, Keiji
07524783 Cl. 501-65.
Nippon Shokubai Co., Ltd.: See--
Miyazaki, Atsushi; Ito, Akio; and Kushino, Mitsuo
07525720 Cl. 359-296.
Nippon Telegraph and Telephone Corporation: See--
Matsui, Kenichi; Yagi, Takeshi; Naruse, Yuuichi; Murayama, Junichi; and Kaneda, Masaki
07525919 Cl. 370-238.
Nipro Corporation: See--
Sunohara, Takashi; Anbo, Hidehiko; and Masuda, Toshiaki
07524417 Cl. 210-321.79.
Nirel, Zvi: See--
Dishon, Giora; Finarov, Moshe; Nirel, Zvi; and Cohen, Yoel
07525634 Cl. 355-27.
Niro-Plan AG: See--
Marr, Duncan B.; Bomatter, Christian; Gross, Wolfgang; and Jost, Uli
07523511 Cl. 4-633.
Nisca Corporation: See--
Nishida, Hirobumi; to Ricoh Company, Ltd. Image processing device, image processing method, image processing program, and recording medium
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Nishida, Katsutoshi; Okagawa, Takatoshi; and Jo, Manhee, to NTT DoCoMo, Inc. Router and address identification information management server
07526569 Cl. 709-239.
Nishidate, Masahiro: See--
Tsuchiya, Masahisa; and Nishidate, Masahiro
07525227 Cl. 310-90.
Nishiguchi, Katsuya: See--
Gendou, Toshiyuki; Sugimoto, Yukihiro; Nishiguchi, Katsuya; Takase, Kenji; and Shoji, Yohei
07523851 Cl. 228-112.1.
Nishiie, Takehiro: See--
Murakami, Kazushi; Komiya, Takaaki; Onuki, Yoshio; Nishiie, Takehiro; Kura, Yasuhito; and Ichikawa, Hiroaki
07524284 Cl. 600-106.
Nishikata, Akinobu: See--
Aoyagi, Shigeo; Nishikata, Akinobu; Fujii, Takayuki; and Kasahara, Shigeru
07523593 Cl. 53-117.
Nishikawa, Mutsuo; Ueyanagi, Katsumichi; Uematsu, Katsuyuki; and Fujimoto, Yuko, to Fuji Electric Device Technology Co., Ltd. Signal amplifier circuit with a limiting voltage device
07525389 Cl. 330-298.
Nishikawa, Satoshi: See--
Mori, Yasuo; Nakagiri, Koji; and Nishikawa, Satoshi
07525682 Cl. 358-1.18.
Nishikawa, Takahiro; Ogasawara, Hirotsugu; Suda, Akihiro; Hara, Masayuki; Sawabe, Hiroyuki; Yoshida, Hiroyuki; and Hashimoto, Akira, to Sanyo Electric Co., Ltd. Compression system, multicylinder rotary compressor, and refrigeration apparatus using the same
07524174 Cl. 418-60.
Nishikawa, Tohru: See--
Toizumi, Tomoko; Akazawa, Yoshiaki; Ogawa, Satoshi; Suzuki, Masao; Matsumoto, Akio; Onda, Hiroshi; Toizumi, Kiyoshi; Ishida, Toshihisa; Sawai, Tadayuki; Kida, Kouji; Nishikawa, Tohru; and Kubo, Masahiko
07524600 Cl. 430-108.3.
Nishimoto, Tetsuro; to Juon Co., Ltd. Method to measure exhaust-gas components
07523641 Cl. 73-23.2.
Nishimura, Ken; Larson, III, John D.; and Gilbert, Stephen R., to Avago Technologies General IP (Singapore) Pte. Ltd. Acoustically communicating data signals across an electrical isolation barrier
07525398 Cl. 333-189.
Nishimura, Michiyo; to Canon Kabushiki Kaisha Method of producing an electron emission device, method of producing an electron source, method of producing an image display device, and method of driving an electron emission device
