| US 7,523,427 B2 | ||
| Timing analyzer apparatus and timing analysis program recording medium | ||
| Tsuyoshi Sakata, Kawasaki (Japan) | ||
| Assigned to Fujitsu Microelectronics Limited, Tokyo (Japan) | ||
| Filed on Feb. 28, 2006, as Appl. No. 11/363,206. | ||
| Claims priority of application No. 2005-343640 (JP), filed on Nov. 29, 2005. | ||
| Prior Publication US 2007/0124710 A1, May 31, 2007 | ||
| Int. Cl. G06F 17/50 (2006.01) | ||
| U.S. Cl. 716—6 [716/5] | 13 Claims |

| 1. A timing analyzer apparatus comprising:
a storage device for storing path data indicating a plurality of cells constituting a timing verification target circuit in
a semiconductor integrated circuit, delay data and standard deviation data of each cell, a weight for calculating a standard
deviation of delay of the target circuit, and a threshold of timing verification;
a standard deviation calculation device for calculating a sum of squares of standard deviations of the plurality of the cells
using the path data and the standard deviation data of each cell, calculating a square root of the sum of squares, and obtaining
the standard deviation of delay of the target circuit by multiplying the calculated square root by the weight;
a delay calculation device for calculating delay of the target circuit by using the path data and the delay data of each cell;
an evaluation value calculation device for calculating an evaluation value for timing verification by using the standard deviation
of delay of the target circuit and the delay of the target circuit;
a verification device for performing the timing verification by comparing the evaluation value with the threshold; and
an output device for outputting a verification result.
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