| US 7,522,064 B2 | ||
| Apparatus and methods for testing the life of a leakage current protection device | ||
| Feng Zhang, Shanghai (China); Hongliang Chen, Shanghai (China); Fu Wang, Yueqing Zhejiang (China); Wusheng Chen, Yueqing Zhejiang (China); Yulin Zhang, Shanghai (China); and Huaiyin Song, Yueqing Zhejiang (China) | ||
| Assigned to General Protecht Group, Inc., Zhejiang (China) | ||
| Filed on Oct. 26, 2006, as Appl. No. 11/588,016. | ||
| Claims priority of application No. 2005 1 0132844 (CN), filed on Dec. 27, 2005. | ||
| Prior Publication US 2007/0146944 A1, Jun. 28, 2007 | ||
| Int. Cl. G08B 21/00 (2006.01) | ||
| U.S. Cl. 340—638 | 20 Claims |
| 1. An apparatus for testing the life of a leakage current protection device, wherein the leakage current protection device
has a first input, a second input, a third input, a first output, a second output, a third output, a self-sustained oscillation
circuit that is electro-magnetically coupled therebetween the first input and the second input, and electrically coupled to
the third output, a reset circuit with an input that is electrically coupled to the third input, and an output that is electrically
coupled to the first output, and a trip coil circuit with an input that is electrically coupled to the output of the reset
circuit and the first output, and an output that is electrically coupled to the second output, comprising:
(i) a microcontroller unit (MCU) having a first input, a second input, a first output that is electrically coupled to the
third input of the leakage current protection device, a second output, and a power supply input;
(ii) a fault detection circuit having an first input that is electrically coupled to the second output of the leakage current
protection device, a second input that is electronically coupled to the third output of the leakage current protection device,
a first output that is electrically coupled to the first input of the MCU, and a second output that is electrically coupled
to the second input of the MCU, respectively;
(iii) an alarm circuit having an input that is electrically coupled to the second output of the MCU, and a power supply input;
and
(iv) a power supply circuit having an input that is electrically coupled to the first output of the leakage current protection
device, and an output that is electrically coupled to the power supply input of the MCU and the power supply input of the
alarm circuit,
wherein, in operation, the fault detection circuit receives at least one signal from the second output and the third output
of the leakage current protection device, and generates at least one DC voltage corresponding to the at least one signal to
be received by at least one of the first input and second input of the MCU, and the MCU compares the at least one DC voltage
with a predetermined threshold value to determine whether a fault exists in the leakage current protection device, and activates
the alarm circuit if at least one fault exists.
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