US 7,514,319 B2
Copolymers, polymer resin composition for buffer layer method of forming a pattern using the same and method of manufacturing a capacitor using the same
Sun-Yul Ahn, Anyang-si (Korea, Republic of); Kyong-Rim Kang, Seongnam-si (Korea, Republic of); Tae-Sung Kim, Suwon-si (Korea, Republic of); Young-Ho Kim, Yongin-si (Korea, Republic of); and Jung-Hoon Lee, Hwaseong-si (Korea, Republic of)
Assigned to Samsung Electronics Co., Ltd., Gyeonggi-Do (Korea, Republic of)
Filed on Jun. 06, 2006, as Appl. No. 11/447,120.
Claims priority of application No. 10-2005-0076529 (KR), filed on Aug. 20, 2005.
Prior Publication US 2007/0042604 A1, Feb. 22, 2007
Int. Cl. H01L 21/8242 (2006.01)
U.S. Cl. 438—253  [438/396] 10 Claims
OG exemplary drawing
 
1. A method of protecting a recessed region comprising:
forming an insulating layer on a semiconductor substrate;
forming an opening in the insulating layer;
forming a protected layer on an upper surface of the insulating layer and a lower surface and sidewalls of the opening;
forming a buffer layer on the protected layer, the buffer layer filling the recess and including a major portion of a copolymer polymerized with monomers including from 61 to 75 weight percent benzyl methacrylate; from 8 to 15 weight percent alkyl acrylic acid; with a balance being hydroxy alkyl methacrylate;
removing an unexposed upper portion of the buffer layer using a developer solution to expose an upper portion of the protected layer, a remaining portion of the buffer layer substantially filling the recess; and
removing the upper portion of the protected layer while a lower portion of the protect layer is protected by the remaining portion of the buffer layer,
wherein the copolymer includes at least three monomers and has a structure corresponding to Formula I:

OG Complex Work Unit Drawing
wherein the variables L, M and N represent the relative molar fractions of the monomers and satisfy the expressions
0<L≤0.8;
0<M≤0.25;
0<N≤0.35; and
L+M+N=1; and, wherein
R1, R2 and R3 are independently selected from C1-C4 alkyls and derivatives thereof.