| US 7,525,328 B2 | ||
| Cap at resistors of electrical test probe | ||
| Julie A. Campbell, Beaverton, Oreg. (US); and Lawrence W. Jacobs, Beaverton, Oreg. (US) | ||
| Assigned to LeCroy Corporation, Chestnut Ridge, N.Y. (US) | ||
| Filed on Aug. 03, 2007, as Appl. No. 11/890,095. | ||
| Application 11/890095 is a continuation of application No. 11/018134, filed on Dec. 17, 2004, granted, now 7,295,020. | ||
| Claims priority of provisional application 60/531077, filed on Dec. 18, 2003. | ||
| Prior Publication US 2007/0273360 A1, Nov. 29, 2007 | ||
| This patent is subject to a terminal disclaimer. | ||
| Int. Cl. G01R 31/02 (2006.01) | ||
| U.S. Cl. 324—754 [324/761; 324/762] | 22 Claims |
| 1. A lossy dielectric device for use with a transmission path, said device comprising:
(a) a container;
(b) lossy dielectric material contained within said container; and
(c) said container positionable substantially adjacent said transmission path to improve the curve of a frequency response.
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