07524227 Cl. 445-6.
Nishimura, Mitsuo: See--
Fujii, Hirofumi; and Nishimura, Mitsuo
07525644 Cl. 355-75.
Nishimura, Takayuki: See--
Nomizu, Yasuyuki; Sakuyama, Hiroyuki; Hara, Junichi; Matsuura, Nekka; Yano, Takanori; Kodama, Taku; Miyazawa, Toshio; Shinkai, Yasuyuki; and Nishimura, Takayuki
07526133 Cl. 382-232.
Nishino, Keita; and Koga, Teruyoshi, to Kaneka Corporation Process for producing carbapenem compound for oral administration
07524952 Cl. 540-350.
Nishiura, Katsunori; Fukuda, Kazuyuki; and Takaki, Toshihiko, to Mitsui Chemicals, Inc. Gas-barrier composition, coating film and method for production of the same, and layered material
07524900 Cl. 525-192.
Nishiwaki, Tatsuya: See--
Nakagaki, Johji; Asahara, Akihiro; Kimura, Hideo; Kitahara, Hiroaki; Nishiwaki, Tatsuya; Shiota, Yasuhiko; and Yamada, Takeshi
07525107 Cl. 250-492.21.
Nishiyama, Hidetoshi; Nozoe, Mari; and Shinada, Hiroyuki, to Hitachi, Ltd. Inspection method and inspection system using charged particle beam
07526747 Cl. 716-21.
Nishiyama, Yasuhiro: See--
Paul, Sudhir; and Nishiyama, Yasuhiro
07524663 Cl. 435-188.5.
Nissan Chemical Industries, Ltd.: See--
Tsutsui, Kimiaki; Sakai, Takahiro; and Goto, Kohei
07524541 Cl. 428-1.26.
Nissan Motor Co., Ltd.: See--
Tsutsumi, Junji; and Katou, Yuusuke
07526372 Cl. 701-43.
Nissan Technical Center North America, Inc.: See--
Thompson, Bryan Scot; Devers, Raymond; Mazzei, Anke; and Saiki, Hideshi
07523991 Cl. 297-452.62.
Nissov, Morten: See--
Mohs, Georg H.; Abbott, Stuart M.; Kerfoot, III, Franklin W.; Jander, R. Brian; and Nissov, Morten
07526201 Cl. 398-37.
Nitta, Tatsuo; to Kabushiki Kaisha Toshiba Magnetic disk drive apparatus and method of controlling the same
07525745 Cl. 360-31.
Nitto Denko Corporation: See--
Ohsawa, Tetsuya; Funada, Yasuhito; and Kanagawa, Hitoki
07525764 Cl. 360-234.5.
Niu, Qiwen: See--
Zuo, Jianru; Niu, Qiwen; and Chua, Nam-Hai
07525012 Cl. 800-278.
Niwa, Takashi: See--
Oumi, Manabu; Mitsuoka, Yasuyuki; Chiba, Norio; Kasama, Nobuyuki; Kato, Kenji; and Niwa, Takashi
07525880 Cl. 369-13.31.
Nixon, John Perry: See--
Lepola, William; and Nixon, John Perry
07523764 Cl. 138-98.
Nixon, Mark J.: See--
Lucas, J. Michael; Webb, Arthur; Nixon, Mark J.; Jundt, Larry O.; Li, Jian; Stevenson, Dennis L.; Ott, Michael G.; Koska, Herschel O.; and Havekost, Robert B.
07526347 Cl. 700-79.
Njoki, Peter N.: See--
Zhong, Chuan-Jian; Njoki, Peter N.; and Luo, Jin
07524354 Cl. 75-370.
No, Yang Hwan: See--
Kim, Jong Seok; No, Yang Hwan; Cho, Han Ki; Jung, Yeon Su; Kang, Jung Hoon; Park, Myung Sik; and Ha, Young Hoon
07523627 Cl. 68-196.
Noborio, Daichi; and Akatsuka, Hidenori, to Yamaha Hatsudoki Kabushiki Kaisha Intake control device for a vehicle
07523732 Cl. 123-184.55.
Nobumoto, Hidetoshi; Shoya, Taizou; Ueda, Takayuki; and Mamiya, Kiyotaka, to Mazda Motor Corporation Engine starting system for power train
