| US 7,512,914 B2 | ||
| Method of improving electronic component testability rate | ||
| Hung-Sheng Wang, Taipei (Taiwan); Chi-Yen Ho, Taipei (Taiwan); Din-Guow Ma, Taipei (Taiwan); Chi-Kuen Yu, Taipei (Taiwan); and Hui-Kuo Tsao, Taipei (Taiwan) | ||
| Assigned to Inventec Corporation, Taipei (Taiwan) | ||
| Filed on May 26, 2006, as Appl. No. 11/420,727. | ||
| Prior Publication US 2007/0277132 A1, Nov. 29, 2007 | ||
| Int. Cl. G06F 17/50 (2006.01) | ||
| U.S. Cl. 716—4 [716/15] | 6 Claims |
| 1. A method of improving an electronic component testability rate, comprising the steps of:
designing a circuit;
providing data of electronic components of the circuit;
extracting the test data of electronic components from a test database, the test database storing the data of electronic component
test specifications, test programs, and test signal connection data;
providing a circuit board and making a test position table, wherein the circuit board is disposed with a plurality of electronic
components and a plurality of test points in accord with the circuit design and the test position table is made in accord
with the electronic component test points;
providing an electronic component test fixture and a test program, wherein the test position table is employed to make the
electronic component test fixture and to select test points of the test program for testing the circuit board;
determining whether the test program is appropriate and, if it is inappropriate, performing a debugging process and re-determining
whether the test program is appropriate; and
obtaining a test report when the test program is appropriate.
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