US 7,525,326 B2
Test apparatus capable of accurately connecting a test object to a substrate
Takeshi Takahashi, Tokyo (Japan)
Assigned to Japan Aviation Electronics Industry, Limited, Tokyo (Japan)
Filed on Jun. 08, 2006, as Appl. No. 11/449,339.
Claims priority of application No. 2005-170734 (JP), filed on Jun. 10, 2005.
Prior Publication US 2006/0279317 A1, Dec. 14, 2006
Int. Cl. G01R 31/02 (2006.01); G01R 31/28 (2006.01)
U.S. Cl. 324—754  [324/158.1] 8 Claims
OG exemplary drawing
 
1. A test apparatus for testing a test object, the test apparatus comprising:
a substrate;
an inner frame coupled with the substrate and including a pair of pusher guides spaced from each other;
a connector held by the inner frame and electrically connected to the substrate;
a pusher slidably guided by the pusher guides and having an insertion slot between the pusher guides for receiving the test object;
a base coupled with at least one of the substrate and the inner frame;
an operating member rotatably held by the base and having one end engaged with the pusher;
a first elastic member for continuously urging the operating member in a pushing direction of the pusher; and
a second elastic member for continuously urging the pusher in a direction opposite to the pushing direction, the pusher guides and the pusher cooperating with each other to position the test object inserted in the insertion slot at a first position facing the connector, and the pusher being pushed towards the pushing direction by the operating member urged by the first elastic member, and moving against the second elastic member, together with the insertion slot to carry the test object inserted in the insertion slot, from the first position to a second position where the test object is brought into contact with the connector.