07524266 Cl. 477-110.
Noda, Kazuhiro: See--
Mal, Nawal Kishor; Hinokuma, Koichiro; and Noda, Kazuhiro
07524916 Cl. 528-30.
Noda, Sayuri; to Largan Precision Co., Ltd. Two-piece optical lens system for taking image
07525741 Cl. 359-795.
Noda, Tatsuya: See--
Shimada, Kei; Hirata, Takashi; Ashihara, Jun; Noda, Tatsuya; and Ikeuchi, Yasushi
07524297 Cl. 602-16.
NOF Corporation: See--
Kubo, Kazuhiro; Itoh, Chika; Ohhashi, Syunsuke; Yasukohchi, Tohru; Ohkawa, Yusuke; Kikuchi, Hiroshi; Suzuki, Norio; Takahashi, Miho; and Yamauchi, Hitoshi
07524981 Cl. 554-78.
Nakamoto, Ken-ichiro; Ohashi, Syunsuke; Yamamoto, Yuji; Sakanoue, Kenji; Itoh, Chika; and Yasukohchi, Tohru
07524875 Cl. 514-359.
Nogami, Keiji: See--
Asao, Haruhiko; Koshiba, Yutaka; Nogami, Keiji; Masui, Tutomu; Hori, Kazumasa; Wakiguchi, Kenji; Wada, Masahiko; and Hattori, Yoshiaki
07524356 Cl. 75-646.
Nogami, Mitsuo: See--
Kawai, Yasuhiro; Kawasaki, Yoshiharu; Okinaka, Shuichi; and Nogami, Mitsuo
07523959 Cl. 280-730.2.
Noguchi, Junichi: See--
Takasu, Yasuo; Takahashi, Isoko; Terasawa, Isamu; Noguchi, Junichi; and Tsuneoka, Kazunori
07524554 Cl. 428-292.4.
Noguchi, Katsuhiko: See--
Sasaki, Toshiro; Ando, Takashi; Yamamoto, Yasuo; Imai, Takahiro; Kubota, Dai; Noguchi, Katsuhiko; Hori, Nobuyuki; Shitara, Eiki; Atsumi, Kunio; and Yasuda, Shohei
07524951 Cl. 540-200.
Noguchi, Yasushi: See--
Marada, Masashi; Ichikawa, Shuichi; Otsuka, Aiko; Kaneda, Atsushi; and Noguchi, Yasushi
07524450 Cl. 264-630.
Noh, Tae-Yong: See--
Park, Sang-Hoon; Noh, Tae-Yong; Kim, Sang-Yeol; Pu, Lyong-Sun; Lee, Soo-Hyoung; Kang, In-Nam; and Son, Jhun-Mo
07524567 Cl. 428-690.
Nojima, Shigeki: See--
Kotani, Toshiya; Tanaka, Satoshi; Nojima, Shigeki; and Inoue, Soichi
07526748 Cl. 716-21.
NOK Corporation: See--
Nokia Corporation: See--
Astala, Arto; Ellila, Timo; Asunmaa, Petri; Djupsjobacka, Kimmo; Grundy, John; Saarikivi, Ilari; Savolainen, Sampo; Lindblom, Patrik; Frisk, Anders; Zimet, Martha; Ylonen, Otso; and Abrahamson, Thomas
07526762 Cl. 717-171.
Bestle, Nikolaj; Friis, Lars; Schroll, Esbjorn; Wood, Todd; Vad, Thomas; Schlunsen, Jacob; and Aresteen, Lars
07525597 Cl. 348-376.
Helkiö, Risto; Salmenkaita, Jukka-Pekka; and Moilanen, Pirjo
07523869 Cl. 235-472.01.
Hui, Ping; and Van Wonterghem, Jari
07525502 Cl. 343-835.
Hurtta, Tuija; Asokan, Nadarajah; Ginzboorg, Philip; Niemi, Valtteri; Poikselkä, Miikka; and Rantalainen, Timo M.
