US 7,523,650 B2
Multifunctional probe array system
Xuefeng Wang, Schenectady, N.Y. (US); and Chang Liu, Champaign, Ill. (US)
Assigned to The Board of Trustees of the University of Illinois, Urbana, Ill. (US)
Filed on Jul. 18, 2007, as Appl. No. 11/779,637.
Application 11/779637 is a division of application No. 11/234401, filed on Sep. 23, 2005, granted, now 7,281,419.
Claims priority of provisional application 60/719158, filed on Sep. 21, 2005.
Prior Publication US 2007/0289369 A1, Dec. 20, 2007
This patent is subject to a terminal disclaimer.
Int. Cl. G01B 5/28 (2006.01)
U.S. Cl. 73—105  [250/306] 16 Claims
OG exemplary drawing
 
1. A probe array, comprising:
means for performing scanning probe contact printing,
means for performing dip pen nanolithography, and
means for forming an image using the means for performing scanning probe contact printing and the means for performing dip pen nanolithography, wherein the means for performing scanning probe contact printing has radius of curvature of at least 300 nm, and wherein the means for performing dip pen nanolithography printing has radius of curvature less than 300 nm.