US 7,515,179 B2
Method for integrating image sensor
Hyung-Jun Han, Chungcheongbuk-do (Korea, Republic of); and Moo-Sup Lim, Chungcheongbuk-do (Korea, Republic of)
Assigned to MagnaChip Semiconductor, Ltd., Chungcheonbuk-Do (Korea, Republic of)
Filed on Mar. 17, 2005, as Appl. No. 11/84,388.
Claims priority of application No. 10-2004-0029015 (KR), filed on Apr. 27, 2004.
Prior Publication US 2005/0246143 A1, Nov. 03, 2005
Int. Cl. H04N 9/73 (2006.01); H04N 5/228 (2006.01); H04N 5/235 (2006.01)
U.S. Cl. 348—226.1  [348/227.1; 348/222.1] 3 Claims
OG exemplary drawing
 
1. A method for integrating an exposure time of an image sensor employing a line scan method to remove flicker noise, comprising the steps of:
performing an integration to a first line when an integer multiple of a light source frequency is different from an integration time; and
performing an integration to a second line at a phase substantially equal to a phase in which the integration to the first line is started
wherein when the frequency of the light source is an integer multiple of 50 Hz and the integration time is an integer multiple of 1/(60 Hz), the integration is paused for 1/(an integer multiple of 50) to 1/(an integer multiple of 60) after completing the integration to the first line and then, the integration to the second line is performed,
wherein when the frequency of the light source is an integer multiple of 60 Hz and the integration time is an integer multiple of 1/(50 Hz), the integration is paused for 2/(an integer multiple of 60) to 1/(an integer multiple of 50) after completing the integration to the first line and then, the integration to the second line is performed.