07526642 Cl. 713-155.
Ingimundarson, Jon Ingi; Regnier, Jean; Thorkelsson, Haraldur; and Vachon, Gaetan
07526563 Cl. 709-230.
Khartabil, Hisham; Isomäki, Markus; Niemi, Aki; and Veikkolainen, Simo
07526281 Cl. 455-416.
Leinonen, Marko; and Rousu, Seppo
07525481 Cl. 342-357.12.
Schwarz, Uwe; Hakalin, Petteri; and Tölli, Antti
07526289 Cl. 455-439.
Schwarz, Uwe; Muszynski, Peter; Holma, Harri; Korpela, Sari; and Numminen, Jussi
07525948 Cl. 370-350.
Tirkkonen, Olav; and Hottinen, Ari
07526708 Cl. 714-751.
Vatanparast, Ramin; Aarras, Mikko; Dunford, Steven O.; Fujii, Takaharu; Lainonen, Juhani; Nousiainen, Jaakko; Rantala, Jukka I.; Tanskanen, Pia; and Yamamoto, Tetsuya
07523546 Cl. 29-832.
Nokia Siemens Networks GmbH & Co. KG: See--
Altham, Andrew; and Domokos, John
07525377 Cl. 330-136.
Mecklenbraeuker, Christoph; and Slanina, Peter
07526307 Cl. 455-522.
Nokia Siemens Networks Oy: See--
Trossen, Dirk; and Chaskar, Hemant M.
07525940 Cl. 370-331.
Nolan, Daniel Aloysius: See--
Bookbinder, Dana Craig; Li, Ming-Jun; Murtagh, Michael Thomas; Nolan, Daniel Aloysius; Tandon, Pushkar; and Wang, Ji
07526166 Cl. 385-125.
Nomiya, Makoto: See--
Hayashi, Kenji; Koyama, Mikio; Shirose, Meizo; and Nomiya, Makoto
07524601 Cl. 430-108.4.
Nomizu, Yasuyuki; Sakuyama, Hiroyuki; Hara, Junichi; Matsuura, Nekka; Yano, Takanori; Kodama, Taku; Miyazawa, Toshio; Shinkai, Yasuyuki; and Nishimura, Takayuki, to Ricoh Company, Ltd. Image processing apparatus, image processing program, and storage medium
07526133 Cl. 382-232.
Nomoto, Tsuyoshi; and Yano, Tetsuya, to Canon Kabushiki Kaisha Isogenic strain line of bacterium for producing polyhydroxyalkanoate in which polyhydroxyalkanoate synthase gene is disrupted and method for producing polyhydroxyalkanoate using the same
07524659 Cl. 435-135.
Nomura, Hiroshi; Suzuka, Shinya; and Endo, Ken, to Hoya Corporation Optical image stabilizer
07526189 Cl. 396-55.
Nomura, Shinichiro; Kato, Takayuki; Atarashiya, Takao; Sugiyama, Hiroki; and Moritai, Satoshi, to Epson Imaging Devices Corporation Liquid crystal display device and manufacturing method thereof
07525605 Cl. 349-38.
Non Stop Hydro Excavation Ltd.: See--
Pobihushchy, Victor
07523570 Cl. 37-318.
Nordell, II, Benjamin Theodore: See--
Edelstein, Peter Seth; and Nordell, II, Benjamin Theodore
07525426 Cl. 340-539.13.
Nordex Energy GmbH: See--
Kabatzke, Wolfgang; and Richter, Kay
07525209 Cl. 290-44.
Noritz Corporation: See--
Hamada, Tetsurou; Hara, Hitoshi; Yoshitomi, Hideaki; Uehara, Kozo; and Takashima, Hiroaki
07523721 Cl. 122-31.1.
Norman, John Anthony Thomas: See--
Garg, Diwakar; Cheng, Hansong; Norman, John Anthony Thomas; Machado, Eduardo; and Ordejon, Pablo
07524533 Cl. 427-250.
Norman, Mark H.: See--
Doherty, Elizabeth M.; Zhu, Jiawang; Stec, Markian; Norman, Mark H.; Ognyanov, Vassil I.; Fotsch, Christopher H.; Chen, Ning; Chakrabarti, Partha P.; Pettus, Liping H.; Wang, Hui-Ling; Wang, Xianghong; and Arasasingham, Premilla
07524874 Cl. 514-345.
Norman, Terry: See--
MacQueen, Jason; Gastineau, Gary L.; Norman, Terry; Weber, Clifford J.; Alexander, Carol; and Baker, Charles A.
