| US 7,518,908 B2 | ||
| EEPROM array and method for operation thereof | ||
| Eduardo Maayan, Kfar Saba (Israel); Ron Eliyahu, Herzelia (Israel); and Boaz Eitan, Ra'anana (Israel) | ||
| Assigned to Saifun Semiconductors Ltd., Netanya (Israel) | ||
| Filed on May 28, 2002, as Appl. No. 10/155,215. | ||
| Application 10/155215 is a continuation of application No. 09/761818, filed on Jan. 18, 2001, granted, now 6,614,692, filed on Sep. 02, 2003. | ||
| Prior Publication US 2003/0039153 A1, Feb. 27, 2003 | ||
| This patent is subject to a terminal disclaimer. | ||
| Int. Cl. G11C 16/04 (2006.01) | ||
| U.S. Cl. 365—185.02 [365/185.03; 365/185.11; 365/185.16; 365/185.29] | 22 Claims |

| 1. A method for operating an electrically erasable programmable read only memory (EEPROM) array of non-volatile memory (“NVM”) cells having one or more charge storage regions, said method comprising: mitigating disturb effect during an erase operation by selecting one of said memory cells; and erasing a bit of the selected memory cell while substantially concurrently applying an inhibit word-line voltage to a terminal of an unselected memory cell in proximity with the selected memory cell, such that the inhibit voltage mitigates disturb effect on the unselected cell. |