| US 7,522,453 B1 | ||
| Non-volatile memory with source-side column select | ||
| Zhigang Wang, Sunnyvale, Calif. (US); Gregory Bakker, San Jose, Calif. (US); Volker Hecht, Barshinghausen (Germany); Santosh Yachareni, San Jose, Calif. (US); Fethi Dhaoui, Patterson, Calif. (US); and Vidyadhara Bellippady, San Jose, Calif. (US) | ||
| Assigned to Actel Corporation, Mountain View, Calif. (US) | ||
| Filed on Dec. 20, 2007, as Appl. No. 11/961,134. | ||
| Int. Cl. G11C 16/04 (2006.01) | ||
| U.S. Cl. 365—185.11 [365/185.13; 365/185.17] | 12 Claims |

| 1. A non-volatile memory array segment including:
an odd-select transistor having a drain coupled to an odd-source line, a source, and a gate coupled to an odd-select signal
line;
an even-select transistor having a drain coupled to an even-source line, a source, and a gate coupled to an even-select signal
line;
a first segment-select transistor having a drain coupled to the source of the odd-select transistor, a source coupled to ground,
and a gate coupled to a segment-select line;
a second segment-select transistor having a drain coupled to the source of the even-select transistor, a source coupled to
ground, and a gate coupled to the segment-select line;
a plurality of odd non-volatile memory transistors, each odd non-volatile memory transistor having a drain coupled to a common
drain line, a source coupled to the odd-source line, a floating gate, and a control gate;
a plurality of even non-volatile memory transistors, each even non-volatile memory transistor having a drain coupled to the
common drain line, a source coupled to the even-source line, a floating gate, and a control gate, the control gate of each
of the even non-volatile memory transistors coupled to the control gate of a different one of the odd non-volatile memory
transistors.
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