| US 7,509,237 B2 | ||
| Test system and test method using virtual review | ||
| Ho Sun Park, Paju-si (Korea, Republic of); Moon Seong Eom, Paju-si (Korea, Republic of); and Sang Ho Nam, Paju-si (Korea, Republic of) | ||
| Assigned to LG. Display Co., Ltd., Seoul (Korea, Republic of) | ||
| Filed on Dec. 22, 2006, as Appl. No. 11/644,637. | ||
| Claims priority of application No. 10-2005-0135812 (KR), filed on Dec. 30, 2005; and application No. 10-2006-0114947 (KR), filed on Nov. 21, 2006. | ||
| Prior Publication US 2007/0159179 A1, Jul. 12, 2007 | ||
| Int. Cl. G06F 11/22 (2006.01); G06F 17/00 (2006.01) | ||
| U.S. Cl. 702—185 [702/117; 702/118; 382/149] | 21 Claims |
| 8. A system for testing a defect of an array substrate or color filter substrate for use in a display device, comprising:
a test device that takes an image of a defect on an array substrate or color filter substrate to acquire a captured image
and provides the captured image and an information related to the defect;
a main server that stores the captured image and the information related to the defect from the test device at a database
and then transmits the captured image and the information related to the defect to a first review host, wherein the first
review host determines whether a defect exists on the array substrate or color filter substrate based on a status of the captured
image from the main server to yield a determination result and sends the determination result to the main server; and
a second review host that receives a captured image of a repaired area from the main server and determines whether a defect
exists on the array substrate or color filter substrate based on the state of the defect captured image of the repaired area.
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