07526445 Cl. 705-36R.
Norris, Jeffrey J.; and Kluempke, Shari K., to ADC Telecommunications, Inc. Digital switching cross-connect module
07524211 Cl. 439-668.
Norsworthy, Steven R.; to STMicroelectronics N.V. Coder apparatus for resonant power conversion and method
07525455 Cl. 341-50.
Nortel Networks Limited: See--
He, Haixiang; Fedyk, Donald; and Dondeti, Lakshminath
07526658 Cl. 713-193.
Mcnicol, John D.; Wu, Kuang Tsan; and Comeau, Adrien A
07526211 Cl. 398-204.
Skalecki, Darek R.; Ashwood Smith, Peter J.; and Trobridge, Peter
07525907 Cl. 370-228.
North, Diane: See--
Ouderkirk, Andrew J.; Allen, Richard C.; Fleming, Patrick R.; North, Diane; Ruff, Andrew T.; and Thunhorst, Kristin L.
07526164 Cl. 385-115.
North, Todd Michael Networking cable with lighting system for cable tracing
07524082 Cl. 362-219.
Northrop Grumman Corporation: See--
Northrop Grumman, Inc.: See--
Northrop Grumman Systems Corporation: See--
Gigioli, George W.; Bope, David W.; Hairston, Peter P.; and Miller, Edward A.
07525660 Cl. 356-417.
Singh, Narsingh Bahadur; Pesetski, Aaron A.; Berghmans, Andre; Wagner, Brian P.; Kahler, David; Knuteson, David J.; and Thomson, Darren
07525099 Cl. 250-372.
Northwestern University: See--
Mirkin, Chad A.; Piner, Richard; and Hong, Seunghun
07524534 Cl. 427-258.
Nosella, Kimberly D.: See--
Vanbesien, Daryl; Moffat, Karen A.; Moore, Emily L.; Nosella, Kimberly D.; Sanders, David J.; Anderson, Christine; and Vong, Cuong
07524602 Cl. 430-108.7.
Nosov, Alexander E.: See--
El-Shimi, Ahmed; Nosov, Alexander E.; Muhlestein, Travis; Kenny, Patrick R.; and McCollum, Raymond W.
07526484 Cl. 707-10.
Notohamiprodjo, Hubertus; and Chen, Liang, to Marvell International Ltd. Power supply switching circuit for a halogen lamp
07525293 Cl. 323-235.
Nousiainen, Jaakko: See--
Vatanparast, Ramin; Aarras, Mikko; Dunford, Steven O.; Fujii, Takaharu; Lainonen, Juhani; Nousiainen, Jaakko; Rantala, Jukka I.; Tanskanen, Pia; and Yamamoto, Tetsuya
07523546 Cl. 29-832.
Nova Bus, Division de Groupe Volvo Canada Inc.: See--
Daneault, Louis-Philippe; Boudreau, Marc-André; and Beaulieu, Steve
07523993 Cl. 297-464.
Nova Measuring Instruments Ltd.: See--
Dishon, Giora; Finarov, Moshe; Nirel, Zvi; and Cohen, Yoel
07525634 Cl. 355-27.
Nova Oceanic Energy Systems: See--
Atilano Medina, Alvaro Jose; and Uzcategui Trinkl, Rafael
07525214 Cl. 290-53.
Nova, Richard C.: See--
Covey, Kevin K.; McGrath, Thomas J.; Sullivan, Joseph L.; Nygaard, Larry R.; and Nova, Richard C.
07526345 Cl. 607-142.
Novacek, Matthew: See--
Peck, Joseph E.; Novacek, Matthew; Andrade, Hugo A.; Petersen, Newton G.; Ranganathan, Ganesh; Sierer, Brian; and Pasquarette, John
07526535 Cl. 709-220.
Novack, Brian M.; to AT & T Intellectual Property I, L.P. Integrated disparate intelligent peripherals
07526080 Cl. 379-221.11.
Novak, Michael J.: See--
Dideriksen, Tedd; Feller, Chris; Harris, Geoffrey; Novak, Michael J.; and Olson, Kipley J.
