| US 7,518,377 B2 | ||
| Measurement apparatus, test apparatus, and measurement method | ||
| Seiji Amanuma, Tokyo (Japan); and Kiyonobu Suzuki, Tokyo (Japan) | ||
| Assigned to Advantest Corporation, Tokyo (Japan) | ||
| Filed on Jan. 26, 2007, as Appl. No. 11/698,744. | ||
| Claims priority of application No. 2006-023273 (JP), filed on Jan. 31, 2006. | ||
| Prior Publication US 2007/0197168 A1, Aug. 23, 2007 | ||
| Int. Cl. G01R 31/02 (2006.01); G01R 27/08 (2006.01) | ||
| U.S. Cl. 324—537 [324/713] | 12 Claims |
| 1. A measurement apparatus for measuring a fluctuation of a voltage level of an input signal with respect to a reference voltage,
where the voltage level of the input signal fluctuates with respect to the reference voltage having a predetermined high voltage
level, the measurement apparatus comprising:
a high-frequency passage section for allowing passage of a high-frequency component of a predetermined first band of the input
signal;
a reference voltage dividing section for dividing a voltage level of the reference voltage at a predetermined voltage dividing
ratio;
a signal voltage dividing section for dividing the voltage level of the input signal at the voltage dividing ratio;
a low-frequency passage section for allowing passage of a low-frequency component of a second band of a differential signal
that is according to a difference between a voltage level of the reference voltage outputted from the reference voltage dividing
section and a voltage level of the input signal outputted from the signal voltage dividing section, the second band being
lower than the first band;
a composite section for combining a signal outputted from the high-frequency passage section and a signal outputted from the
low-frequency passage section; and
a measurement section for measuring a signal outputted from the composite section.
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