| US 7,353,442 B2 | ||
| On-chip and at-speed tester for testing and characterization of different types of memories | ||
| Swapnil Bahl, New Delhi (India); and Balwant Singh, Greater Noida (India) | ||
| Assigned to STMicroelectronics Pvt. Ltd., Uttar Pradesh (India) | ||
| Filed on Apr. 08, 2005, as Appl. No. 11/102,556. | ||
| Claims priority of application No. 695/DEL/2004 (IN), filed on Apr. 08, 2004. | ||
| Prior Publication US 2005/0246602 A1, Nov. 03, 2005 | ||
| Int. Cl. G01R 31/28 (2006.01) | ||
| U.S. Cl. 714—733 [714/25; 714/30; 714/724; 714/718; 714/734; 714/737; 714/742; 365/201] | 20 Claims |
| 1. For use in testing an integrated circuit device comprising a memory-under-test and a localized signal generator, a testing
apparatus comprising:
a centralized flow controller having an interface to an external device, wherein the centralized flow controller is configured
for communicating with the localized signal generator,
wherein the centralized flow controller is configured for causing the localized signal generator to test the memory-under-test
in accordance with a signal received from the external device via the interface, the signal indicating a memory type of the
memory-under-test.
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