07526505 Cl. 707-104.1.
NovAtel Inc.: See--
Novell, Inc.: See--
Friedman, Nathaniel Dourif
07526478 Cl. 707-6.
Wright, Michael; Boucher, Peter; Nault, Gabe; Smith, Merrill; Jacobson, Sterling K.; Wood, Jonathan; and Mims, Robert
07526800 Cl. 726-11.
Novelle, Anthony J.; Raddatz, Claus D.; Long, Steven J.; and Tomerlin, Kenneth F., to Delphi Technologies, Inc. Multifunction switch assembly for power adjusted vehicle passenger seat
07525052 Cl. 200-5R.
Novellus Systems, Inc: See--
Gauri, Vishal; Humayun, Raashina; Lang, Chi-I; Huang, Judy H.; Barnes, Michael; and Shanker, Sunil
07524735 Cl. 438-436.
Novo Nordisk Health Care AG: See--
Zundel, Magali A.; Peschke, Bernd; Dörwald, Florencio Zaragoza; Fiil, Niels Peter; Johansen, Nils Langeland; and Stennicke, Henning Ralf
07524813 Cl. 514-3.
Novotney, Donald J.: See--
Schubert, Emily C.; Leung, Wang Chun; Lydon, Gregory T.; Krueger, Scott; Holden, Paul; Archibald, John; Bolton, Lawrence G.; Novotney, Donald J.; Filson, John B.; and Tupman, David
07526588 Cl. 710-105.
Tupman, David John; Farrar, Doug M.; Fisher, Jr., Joseph R.; Dorogusker, Jesse L.; and Novotney, Donald J.
07525216 Cl. 307-39.
Novotny, Lukas; and Brown, Thomas G., to University of Rochester System and method for high resolution optical imaging, data storage, lithography, and inspection
07526158 Cl. 385-33.
Noy, Oded; and Maso, Brian, to Path Reliability, Inc. Application manager for monitoring and recovery of software based application processes
07526685 Cl. 714-47.
Noyama, Hideo: See--
Miyazaki, Kunihiko; Iwamura, Mitsuru; Matsumoto, Tsutomu; Sasaki, Ryoichi; Yoshiura, Hiroshi; Aoshima, Hirokazu; Noyama, Hideo; Susaki, Seiichi; and Matsuki, Takeshi
07526645 Cl. 713-167.
Noyola, Joan M.: See--
Pekurovsky, Mikhail L.; Noyola, Joan M.; and Ciliske, Scott L.
07524377 Cl. 118-669.
Nozaki, Kazutoshi; Honda, Atsushi; Abe, Akiharu; and Ota, Hirofumi, to Toyota Jidosha Kabushiki Kaisha Control apparatus for vehicular automatic transmission
07524267 Cl. 477-130.
Nozaki, Tomohiro: See--
Kobayashi, Takato; Nozaki, Tomohiro; and Watanabe, Kimihiko
07525061 Cl. 200-520.
Nozawa, Natsuki: See--
Kimura, Akihiro; and Nozawa, Natsuki
07523797 Cl. 180-65.2.
Nozoe, Mari: See--
Nishiyama, Hidetoshi; Nozoe, Mari; and Shinada, Hiroyuki
07526747 Cl. 716-21.
nQUEUE, Inc.: See--
NTN Corporation: See--
Nakamura, Shohei; Hioki, Shouichi; Ito, Hiroyoshi; Mayumi, Tooru; and Sasabe, Mitsuo
07525430 Cl. 340-572.1.
NTT DoCoMo, Inc.: See--
Abe, Tetsushi; Shi, Hui; Asai, Takahiro; and Yoshino, Hitoshi
07525939 Cl. 370-328.
Asai, Mao; Watanabe, Nobuyuki; and Tsuda, Masayuki
07526766 Cl. 718-103.
Maeda, Noriyuki; Atarashi, Hiroyuki; and Sawahashi, Mamoru
07526011 Cl. 375-141.
Nishida, Katsutoshi; Okagawa, Takatoshi; and Jo, Manhee
07526569 Cl. 709-239.
Roman, Manuel; and Islam, Nayeem
07526771 Cl. 719-316.
Nuccetelli, Gary L.: See--
Axtell, III, Enos A.; Sakoske, George E.; Swiler, Daniel R.; Hensel, Michael; Baumann, Martin; Matalka, David J.; and Nuccetelli, Gary L.
