| US 7,505,337 B2 | ||
| Method and apparatus for repairing a shorted tunnel device | ||
| Janusz Jozef Nowak, Highland Mills, N.Y. (US); Mark Curtis Hayes Lamorey, South Burlington, Vt. (US); and Yu Lu, Hopewell Junction, N.Y. (US) | ||
| Assigned to International Business Machines Corporation, Armonk, N.Y. (US) | ||
| Filed on Jan. 12, 2006, as Appl. No. 11/330,493. | ||
| Prior Publication US 2007/0171736 A1, Jul. 26, 2007 | ||
| This patent is subject to a terminal disclaimer. | ||
| Int. Cl. G11C 29/00 (2006.01) | ||
| U.S. Cl. 365—200 [365/158; 365/185.02] | 20 Claims |
| 12. Apparatus for repairing a shorted tunnel device, the apparatus comprising:
a signal generator operative: (i) to generate a stressing signal having an amplitude that is greater than an amplitude of
a bias signal applied to the device during normal operation; and (ii) to apply the stressing signal to the shorted tunnel
device for initiating a repair of the device; and
a controller coupled to the signal generator, the controller being operative to control one or more characteristics of the
stressing signal so as to remove a conductive filament shorting the tunnel device.
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