| US 7,525,353 B2 | ||
| Brown out detector | ||
| Sanjay Kumar Wadhwa, Saharanpur (India); and Siddhartha G.K., New Delhi (India) | ||
| Assigned to Freescale Semiconductor, Inc., Austin, Tex. (US) | ||
| Filed on Sep. 14, 2007, as Appl. No. 11/855,153. | ||
| Application 11/855153 is a division of application No. 11/487641, filed on Jul. 17, 2006, abandoned. | ||
| Prior Publication US 2008/0018368 A1, Jan. 24, 2008 | ||
| Int. Cl. H03L 7/00 (2006.01) | ||
| U.S. Cl. 327—143 [327/142; 327/198] | 8 Claims |
| 1. A brown out detector, comprising:
a first resistive element connected to a first voltage and a first node;
a capacitor connected to the first node and a second voltage;
a second transistor having a drain connected to a second node, a source connected to the first node, and a gate connected
to the first voltage;
a third transistor having a source connected to the second voltage, a drain connected to the second node, and a gate connected
to the first voltage;
a fourth transistor having a source connected to the second voltage, a drain connected to a first detector output, and a gate
connected to the second node; and
a fifth transistor having a drain connected to a second detector output, a source connected to the first node, and a gate
connected to the first voltage, wherein the first detector output and the second detector output generate a reset signal when
the first voltage is less than a detection threshold voltage.
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