07524531 Cl. 427-226.
NuFlare Technology, Inc.: See--
Suzuki, Junichi; Emi, Keiko; and Abe, Takayuki
07525110 Cl. 250-492.22.
Numed, Inc.: See--
Numminen, Jussi: See--
Schwarz, Uwe; Muszynski, Peter; Holma, Harri; Korpela, Sari; and Numminen, Jussi
07525948 Cl. 370-350.
Nunes, Jack: See--
Martinez, Robert E.; Goyen, Todd; and Nunes, Jack
07525222 Cl. 307-326.
Nunogawa, Yasuhiro: See--
Kohjiro, Iwamichi; Nunogawa, Yasuhiro; Kikuchi, Sakae; Kondo, Shizuo; Adachi, Tetsuaki; Kagaya, Osamu; Sekine, Kenji; Hase, Eiichi; and Yamashita, Kiichi
07525813 Cl. 361-760.
Nunokawa, Hirokazu; to Seiko Epson Corporation Printing method, test pattern, method of producing test pattern, and printing apparatus
07524012 Cl. 347-19.
Nunoue, Shinya: See--
Hattori, Yasushi; Saito, Shinji; Nunoue, Shinya; Yamamoto, Masahiro; Shida, Naomi; Kaneko, Kei; and Hatakoshi, Genichi
07525127 Cl. 257-99.
Nussbaum, Howard S.: See--
Davidoff, Loan T.; Nussbaum, Howard S.; and Chia, Jackson Y.
07526052 Cl. 375-350.
Nuvera Fuel Cells Europe, S.r.l.: See--
Facchi, Daniele; Trifoni, Eduardo; Toro, Antonino; Merlo, Luca; Lenardon, Matteo; and Binelli, Paolo
07524574 Cl. 429-38.
Nvidia Corporation: See--
Azar, Hassane S.; and Diard, Franck R.
07525548 Cl. 345-504.
Diard, Franck R.; Young, Wayne Douglas; and Johnson, Philip Browning
07525549 Cl. 345-505.
Duluk, Jr., Jerome F.; Lew, Stephen D.; and Nickolls, John R.
07526634 Cl. 712-216.
Mandal, Manas; Tsu, William P.; Case, Colyn S.; and Kaul, Ashish Kishen
07526593 Cl. 710-310.
Newhall, Jr., William P.; and Van Dyke, James M.
07525551 Cl. 345-587.
Overby, Mark A.; and Currid, Andrew
07526619 Cl. 711-154.
Zhang, Lihua; Tonge, Richard; Sequeira, Dilip; and Maher, Monier
07526456 Cl. 706-10.
NXP, B.V.: See--
Barenbrug, Bart Gerard Bernard; and Meinds, Kornelis
07525553 Cl. 345-619.
De Jongh, Petra Elisabeth; Roks, Edwin; Wolters, Robertus Adrianus Maria; and Peek, Hermanus Leonardus
07525330 Cl. 324-763.
Van Eijndhoven, Josephus Theodorus Johannes; Rutten, Martijn Johan; and Pol, Evert-Jan Daniël
07526613 Cl. 711-133.
Nya Hamlet Pharma AB: See--
Svanborg, Catharina; Hakansson, Per Anders; and Svensson, Malin Wilhelmina
07524932 Cl. 530-366.
Nygaard, Larry R.: See--
Covey, Kevin K.; McGrath, Thomas J.; Sullivan, Joseph L.; Nygaard, Larry R.; and Nova, Richard C.
07526345 Cl. 607-142.
Nyroenen, Tommi: See--
Hirvelae, Leena; Johansson, Nina; Koskimies, Pasi; Pentikaeinen, Olli Taneli; Nyroenen, Tommi; Salminen, Tiina Annamaria; Johnson, Mark Stuart; Lehtovuori, Pekka; Saarenketo, Pauli; Van Steen, Bartholomeus Johannes; Thole, Heinrich-Hubert; Unkila, Mikko; Messinger, Josef; Kiviniemi, Johanna; Pirkkala, Lila; and Husen, Bettina
07524853 Cl. 514-267.
Nyse Alternext US LLC: See--
MacQueen, Jason; Gastineau, Gary L.; Norman, Terry; Weber, Clifford J.; Alexander, Carol; and Baker, Charles A.
07526445 Cl. 705-36R.