US 7,511,991 B2
Spin-injection magnetic random access memory
Yoshiaki Saito, Kawasaki (Japan); Hideyuki Sugiyama, Yokohama (Japan); Tomoaki Inokuchi, Kawasaki (Japan); and Yoshihisa Iwata, Yokohama (Japan)
Assigned to Kabushiki Kaisha Toshiba, Tokyo (Japan)
Filed on May 18, 2007, as Appl. No. 11/750,856.
Application 11/750856 is a continuation of application No. 11/242906, filed on Oct. 05, 2005, granted, now 7,239,541.
Claims priority of application No. 2005-021877 (JP), filed on Jan. 28, 2005.
Prior Publication US 2007/0223269 A1, Sep. 27, 2007
This patent is subject to a terminal disclaimer.
Int. Cl. G11C 11/00 (2006.01); G11C 11/14 (2006.01)
U.S. Cl. 365—158  [365/171; 365/173] 12 Claims
OG exemplary drawing
 
1. A random access memory with a magnetoresistive element,
comprising:
a memory cell including a MOS transistor and a magnetoresistive element having a first magnetic fixed layer whose magnetization direction is fixed, a magnetic recording layer whose magnetization direction can be changed by injecting spin-polarized electrons, and a tunnel barrier layer which is provided between the magnetic fixed layer and the magnetic recording layer;
a bit line which passes a first current through the magnetoresistive element, the first current being used for generation of a spin-polarized electrons;
a word line through which a second current is passed, the second current being used for the generation of an assist magnetic field in a magnetization easy-axis direction of the magnetoresistive element;
a first driver connected to the bit line and supplies the first current;
a second driver connected to the word line and supplies the second current;
a first decoder which receives a writing data to be written into the magnetoresistive element and controls the first driver to determine a direction of the first current depending on the writing data, and determines timing of cutoff of the first current; and
a second decoder which controls the second driver to determine the direction of the second current depending on the writing data, and makes the timing of the cutoff of the second current later than the timing of the cutoff of the first current.