| US 7,515,150 B2 | ||
| Semiconductor device capable of suppressing variation of current or voltage to be supplied to external circuit | ||
| Katsumi Abe, Tokyo (Japan); and Masamichi Shimoda, Tokyo (Japan) | ||
| Assigned to NEC Corporation, Tokyo (Japan); and NEC Electronics Corporation, Kawasaki (Japan) | ||
| Filed on Sep. 16, 2004, as Appl. No. 10/942,760. | ||
| Claims priority of application No. 2003-329552 (JP), filed on Sep. 22, 2003. | ||
| Prior Publication US 2005/0062128 A1, Mar. 24, 2005 | ||
| Int. Cl. G09G 5/00 (2006.01) | ||
| U.S. Cl. 345—212 [345/205; 345/206; 345/45; 345/55; 345/60] | 18 Claims |
| 1. A semiconductor device comprising, on a principal surface of a substrate:
a plurality of functional blocks each having a function to hold either a voltage determined by a current supplied from a current
source or a voltage supplied from a voltage source and to supply a current or a voltage determined by the voltage thus held
to an external circuit,
a plurality of unit areas each having one of said functional blocks,
supply interconnects for supplying the current supplied from the current source or the voltage supplied from the voltage source
to said functional block, and
signal interconnects for propagating a signal other than the current supplied from the current source or the voltage supplied
from the voltage source, said unit areas being arranged in at least one direction on said principal surface, said signal interconnects
including identical numbers of interconnects that connect to the functional block, said signal interconnects being disposed
respectively on left and right sides of said functional block and extending in said one direction over said unit areas:
wherein each of the unit areas comprising a layout of the functional block and respective portions of the supply and signal
interconnects, the respective layouts of at least two adjacent unit areas being identical.
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