| US 7,516,373 B2 | ||
| Method for testing the error ratio of a device using a preliminary probability | ||
| Thomas Maucksch, Tuntenhausen (Germany); and Uwe Baeder, Ottobrunn (Germany) | ||
| Assigned to Rohde & Schwarz GmbH & Co. KG, Munich (Germany) | ||
| Appl. No. 10/513,909 PCT Filed Jan. 31, 2003, PCT No. PCT/EP03/00970 § 371(c)(1), (2), (4) Date Jun. 23, 2005, PCT Pub. No. WO03/096601, PCT Pub. Date Nov. 20, 2003. |
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| Claims priority of application No. 02010465 (EP), filed on May 08, 2002. | ||
| Prior Publication US 2006/0002460 A1, Jan. 05, 2006 | ||
| This patent is subject to a terminal disclaimer. | ||
| Int. Cl. G06F 11/00 (2006.01) | ||
| U.S. Cl. 714—704 [714/742; 714/799] | 13 Claims |
| 1. A method for testing a bit error ratio (BER) of a device against a maximal allowable Error Ratio BERlimit with an early pass criterion, whereby the early pass criterion is allowed to be wrong only by a small probability F1 for the entire test, comprising the following steps:
measuring ns bits of the output of the device, thereby detecting ne erroneous bits of these ns bits;
assuming that a likelihood distribution giving the distribution of the number of erroneous bits ni in a fixed number of samples
of bits is PD(NE,ni), wherein NE is an average number of erroneous bits, obtaining PDhigh from
 wherein PDhigh is the worst possible likelihood distribution containing the measured ne erroneous bits with a single step wrong decision
probability D1 for a preliminary Error Ratio BER stage, whereby using a single step wrong decision probability D1 smaller than the probability F1 for the entire test;
obtaining the average number of erroneous bits NEhigh for the worst possible likelihood distribution PDhigh;
comparing NEhigh with NElimit=BERlimitns;
if NElimit is higher than NEhigh stopping the test and deciding that the device has early passed the test; and
if NElimit is smaller than NEhigh continuing the test, thereby increasing ns.
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